المؤلفون: Mazumder, SK, Voss, LF, Dowling, KM, Conway, A, Hall, D, Kaplar, RJ, Pickrell, GW, Flicker, J, Binder, AT, Chowdhury, S, Veliadis, V, Luo, F, Khalil, S, Aichinger, T, Bahl, SR, Meneghini, M, Charles, AB

المساهمون: Mazumder, Sk, Voss, Lf, Dowling, Km, Conway, A, Hall, D, Kaplar, Rj, Pickrell, Gw, Flicker, J, Binder, At, Chowdhury, S, Veliadis, V, Luo, F, Khalil, S, Aichinger, T, Bahl, Sr, Meneghini, M, Charles, Ab

مصطلحات موضوعية: Device, electrical, material, optical, packaging, reliability, ultrawide bandgap (UWBG), wide bandgap (WBG)

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001042129300031; volume:11; issue:4; firstpage:3957; lastpage:3982; numberofpages:26; journal:IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS; https://hdl.handle.net/11577/3494691; https://ieeexplore.ieee.org/document/10129950

الاتاحة: https://hdl.handle.net/11577/3494691
https://doi.org/10.1109/JESTPE.2023.3277828
https://ieeexplore.ieee.org/document/10129950

المؤلفون: Veliadis, V.

المصدر: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

الاتاحة: http://dx.doi.org/10.1109/essderc55479.2022.9947113
http://xplorestaging.ieee.org/ielx7/9947060/9947094/09947113.pdf?arnumber=9947113

المؤلفون: Veliadis, V., Steiner, B., Lawson, K., Bayne, S. B., Urciuoli, D., Ha, H. C.

المصدر: 2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) ; page 162-165

الاتاحة: http://dx.doi.org/10.1109/wipda.2015.7369297
http://xplorestaging.ieee.org/ielx7/7361121/7369025/07369297.pdf?arnumber=7369297

المؤلفون: Veliadis, V., Snook, M., Woodruff, S., Nechay, B., Heame, H., Lavoie, C., Giorgi, D., Ingram, M.

المصدر: 2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) ; page 47-50

الاتاحة: http://dx.doi.org/10.1109/wipda.2015.7369281
http://xplorestaging.ieee.org/ielx7/7361121/7369025/07369281.pdf?arnumber=7369281

المؤلفون: Lawson, K., Alvarez, G., Bayne, S., Veliadis, V., Urciuoli, D.

المصدر: 2011 IEEE Pulsed Power Conference ; page 1102-1104

الاتاحة: http://dx.doi.org/10.1109/ppc.2011.6191651
http://xplorestaging.ieee.org/ielx5/6188417/6191397/06191651.pdf?arnumber=6191651

المؤلفون: Veliadis, V., McCoy, M., Stewart, E., McNutt, T., Van Campen, S., Potyraj, P., Scozzie, C.

المصدر: 2007 International Semiconductor Device Research Symposium

الاتاحة: http://dx.doi.org/10.1109/isdrs.2007.4422415
http://xplorestaging.ieee.org/ielx5/4422221/4422222/04422415.pdf?arnumber=4422415

المؤلفون: McNutt, T., Veliadis, V., Stewart, E., Hearne, H., Reichl, J., Oda, P., van Campen, S., Ostop, J., Clarke, R.C.

المصدر: 2005 IEEE Vehicle Power and Propulsion Conference ; page 574-581

الاتاحة: http://dx.doi.org/10.1109/vppc.2005.1554617
http://xplorestaging.ieee.org/ielx5/10416/33078/01554617.pdf?arnumber=1554617

المؤلفون: Ackerman, D.A., Johnson, J.E., Ketelsen, L.J.-P., Geary, J.M., Asous, W.A., Walters, F.S., Freund, J.M., Hybertsen, M.S., Glogovsky, K.G., Lentz, C.W., Reynolds, C.L., Bylsma, R.B., Dean, E.J., Eng, L.E., Qasiameh, O., Gupta, R., Ghanikanov, F., Veliadis, V., Roycroft, S., Pinnington, T.

المصدر: LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242) ; volume 1, page 171-172

الاتاحة: http://dx.doi.org/10.1109/leos.2001.969227
http://xplorestaging.ieee.org/ielx5/7649/20882/00969227.pdf?arnumber=969227

المؤلفون: Veliadis, V., Steiner, B., Lawson, K., Bayne, S. B., Urciuoli, D., Ha, H. C., El-Hinnawy, N., Gupta, S., Borodulin, P., Howell, R. S., Scozzie, C.

المصدر: IEEE Electron Device Letters ; volume 34, issue 3, page 384-386 ; ISSN 0741-3106 1558-0563

الاتاحة: http://dx.doi.org/10.1109/led.2013.2241724
http://xplorestaging.ieee.org/ielx5/55/6468094/06459530.pdf?arnumber=6459530

المؤلفون: Snook, M, Hearne, H, McNutt, Ty, El-Hinnawy, N, Veliadis, V, Nechay, B, Woodruff, S, Howell, R S, Giorgi, David, White, Joe

المساهمون: NORTHROP GRUMMAN SYSTEMS CORP LINTHICUM MD ELECTRONIC SYSTEMS

المصدر: DTIC

مصطلحات موضوعية: Electrical and Electronic Equipment, Mfg & Industrial Eng & Control of Product Sys, Electricity and Magnetism, ELECTRIC CONNECTORS, FABRICATION, HIGH VOLTAGE, OPTIMIZATION, PERFORMANCE(ENGINEERING), PIN DIODES, SILICON CARBIDES, WAFERS, BREAKDOWN(ELECTRONIC THRESHOLD), CURRENT DENSITY, DEFECTS(MATERIALS), ELECTRIC CURRENT, HIGH POWER, LEAKAGE(ELECTRICAL), LOW COSTS, PEAK POWER, POWER CONDITIONING, SIMPLIFICATION, 4H-SILICON CARBIDE WAFERS, WAFER INTERCONNECTIONS, FULL-WAFER DIODES, WAFER-INTERCONNECTED DIODES, POWER DENSITY, DISSIPATED ENERGY, CALCULATED ACTION, PULSED TESTING, PEAK CURRENT DENSITY

وصف الملف: text/html

Relation: http://www.dtic.mil/docs/citations/ADA556203

الاتاحة: http://www.dtic.mil/docs/citations/ADA556203
http://oai.dtic.mil/oai/oai?&verb=getRecord&metadataPrefix=html&identifier=ADA556203

المؤلفون: White, Joe, Woodruff, S, Davis, Stuart, Snook, M, Hearne, H, McNutt, T, El-Hinnawy, N, Veliadis, V, Nechay, B, Howell, R S

المساهمون: NORTHROP GRUMMAN CORP LINTHICUM HEIGHTS MD ELECTRONIC SENSORS AND SYSTEMS DIV

المصدر: DTIC

مصطلحات موضوعية: Inorganic Chemistry, Electrical and Electronic Equipment, DIODES, SILICON CARBIDES, BONDING, BREAKDOWN(ELECTRONIC THRESHOLD), CIRCUIT INTERCONNECTIONS, COSTS, DENSITY, ELECTRIC CURRENT, ENERGY, HANDLING, PEAK POWER, PIN DIODES, POWER, POWER CONDITIONING, POWER SUPPLIES, PULSES, REPRINTS, VOLTAGE, WAFERS, YIELD

وصف الملف: text/html

Relation: http://www.dtic.mil/docs/citations/ADA556144

الاتاحة: http://www.dtic.mil/docs/citations/ADA556144
http://oai.dtic.mil/oai/oai?&verb=getRecord&metadataPrefix=html&identifier=ADA556144

المؤلفون: Veliadis, V., Hearne, H., Stewart, E.J., Ha, H.C., Snook, M., McNutt, T., Howell, R., Lelis, A., Scozzie, C.

المصدر: IEEE Electron Device Letters ; volume 30, issue 7, page 736-738 ; ISSN 0741-3106 1558-0563

الاتاحة: http://dx.doi.org/10.1109/led.2009.2021491
http://xplorestaging.ieee.org/ielx5/55/5109799/05061604.pdf?arnumber=5061604

المؤلفون: Veliadis, V., Snook, M., McNutt, T., Hearne, H., Potyraj, P., Lelis, A., Scozzie, C.

المصدر: IEEE Electron Device Letters ; volume 29, issue 12, page 1325-1327 ; ISSN 0741-3106 1558-0563

الاتاحة: http://dx.doi.org/10.1109/led.2008.2006766
http://xplorestaging.ieee.org/ielx5/55/4671136/04667668.pdf?arnumber=4667668

المؤلفون: Veliadis, V., McNutt, T., Snook, M., Hearne, H., Potyraj, P., Scozzie, C.

المصدر: IEEE Electron Device Letters ; volume 29, issue 10, page 1132-1134 ; ISSN 0741-3106 1558-0563

الاتاحة: http://dx.doi.org/10.1109/led.2008.2002907
http://xplorestaging.ieee.org/ielx5/55/4631439/04623142.pdf?arnumber=4623142

المؤلفون: NORTHROP GRUMMAN SYSTEMS CORP LINTHICUM MD ELECTRONIC SYSTEMS, Snook, M, Hearne, H, McNutt, Ty, El-Hinnawy, N, Veliadis, V, Nechay, B, Woodruff, S, Howell, R S, Giorgi, David, White, Joe

المصدر: DTIC

مصطلحات الفهرس: Electrical and Electronic Equipment, Mfg & Industrial Eng & Control of Product Sys, Electricity and Magnetism, ELECTRIC CONNECTORS, FABRICATION, HIGH VOLTAGE, OPTIMIZATION, PERFORMANCE(ENGINEERING), PIN DIODES, SILICON CARBIDES, WAFERS, BREAKDOWN(ELECTRONIC THRESHOLD), CURRENT DENSITY, DEFECTS(MATERIALS), ELECTRIC CURRENT, HIGH POWER, LEAKAGE(ELECTRICAL), LOW COSTS, PEAK POWER, POWER CONDITIONING, SIMPLIFICATION, 4H-SILICON CARBIDE WAFERS, WAFER INTERCONNECTIONS, FULL-WAFER DIODES, WAFER-INTERCONNECTED DIODES, POWER DENSITY, DISSIPATED ENERGY, CALCULATED ACTION, PULSED TESTING, PEAK CURRENT DENSITY, Text

URL: https://apps.dtic.mil/docs/citations/ADA556203

المؤلفون: NORTHROP GRUMMAN CORP LINTHICUM HEIGHTS MD ELECTRONIC SENSORS AND SYSTEMS DIV, White, Joe, Woodruff, S, Davis, Stuart, Snook, M, Hearne, H, McNutt, T, El-Hinnawy, N, Veliadis, V, Nechay, B, Howell, R S

المصدر: DTIC

مصطلحات الفهرس: Inorganic Chemistry, Electrical and Electronic Equipment, DIODES, SILICON CARBIDES, BONDING, BREAKDOWN(ELECTRONIC THRESHOLD), CIRCUIT INTERCONNECTIONS, COSTS, DENSITY, ELECTRIC CURRENT, ENERGY, HANDLING, PEAK POWER, PIN DIODES, POWER, POWER CONDITIONING, POWER SUPPLIES, PULSES, REPRINTS, VOLTAGE, WAFERS, YIELD, Text

URL: https://apps.dtic.mil/docs/citations/ADA556144

المؤلفون: Urciuoli, D.P., Veliadis, V., Ha, H.C., Lubomirsky, V.

المصدر: 2011 Twenty-Sixth Annual IEEE Applied Power Electronics Conference & Exposition (APEC); 2011, p354-358, 5p

المؤلفون: Veliadis, V.¹

المصدر: IEEE Transactions on Electron Devices. 12/01/2010, Vol. 57 Issue 12, p3540-3543. 4p.

مصطلحات موضوعية: ELECTRONS, SILICON carbide, ELECTRIC potential, FIELD-effect transistors, ELECTRIC currents, BIPOLAR transistors, JUNCTION transistors

المؤلفون: Veliadis, V., McNutt, T., McCoy, M., Hearne, H., Potyraj, P., Scozzie, C.

المصدر: 2007 IEEE Vehicle Power & Propulsion Conference; 2007, p223-229, 7p

المؤلفون: Veliadis, V., Steiner, B., Lawson, K., Bayne, S. B., Urciuoli, D., Ha, H. C., El-Hinnawy, N., Gupta, S., Borodulin, P., Howell, R. S., Scozzie, C.

المصدر: IEEE Electron Device Letters; Mar2013, Vol. 34 Issue 3, p384-386, 3p

مصطلحات موضوعية: PHOTOLITHOGRAPHY, RELIABILITY in engineering, BIDIRECTIONAL associative memories (Computer science), FAULT indicators (Electricity), ELECTRIC inductance, CROSS-sectional method