المؤلفون: Teja Nibhanupudi, S. S., Roy, Anupam, Veksler, Dmitry, Coupin, Matthew, Matthews, Kevin C., Disiena, Matthew, Ansh, Singh, Jatin V., Gearba-Dolocan, Ioana R., Warner, Jamie, Kulkarni, Jaydeep P., Bersuker, Gennadi, Banerjee, Sanjay K.

المساهمون: National Science Foundation, Semiconductor Research Corporation, DST | Science and Engineering Research Board

المصدر: Nature Communications ; volume 15, issue 1 ; ISSN 2041-1723

الاتاحة: http://dx.doi.org/10.1038/s41467-024-46372-y
https://www.nature.com/articles/s41467-024-46372-y.pdf
https://www.nature.com/articles/s41467-024-46372-y

المؤلفون: Dawlaty, Jahan M., Shivaraman, Shriram, Strait, Jared, George, Paul, Chandrashekhar, Mvs, Rana, Farhan, Spencer, Michael G., Veksler, Dmitry, Chen, Yunqing

مصطلحات موضوعية: Condensed Matter - Materials Science, Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/0801.3302

المؤلفون: Armendariz, Emerson, Sepulveda, David A., Espalin, David, Rome, Jacob I., Hall, Andrew J., Veksler, Dmitry

المساهمون: Helvajian, Henry, Gu, Bo, Chen, Hongqiang

المصدر: Laser 3D Manufacturing IX

الاتاحة: http://dx.doi.org/10.1117/12.2615234

المؤلفون: Sin, Yongkun, Veksler, Dmitry, Edwards, Patrick, Brodie, Miles, Sitzman, Scott D., Lingley, Zachary

المساهمون: Morkoç, Hadis, Fujioka, Hiroshi, Schwarz, Ulrich T.

المصدر: Gallium Nitride Materials and Devices XVII

الاتاحة: http://dx.doi.org/10.1117/12.2606276

المؤلفون: Shrestha, Pragya R., Nminibapiel, David M., Campbell, Jason P., Ryan, Jason T., Veksler, Dmitry, Baumgart, Helmut, Cheung, Kin P.

المصدر: IEEE Transactions on Electron Devices ; volume 65, issue 1, page 108-114 ; ISSN 0018-9383 1557-9646

الاتاحة: https://doi.org/10.1109/ted.2017.2776860
http://xplorestaging.ieee.org/ielx7/16/8232422/08167320.pdf?arnumber=8167320

المؤلفون: Nminibapiel, David M., Veksler, Dmitry, Kim, J.-H., Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Cheung, Kin P.

المصدر: Electrical & Computer Engineering Faculty Publications

مصطلحات موضوعية: Fluctuations, Instability, Program-verify, Relaxation, RRAM, Electrical and Computer Engineering, Electrical and Electronics

وصف الملف: application/pdf

Relation: https://digitalcommons.odu.edu/ece_fac_pubs/123; https://digitalcommons.odu.edu/context/ece_fac_pubs/article/1131/viewcontent/nihms899057_Baumgart.pdf

الاتاحة: https://digitalcommons.odu.edu/ece_fac_pubs/123
https://doi.org/10.1109/led.2017.2696002
https://digitalcommons.odu.edu/context/ece_fac_pubs/article/1131/viewcontent/nihms899057_Baumgart.pdf

المؤلفون: Sin, Yongkun, Veksler, Dmitry, Hubbard, William, Sitzman, Scott D., Brodie, Miles, Lingley, Zachary, Ives, Neil

المساهمون: Morkoç, Hadis, Fujioka, Hiroshi, Schwarz, Ulrich T.

المصدر: Gallium Nitride Materials and Devices XVI

الاتاحة: http://dx.doi.org/10.1117/12.2576910

المؤلفون: Sin, Yongkun, Veksler, Dmitry, Hubbard, William, Brodie, Miles, Sitzman, Scott, Lingley, Zachary

المساهمون: Morkoç, Hadis, Fujioka, Hiroshi, Schwarz, Ulrich T.

المصدر: Gallium Nitride Materials and Devices XV

الاتاحة: http://dx.doi.org/10.1117/12.2543432

المؤلفون: Sunday, Christopher E.¹, Veksler, Dmitry¹, Cheung, Kin C.¹, Obeng, Yaw S.¹

المصدر: Journal of Applied Physics. 11/7/2017, Vol. 122 Issue 17, p174504-1-174504-7. 7p. 1 Diagram, 1 Chart, 7 Graphs.

مصطلحات موضوعية: *ELECTRODIFFUSION, *DIFFUSION, *METROLOGY, *INTEGRATED circuits, *MICROWAVES

المؤلفون: Sin, Yongkun, Veksler, Dmitry, Bonsall, Jeremy, Sitzman, Scott, Brodie, Miles, Lingley, Zachary, Foran, Brendan

المساهمون: Morkoç, Hadis, Fujioka, Hiroshi, Schwarz, Ulrich T.

المصدر: Gallium Nitride Materials and Devices XIV

الاتاحة: http://dx.doi.org/10.1117/12.2507016

المؤلفون: Janson, Siegfried, Bushmaker, Adam, Walker, Donald, Veksler, Dmitry, Matala-tala, Laurent

المصدر: Small Satellite Conference

مصطلحات موضوعية: redefining, craft, applications, spacecraft, brane, phase

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______1459::40275b8ac9c7cb07efde6fba7930778c
https://digitalcommons.usu.edu/cgi/viewcontent.cgi?article=4358&context=smallsat

المؤلفون: Fujioka, Hiroshi, Morkoç, Hadis, Schwarz, Ulrich T., Sin, Yongkun, Veksler, Dmitry, Edwards, Patrick, Brodie, Miles, Sitzman, Scott, Lingley, Zachary

المصدر: Proceedings of SPIE; March 2022, Vol. 12001 Issue: 1 p120010E-120010E-10, 11881001p

المؤلفون: Anwar, Sarkar R. M., Vandenberghe, William G., Bersuker, Gennadi, Veksler, Dmitry, Galatage, Rohit V., Jha, Sumit, Buie, Creighton, Barton, Adam T., Vogel, Eric M., Hinkle, Christopher L., VERZELLESI, Giovanni, MORASSI, LUCA

المساهمون: Anwar, Sarkar R. M., Vandenberghe, William G., Bersuker, Gennadi, Veksler, Dmitry, Verzellesi, Giovanni, Morassi, Luca, Galatage, Rohit V., Jha, Sumit, Buie, Creighton, Barton, Adam T., Vogel, Eric M., Hinkle, Christopher L.

مصطلحات موضوعية: C-V Simulation, CV Alternative Channel Extraction (ACE), Dit extraction, III-V semiconductor, quantum mechanical (QM) effect, thin oxide, Electronic, Optical and Magnetic Material, Electrical and Electronic Engineering

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000408118700040; volume:64; issue:9; firstpage:3786; lastpage:3793; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; http://hdl.handle.net/11380/1146812; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85028754325

الاتاحة: http://hdl.handle.net/11380/1146812
https://doi.org/10.1109/TED.2017.2725645

المؤلفون: Anwar, Sarkar R. M., Vandenberghe, William G., Bersuker, Gennadi, Veksler, Dmitry, Galatage, Rohit V., Jha, Sumit, Buie, Creighton, Barton, Adam T., Vogel, Eric M., Hinkle, Christopher L., VERZELLESI, Giovanni, MORASSI, LUCA

المساهمون: Anwar, Sarkar R. M., Vandenberghe, William G., Bersuker, Gennadi, Veksler, Dmitry, Verzellesi, Giovanni, Morassi, Luca, Galatage, Rohit V., Jha, Sumit, Buie, Creighton, Barton, Adam T., Vogel, Eric M., Hinkle, Christopher L.

مصطلحات موضوعية: C-V simulation, CV ACE, Dit extraction, III-V semiconductor, quantum mechanical (QM) effect, thin oxide, Electronic, Optical and Magnetic Material, Electrical and Electronic Engineering

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000408118700041; volume:64; issue:9; firstpage:3794; lastpage:3801; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; http://hdl.handle.net/11380/1146814; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85028743550

الاتاحة: http://hdl.handle.net/11380/1146814
https://doi.org/10.1109/TED.2017.2725741

المؤلفون: Georgiou, Vasileia, Veksler, Dmitry, Campbell, Jason P., Shrestha, Pragya R., Ryan, Jason T., Ioannou, Dimitris E., Cheung, Kin P.

المساهمون: Jurchescu, Oana D., McCulloch, Iain

المصدر: Organic Field-Effect Transistors XVI

الاتاحة: http://dx.doi.org/10.1117/12.2274201

المؤلفون: Georgiou, Vasileia, Veksler, Dmitry, Campbell, Jason P., Shrestha, Pragya R., Ryan, Jason T., Ioannou, Dimitris E., Cheung, Kin P.

المساهمون: National Institute of Standards and Technology

المصدر: Advanced Functional Materials ; volume 28, issue 10 ; ISSN 1616-301X 1616-3028

الاتاحة: http://dx.doi.org/10.1002/adfm.201705250
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fadfm.201705250
https://onlinelibrary.wiley.com/doi/pdf/10.1002/adfm.201705250
https://onlinelibrary.wiley.com/doi/full-xml/10.1002/adfm.201705250
https://onlinelibrary.wiley.com/doi/am-pdf/10.1002/adfm.201705250

المؤلفون: Veksler, Dmitry¹ Dmitry.Veksler@sematech.org, Bersuker, Gennadi¹ gennadi.bersuker@sematech.org

المصدر: Journal of Applied Physics. 2014, Vol. 115 Issue 3, p1-11. 11p. 2 Diagrams, 1 Chart, 10 Graphs.

مصطلحات موضوعية: *DIELECTRICS research, *ENERGY dissipation, *PROCESS optimization, *CHARGE transfer, *LOW voltage systems

المؤلفون: Rumyantsev, Sergey L., Dmitriev, Alexander P., Levinshtein, Michael E., Veksler, Dmitry, Shur, Michael S., Palmour, John W., Das, Mrinal K., Hull, Brett A.

المصدر: Journal of Applied Physics; 9/15/2006, Vol. 100 Issue 6, p064505, 6p, 7 Graphs

مصطلحات موضوعية: BOUNDARY layer noise, BIPOLAR transistors, BIPOLAR integrated circuits, THYRISTORS, SILICON-controlled rectifiers, SPECTRAL energy distribution, FLUCTUATIONS (Physics)

المؤلفون: SERENI, GABRIELE, VANDELLI, LUCA, LARCHER, Luca, Veksler, Dmitry

المساهمون: Sereni, Gabriele, Vandelli, Luca, Veksler, Dmitry, Larcher, Luca

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000350332000003; volume:62; issue:3; firstpage:705; lastpage:712; numberofpages:8; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; http://hdl.handle.net/11380/1131123; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84923917927; http://ieeexplore.ieee.org/document/7006738/

الاتاحة: http://hdl.handle.net/11380/1131123
https://doi.org/10.1109/TED.2014.2385959
http://ieeexplore.ieee.org/document/7006738/

المؤلفون: Veksler, Dmitry, Bersuker, Gennadi, Madan, H., Morassi, Luca, VERZELLESI, Giovanni

المساهمون: Veksler, Dmitry, Bersuker, Gennadi, Madan, H., Morassi, Luca, Verzellesi, Giovanni

مصطلحات موضوعية: Electric field effect, Extraction, MOS device, Surface state, Device characteristic, Effective oxide thickne, Electric variable measurement, Field-effect device, III-V MOS, Interface state density, Interface trap density, Measurement procedures

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000355235400019; volume:30; issue:6; firstpage:1; lastpage:8; numberofpages:8; journal:SEMICONDUCTOR SCIENCE AND TECHNOLOGY; info:eu-repo/grantAgreement/EC/FP7/619326; http://hdl.handle.net/11380/1082020; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84930226611; http://iopscience.iop.org/article/10.1088/0268-1242/30/6/065013/meta

الاتاحة: http://hdl.handle.net/11380/1082020
https://doi.org/10.1088/0268-1242/30/6/065013
http://iopscience.iop.org/article/10.1088/0268-1242/30/6/065013/meta