المؤلفون: Jenei, S., Decoutere, S., Van Huylenbroeck, S., Vanhorebeek, G., Nauwelaers, B.

المصدر: 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (IEEE Cat. No.01EX496) ; page 64-70

الاتاحة: http://dx.doi.org/10.1109/smic.2001.942342
http://xplorestaging.ieee.org/ielx5/7484/20342/00942342.pdf?arnumber=942342

المؤلفون: Decoutere, S., Deferm, L., Vanhorebeek, G., Claeys, C., Declerck, G.

المصدر: International Technical Digest on Electron Devices ; page 25-28

الاتاحة: http://dx.doi.org/10.1109/iedm.1990.237234
http://xplorestaging.ieee.org/ielx5/878/6081/00237234.pdf?arnumber=237234

المؤلفون: Tsouhlarakis, J, Vanhorebeek, G, Verhoeven, G, De Blauwe, J, Kim, S, Wellekens, D, Hendrickx, Patricia, Haspeslagh, L, Van Houdt, J, Maes, Herman

مصطلحات موضوعية: charge pump, flash memory, fowler-nordheim, ssi, virtual ground array, eeprom

Relation: IEEE Journal of Solid-State Circuits vol:36 issue:6 pages:969-978; https://lirias.kuleuven.be/handle/123456789/60393; http://gateway.newisiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=CCC&SrcApp=PRODUCT_NAME&SrcURL=WOS_RETURN_URL&CKEY=TSOU0969010036IJ&DestLinkType=FullRecord&DestApp=CCC&SrcDesc=RETURN_ALT_TEXT&SrcAppSID=APP_SID

الاتاحة: https://lirias.kuleuven.be/handle/123456789/60393
http://gateway.newisiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=CCC&SrcApp=PRODUCT_NAME&SrcURL=WOS_RETURN_URL&CKEY=TSOU0969010036IJ&DestLinkType=FullRecord&DestApp=CCC&SrcDesc=RETURN_ALT_TEXT&SrcAppSID=APP_SID

المؤلفون: Tsouhlarakis, J., Vanhorebeek, G., Verhoeven, G., De Blauwe, J., Shiho Kim, Wellekens, D., Hendrickx, P., Haspeslagh, L., Van Houdt, J., Maes, H.

المصدر: IEEE Journal of Solid-State Circuits ; volume 36, issue 6, page 969-978 ; ISSN 0018-9200

الاتاحة: http://dx.doi.org/10.1109/4.924859
http://xplorestaging.ieee.org/ielx5/4/20007/00924859.pdf?arnumber=924859

المؤلفون: Montanari, D, Van Houdt, J, Wellekens, D, Vanhorebeek, G, Haspeslagh, L, Deferm, L, Groeseneken, Guido, Maes, HE

مصطلحات موضوعية: euclidean distance, multilevel flash memories, parallel sensing, read out architecture, source side injection, embedded memory applications, cell

Relation: IEEE Transactions on components packaging and manufacturing technology part a vol:20 issue:2 pages:196-202; https://lirias.kuleuven.be/handle/123456789/60705; http://gateway.newisiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=INSPEC&SrcApp=PRODUCT_NAME&CKEY=MONT0196970020ID&SrcURL=WOS_RETURN_URL&DestLinkType=FullRecord&DestApp=INSPEC&SrcDesc=RETURN_ALT_TEXT&SrcAppSID=APP_SID

الاتاحة: https://lirias.kuleuven.be/handle/123456789/60705
http://gateway.newisiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=INSPEC&SrcApp=PRODUCT_NAME&CKEY=MONT0196970020ID&SrcURL=WOS_RETURN_URL&DestLinkType=FullRecord&DestApp=INSPEC&SrcDesc=RETURN_ALT_TEXT&SrcAppSID=APP_SID

المؤلفون: Haspeslagh, L., Vanhorebeek, G., Deferm, L.

المصدر: Microelectronics Journal ; volume 24, issue 4, page 427-433 ; ISSN 0026-2692

الاتاحة: http://dx.doi.org/10.1016/0026-2692(93)90049-k
https://api.elsevier.com/content/article/PII:002626929390049K?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:002626929390049K?httpAccept=text/plain

المؤلفون: Haspeslagh, L., Vanhorebeek, G., Deferm, L.

المصدر: Microelectronic Engineering ; volume 19, issue 1-4, page 721-724 ; ISSN 0167-9317

الاتاحة: http://dx.doi.org/10.1016/0167-9317(92)90530-5
https://api.elsevier.com/content/article/PII:0167931792905305?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:0167931792905305?httpAccept=text/plain

المؤلفون: Jenei, S., Decoutere, S., Van Huylenbroeck, S., Vanhorebeek, G., Nauwelaers, B.

المصدر: 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (IEEE Cat. No.01EX496); 2001, p64-70, 7p

المؤلفون: Decoutere, S., Deferm, L., Vanhorebeek, G., Claeys, C., Declerck, G.

المصدر: International Technical Digest on Electron Devices; 1990, p25-28, 4p

المؤلفون: Montanari, D., Van Houdt, J., Wellekens, D., Vanhorebeek, G., Haspeslagh, L., Deferm, L., Groeseneken, G., Maes, H.E.

المصدر: Proceedings of Nonvolatile Memory Technology Conference; 1996, p80-83, 4p

المؤلفون: Van Houdt, J., Wellekens, D., Vanhorebeek, G., Haspeslagh, L., Deferm, L., Groeseneken, G., Maes, H.E.

المصدر: ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference; 1995, p553-556, 4p

المؤلفون: Haspeslagh, L., Vanhorebeek, G., Deferm, L.

المصدر: ESSDERC '93: 23rd European solid State Device Research Conference; 1993, p155-158, 4p

المؤلفون: Coppens, P., Vanhorebeek, G., De Backer, E., Yuan, X.-J.

المصدر: 29th European Solid-State Device Research Conference; 1999, Issue 1, p220-223, 4p

المؤلفون: Coppens, P., Vanhorebeek, G., Backer, E. De

المصدر: Microelectronics Reliability; 2001, Vol. 41 Issue: 1 p53-57, 5p