المؤلفون: Prabhakara, V., Nuytten, T., Bender, H., Vandervorst, W., Bals, S., Verbeeck, J.

مصطلحات موضوعية: Physics - Optics, Physics - Applied Physics, Physics - Data Analysis, Statistics and Probability

URL الوصول: http://arxiv.org/abs/2106.08478

المؤلفون: Prabhakara, Viveksharma, Nuytten, T., Bender, H., Vandervorst, W., Bals, Sara, Verbeeck, Johan

المصدر: 1094-4087 ; Optics express

مصطلحات موضوعية: Physics

Relation: info:eu-repo/grantAgreement/EC/h2020/823717; info:eu-repo/semantics/altIdentifier/isi/000708940500144

الاتاحة: https://hdl.handle.net/10067/1824720151162165141
https://repository.uantwerpen.be/docstore/d:irua:9150

المؤلفون: Pandey, K., Paredis, K., Robson, A.J., Vandervorst, W.

وصف الملف: text

Relation: https://eprints.lancs.ac.uk/id/eprint/147213/1/JAP20_AR_02304.pdf; Pandey, K. and Paredis, K. and Robson, A.J. and Vandervorst, W. (2020) Understanding the effect of confinement in scanning spreading resistance microscopy measurements. Journal of Applied Physics, 128 (3). ISSN 0021-8979

الاتاحة: https://eprints.lancs.ac.uk/id/eprint/147213/
https://eprints.lancs.ac.uk/id/eprint/147213/1/JAP20_AR_02304.pdf
https://doi.org/10.1063/5.0011703

المؤلفون: Laricchiuta, G., Vandervorst, W., Vickridge, I., Mayer, M., Meersschaut, J.

المصدر: Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films

وصف الملف: application/pdf

Relation: http://hdl.handle.net/21.11116/0000-0002-EF9D-1; http://hdl.handle.net/21.11116/0000-0002-EF9F-F; http://hdl.handle.net/21.11116/0000-0003-16BB-2

الاتاحة: http://hdl.handle.net/21.11116/0000-0002-EF9D-1
http://hdl.handle.net/21.11116/0000-0002-EF9F-F
http://hdl.handle.net/21.11116/0000-0003-16BB-2

المؤلفون: Celano, U, Gastaldi, C, Subhechha, S, Govoreanu, B, Donadio, G, Franquet, A, Ahmad, T, Detavernier, Christophe, Richard, O, Bender, H, Goux, L, Kar, GS, van der Heide, P, Vandervorst, W

المصدر: 2017 IEEE international electron devices meeting (IEDM) ; ISSN: 2380-9248 ; ISBN: 9781538635599

مصطلحات موضوعية: Technology and Engineering

وصف الملف: application/pdf

Relation: https://biblio.ugent.be/publication/8609307; http://hdl.handle.net/1854/LU-8609307; https://biblio.ugent.be/publication/8609307/file/8609761

الاتاحة: https://biblio.ugent.be/publication/8609307
http://hdl.handle.net/1854/LU-8609307
https://biblio.ugent.be/publication/8609307/file/8609761

المؤلفون: Bogdanowicz, J., Kumar, A., Fleischmann, C., Gilbert, M., Houard, Jonathan, Vella, Angela, Vandervorst, W.

المساهمون: IMEC (IMEC), Catholic University of Leuven = Katholieke Universiteit Leuven (KU Leuven), Groupe de physique des matériaux (GPM), Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Université de Caen Normandie (UNICAEN), Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 0304-3991 ; Ultramicroscopy ; https://hal.science/hal-02061734 ; Ultramicroscopy, 2018, 188, pp.19-23. ⟨10.1016/j.ultramic.2018.03.001⟩.

مصطلحات موضوعية: [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]

Relation: hal-02061734; https://hal.science/hal-02061734; https://hal.science/hal-02061734/document; https://hal.science/hal-02061734/file/~%241-s2.0-S0304399117304217-postprint%20Bogdanowicz.pdf

الاتاحة: https://hal.science/hal-02061734
https://hal.science/hal-02061734/document
https://hal.science/hal-02061734/file/~%241-s2.0-S0304399117304217-postprint%20Bogdanowicz.pdf
https://doi.org/10.1016/j.ultramic.2018.03.001

المؤلفون: Dialameh, M., Lupi, F.F., Hoenicke, P., Kayser, Y., Beckhoff, B., Weimann, T., Fleischmann, C., Vandervorst, W., Dubcek, P., Pivac, B., Perego, M., Seguini, G., De Leo, N., Boarino, L.

مصطلحات موضوعية: Large scale facilities for research with photons neutrons and ions

Relation: http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=96147

الاتاحة: http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=96147

المؤلفون: Nuytten, T., Bogdanowicz, J., Witters, L., Eneman, G., Hantschel, T., Schulze, A., Favia, P., Bender, H., De Wolf, I., Vandervorst, W.

المساهمون: Electronic Component Systems for European Leadership Joint Undertaking

المصدر: APL Materials ; volume 6, issue 5 ; ISSN 2166-532X

الاتاحة: http://dx.doi.org/10.1063/1.4999277
https://pubs.aip.org/aip/apm/article-pdf/doi/10.1063/1.4999277/14560432/058501_1_online.pdf

المؤلفون: Zhang, H., Chiappe, D., Meersschaut, J., Conard, T., Franquet, A., Nuytten, T., Mannarino, M., Radu, I., Vandervorst, W., Delabie, A.

المصدر: JOURNAL OF CHEMICAL PHYSICS 146(5)

Relation: https://aperta.ulakbim.gov.tr/record/45745; oai:zenodo.org:45745

الاتاحة: https://aperta.ulakbim.gov.tr/record/45745

المؤلفون: NALIN MEHTA, A., ZHANG, H., DABRAL, A., RICHARD, O., FAVIA, P., BENDER, H., DELABIE, A., CAYMAX, M., HOUSSA, M., POURTOIS, G., VANDERVORST, W.

المساهمون: Vlaams Agentschap Innoveren en Ondernemen

المصدر: Journal of Microscopy ; volume 268, issue 3, page 276-287 ; ISSN 0022-2720 1365-2818

الاتاحة: http://dx.doi.org/10.1111/jmi.12652
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1111%2Fjmi.12652
https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.12652

المؤلفون: Groven, B., Claes, D., Nalin Mehta, A., Bender, H., Vandervorst, W., Heyns, M., Caymax, M., Radu, I., Delabie, A.

المصدر: Journal of Chemical Physics; 3/14/2019, Vol. 150 Issue 10, pN.PAG-N.PAG, 14p, 5 Diagrams, 6 Graphs

مصطلحات موضوعية: CHEMICAL vapor deposition, LOW temperatures

المؤلفون: Franquet, A., Spampinato, V., Kayser, S., Vandervorst, W., van der Heide, P.

المصدر: Vacuum ; volume 202, page 111182 ; ISSN 0042-207X

الاتاحة: http://dx.doi.org/10.1016/j.vacuum.2022.111182
https://api.elsevier.com/content/article/PII:S0042207X22003098?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0042207X22003098?httpAccept=text/plain

المؤلفون: Celano, U., Fantini, A., Degraeve, R., Jurczak, M., Goux, L., Vandervorst, W.

المصدر: AIP Advances ; volume 6, issue 8 ; ISSN 2158-3226

الاتاحة: http://dx.doi.org/10.1063/1.4961150
https://pubs.aip.org/aip/adv/article-pdf/doi/10.1063/1.4961150/12883870/085009_1_online.pdf

المؤلفون: Martens, K., Jeong, J. W., Aetukuri, N., Rettner, C., Shukla, N., Freeman, E., Nasr Esfahani, Davoud, Peeters, François, Topuria, T., Rice, P. M., Volodin, A., Douhard, B., Vandervorst, W., Samant, M. G., Datta, S., Parkin, S. S. P.

المصدر: 0031-9007 ; Physical review letters

مصطلحات موضوعية: Physics

وصف الملف: pdf

Relation: info:eu-repo/semantics/altIdentifier/isi/000364024800013

الاتاحة: https://hdl.handle.net/10067/1295470151162165141
https://repository.uantwerpen.be/docman/irua/eb85c4/129547.pdf

المؤلفون: Qiu, Y., Bender, H., Richard, O., Kim, M.-S., Van Besien, E., Vos, I., de Potter de ten Broeck, M., Mocuta, D., Vandervorst, W.

المصدر: Scientific Reports ; volume 5, issue 1 ; ISSN 2045-2322

الاتاحة: http://dx.doi.org/10.1038/srep12692
https://www.nature.com/articles/srep12692
https://www.nature.com/articles/srep12692.pdf

المؤلفون: Kumar, A., Bogdanowicz, J., Demeulemeester, J., Bran, J., Melkonyan, D., Fleischmann, C., Vandervorst, W.

المصدر: Journal of Applied Physics; 2018, Vol. 124 Issue 24, pN.PAG-N.PAG, 7p, 7 Graphs

مصطلحات موضوعية: FEMTOSECOND pulses, PULSED lasers, ATOM-probe tomography, ELECTRIC properties of silicon, METHODOLOGY, ELECTRIC fields

المؤلفون: Meuris, M., Jaeger, B., Steenbergen, J., Bonzom, R., Caymax, M., Houssa, M., Kaczer, B., Leys, F., Martens, K., Opsomer, K., Pourghaderi, A. M., Satta, A., Simoen, E., Terzieva, V., Moorhem, E., Winderickx, G., Loo, R., Clarysse, T., Conard, T., Delabie, A., Hellin, D., Janssens, T., Onsia, B., Sioncke, S., Mertens, P. W., Snow, J., Elshocht, S., Vandervorst, W., Zimmerman, P., Brunco, D., Raskin, G., Letertre, F., Akatsu, T., Billon, T., Heyns, M.

المصدر: Advanced Microelectronics ; Advanced Gate Stacks for High-Mobility Semiconductors ; page 333-340 ; ISBN 9783540714903 9783540714910

الاتاحة: https://doi.org/10.1007/978-3-540-71491-0_15
http://link.springer.com/content/pdf/10.1007/978-3-540-71491-0_15.pdf

المؤلفون: Heyns, M., Alian, A., BRAMMERTZ, Guy, Caymax, M., Eneman, G., Franco, J., Gencarelli, F., Groeseneken, G., Hellings, G., Hikavyy, A., Houssa, M., Kaczer, B., LIN, Dan, Loo, R., Merckling, C., MEURIS, Marc, Mitard, J., Nyns, L., Sioncke, S., Vandervorst, W., Vincent, B., Waldron, N., Witters, L.

المساهمون: Loo, Roger/0000-0003-3513-6058, Franco, Jacopo/0000-0002-7382-8605, Merckling, Clement/0000-0003-3084-2543, houssa, michel/0000-0003-1844-3515, Groeseneken, Guido/0000-0003-3763-2098, heyns, marc/0000-0002-1199-4341

مصطلحات موضوعية: CMOS, Germanium, III/V, defects, ATOMIC LAYER DEPOSITION, SURFACE SEGREGATION, PASSIVATION, GROWTH, PERFORMANCE, NBTI

Relation: 2012; 2012 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), IEEE; http://hdl.handle.net/1942/31559; WOS:000309183100082

الاتاحة: http://hdl.handle.net/1942/31559

المؤلفون: Vandervorst, W.

المصدر: AIP Conference Proceedings ; volume 683, page 758-763 ; ISSN 0094-243X

الاتاحة: http://dx.doi.org/10.1063/1.1622556

المؤلفون: Vandervorst, W.

المصدر: AIP Conference Proceedings ; volume 683, page 129-138 ; ISSN 0094-243X

الاتاحة: http://dx.doi.org/10.1063/1.1622459