المؤلفون: Jyotirmoy Karjee, Praveen Naik S, Kartik Anand, Vanamala N. Bhargav

المصدر: Measurement: Sensors, Vol 23, Iss , Pp 100409- (2022)

مصطلحات موضوعية: Connection reliability, Deep neural network (DNN), Inference time, Edge computing, Internet of things (IoT), Load-balancing, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2665917422000435; https://doaj.org/toc/2665-9174

URL الوصول: https://doaj.org/article/61911fd5ec604aefb95ca55d6cebcde9