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1Periodical
المؤلفون: Galvez, F., Vallis, S., Ingham, Jason M.
المصدر: SESOC journal, Apr 2019; v.32:n.1:p.61-71
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2Report
وصف الملف: application/pdf
Relation: https://openarchive.icomos.org/id/eprint/2459/; ICOMOS Climate Change and Cultural Heritage Working Group. 2019. The Future of Our Pasts: Engaging Cultural Heritage in Climate Action, July 1, 2019. Paris: ICOMOS.; http://hdl.handle.net/10292/16477
الاتاحة: http://hdl.handle.net/10292/16477
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3Conference
المؤلفون: Giovinazzi, S, Abeling, Shannon, Galvez, F, Vallis, S, Goded, T, Horspool, N, Calandra, E, Ingham, Jason
مصطلحات موضوعية: Cultural Heritage, Resilience, Decision Support Systems, Seismic Vulnerability, Retrofitting Strategies
جغرافية الموضوع: Thessaloniki, Greece
وصف الملف: application/pdf
Relation: 16th European Conference on Earthquake Engineering; http://hdl.handle.net/2292/41687
الاتاحة: http://hdl.handle.net/2292/41687
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4Conference
المؤلفون: Abeling, Shannon, Vallis, S, Galvez, F, Ingham, Jason, Goded, T, Horspool, N, Giovinazzi, S
جغرافية الموضوع: Auckland
وصف الملف: application/pdf
Relation: 2018 NZSEE Conference; http://hdl.handle.net/2292/41631
الاتاحة: http://hdl.handle.net/2292/41631
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5Academic Journal
المؤلفون: Long, A. R., Skuras, E., Vallis, S., Cusco, R., Larkin, I. A., Davies, J. H., Holland, M. C.
مصطلحات موضوعية: 2-dimensional electron-gas, magnetoresistance oscillations, weiss oscillations, transport, algaas
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6Academic Journal
المؤلفون: Ali, K., Skuras, E., Vallis, S., Long, A.R., Larkin, I.A., Davies, J.H., Holland, M.C., Mongy, A.Abd-El
المصدر: Superlattices and Microstructures ; volume 25, issue 1-2, page 285-288 ; ISSN 0749-6036
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7Academic Journal
المؤلفون: Cusco, R., Skuras, E., Vallis, S., Holland, M. C., Long, A. R., Beaumont, S. P., Larkin, I. A., Davies, J. H.
مصطلحات موضوعية: electron-gas, magnetoresistance
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8Academic Journal
المؤلفون: Cuscó, R, Skuras, E, Vallis, S, Holland, MC, Long, AR, Beaumont, SP, Larkin, IA, Davies, JH
المصدر: Superlattices and Microstructures ; volume 16, issue 3, page 283-286 ; ISSN 0749-6036
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9Academic Journal
المؤلفون: Long, A R, Davies, J H, Kinsler, M, Vallis, S, Holland, M C
المصدر: Semiconductor Science and Technology ; volume 8, issue 8, page 1581-1589 ; ISSN 0268-1242 1361-6641