المؤلفون: di Summa, Maria, Cardellicchio, Angelo, Mosca, Nicola, Ricci, Marina, Renò, Vito, Vadukkal, Udith Krishnan Vadakkum, Stella, Ettore

المصدر: 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) ; page 464-469

الاتاحة: https://doi.org/10.1109/metroxraine62247.2024.10796728
http://xplorestaging.ieee.org/ielx8/10795805/10795809/10796728.pdf?arnumber=10796728

المؤلفون: Vadukkal, Udith Krishnan Vadakkum, Palumbo, Michela, Attolico, Giovanni

المصدر: Applied Sciences (2076-3417); Jun2023, Vol. 13 Issue 12, p6969, 17p

مصطلحات موضوعية: CONVOLUTIONAL neural networks, DEEP learning, COMPUTER vision, PACKAGED foods, COMPUTER systems, QUALITY control

مصطلحات جغرافية: FUJI, Mount (Japan)