المؤلفون: V. O. Kaziuchyts, S. M. Borovikov, E. N. Shneiderov

المصدر: Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 20, Iss 7, Pp 72-80 (2022)

مصطلحات موضوعية: computer programs, testing efficiency, testing time, operational reliability, semiconductor devices, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: https://doklady.bsuir.by/jour/article/view/3504; https://doaj.org/toc/1729-7648

URL الوصول: https://doaj.org/article/653128222b384bdd93290c6c6f5d3495

المؤلفون: V. O. Kaziuchyts, E. V. Kalita, S. M. Borovikov, A. I. Berasnevich

المصدر: Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 20, Iss 4, Pp 36-43 (2022)

مصطلحات موضوعية: bipolar transistors, gradual failure reliability, long operating time, accelerated testing, simulation model, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: https://doklady.bsuir.by/jour/article/view/3387; https://doaj.org/toc/1729-7648

URL الوصول: https://doaj.org/article/f7c51d510fb14ab99b1354c3e9dc8e43

المؤلفون: V. O. Kaziuchyts, S. M. Borovikov, E. N. Shneiderov

المصدر: Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 20, Iss 1, Pp 92-100 (2022)

مصطلحات موضوعية: semiconductor devices, reliability, individual prediction, informative parameters, predictive rule, predictive function, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: https://doklady.bsuir.by/jour/article/view/3289; https://doaj.org/toc/1729-7648

URL الوصول: https://doaj.org/article/f8c6123aa03c4c7dbc86f2f810d94048

المؤلفون: S. M. Borovikov, V. O. Kaziuchyts,, V. V. Khoroshko, S. S. Dick, K. I. Klinov

المصدر: Informatika, Vol 18, Iss 1, Pp 84-95 (2021)

مصطلحات موضوعية: failure rate of computer program, reliability model, early stages of development, predicted error density, expected number of errors, Electronic computers. Computer science, QA75.5-76.95

وصف الملف: electronic resource

Relation: https://inf.grid.by/jour/article/view/1103; https://doaj.org/toc/1816-0301

URL الوصول: https://doaj.org/article/855b029353cb487a91830f55f7d0c396

المؤلفون: S. M. Borovikov, V. O. Kaziuchyts

المصدر: Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 19, Iss 1, Pp 88-95 (2021)

مصطلحات موضوعية: semiconductor devices, reliability, individual forecasting, informative parameters, majority logic method, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: https://doklady.bsuir.by/jour/article/view/2995; https://doaj.org/toc/1729-7648

URL الوصول: https://doaj.org/article/2b868f8f419244a381b9a16528d81ae4

المؤلفون: S. M. Borovikov, E. N. Shneiderov, A. I. Berasnevich, V. O. Kaziuchyts

المصدر: Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 18, Iss 5, Pp 80-88 (2020)

مصطلحات موضوعية: semiconductor devices, reliability according to gradual failures, simulation effect, individual reliability prediction, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: https://doklady.bsuir.by/jour/article/view/2739; https://doaj.org/toc/1729-7648

URL الوصول: https://doaj.org/article/9389fe4c73a04b3fb1d50cc2c6da93d6