المؤلفون: Ugwuoke, Cyril O., Temam, Abdudin G., Ijeh, Rufus O., Nsude, Hope E., Ugwu, Ernest I., Mammah, Sylvester, Agbogu, A., Ezugwu, Sabastine, Ezema, Fabian I.

المصدر: Journal of Materials Science: Materials in Electronics ; volume 34, issue 31 ; ISSN 0957-4522 1573-482X

الاتاحة: http://dx.doi.org/10.1007/s10854-023-11499-z
https://link.springer.com/content/pdf/10.1007/s10854-023-11499-z.pdf
https://link.springer.com/article/10.1007/s10854-023-11499-z/fulltext.html

المؤلفون: Ugwuoke, Cyril O., Temam, Abdudin G., Ijeh, Rufus O., Nsude, Hope E., Ugwu, Ernest I., Mammah, Sylvester, Agbogu, A., Ezugwu, Sabastine, Ezema, Fabian I.

المصدر: Journal of Materials Science: Materials in Electronics; Nov2023, Vol. 34 Issue 31, p1-13, 13p