المؤلفون: Tucto K., Flores L., Guerra J., Töfflinger J., Dulanto J., Grieseler R., Osvet A., Batentschuk M., Weingärtner R.

مصطلحات موضوعية: Aluminum compounds, Annealing, Cobalt compounds, Energy dispersive X ray analysis, Infrared devices, Luminescence, Nitrides, Photoelectrochemical cells, Photovoltaic cells, Rare earth elements, Semiconductor doping, Sputtering, Thin films, X ray diffraction analysis, Aluminum oxynitride, Aluminum oxynitride thin films, Annealing temperatures, Doping concentration, Near-infrared emissions, Photoluminescence measurements, Radio frequency magnetron sputtering, Silicon substrates, Ytterbium compounds

Relation: MRS Advances; CONV-000236-2015-FONDECYT-DE - PROMOCION 1; http://hdl.handle.net/20.500.12390/753; 2-s2.0-85047181476

الاتاحة: https://hdl.handle.net/20.500.12390/753
https://doi.org/10.1557/adv.2017.478

المؤلفون: Guerra J.A., Montañez L.M., Tucto K., Angulo J., Töfflinger J.A., Winnaker A., Weingärtner R.

مصطلحات موضوعية: Absorption spectroscopy, Amorphous films, Amorphous materials, Deposition, Energy gap, Hydrogenation, Optical properties, Silicon, Silicon carbide, Thin films, Band gap energy, Band gap engineering, Deposition process, General equations, Hydrogen dilution, Hydrogenated silicon carbide, Post deposition annealing, Simple modeling, Amorphous silicon

Relation: MRS Advances; http://hdl.handle.net/20.500.12390/644; 2-s2.0-85018286606

الاتاحة: https://hdl.handle.net/20.500.12390/644
https://doi.org/10.1557/adv.2016.422

المؤلفون: Guerra J.A., Tucto K., Montañez L.M., De Zela F., Töfflinger J.A., Winnaker A., Weingärtner R.

مصطلحات موضوعية: Amorphous materials, Annealing, Chemical activation, Luminescence, Silicon carbide, Terbium, Thin films, Analytical studies, Annealing temperatures, Integrated emissions, Light emission intensity, Luminescence enhancements, Non-radiative recombinations, Optically active ions, Rate-equation models, Amorphous films

Relation: MRS Advances; CONV-000232-2015-FONDECYT-DE - PROMOCION 1; http://hdl.handle.net/20.500.12390/515; 2-s2.0-85041322534

الاتاحة: https://hdl.handle.net/20.500.12390/515
https://doi.org/10.1557/adv.2016.464

المؤلفون: Guerra, J A, De Zela, F, Tucto, K, Montañez, L, Töfflinger, J A, Winnacker, A, Weingärtner, R

المصدر: Journal of Physics D: Applied Physics ; volume 49, issue 40, page 409601 ; ISSN 0022-3727 1361-6463

الاتاحة: http://dx.doi.org/10.1088/0022-3727/49/40/409601
http://stacks.iop.org/0022-3727/49/i=40/a=409601/pdf
http://stacks.iop.org/0022-3727/49/i=40/a=409601?key=crossref.1a9eb39dc60b0187656b0ede2908fdf7

المؤلفون: Guerra, J A, De Zela, F, Tucto, K, Montañez, L, Töfflinger, J A, Winnacker, A, Weingärtner, R

المصدر: Journal of Physics D: Applied Physics ; volume 49, issue 37, page 375104 ; ISSN 0022-3727 1361-6463

الاتاحة: http://dx.doi.org/10.1088/0022-3727/49/37/375104
http://stacks.iop.org/0022-3727/49/i=37/a=375104/pdf
http://stacks.iop.org/0022-3727/49/i=37/a=375104?key=crossref.9c395771246e910ef1595a6884e5800e

المؤلفون: Tucto, K. Y., Aponte, W., Dulanto, J. A., Töfflinger, J. A., Guerra, J. A., Grieseler, R.

المصدر: Applied Optics; April 2019, Vol. 58 Issue: 12 p3097-3103, 7p