المؤلفون: Tsenev, Valentin, Petkova, Petya

المساهمون: Bulgarian National Science Fund

المصدر: 2024 XXXIII International Scientific Conference Electronics (ET) ; page 1-5

الاتاحة: http://dx.doi.org/10.1109/et63133.2024.10721548
http://xplorestaging.ieee.org/ielx8/10721410/10721478/10721548.pdf?arnumber=10721548

المؤلفون: Tsenev, Valentin, Hristov, Preslav, Slavchev, Miroslav, Draganov, Teodor

المساهمون: Bulgarian National Science Fund

المصدر: 2024 International Conference on Information Technologies (InfoTech) ; page 1-4

الاتاحة: http://dx.doi.org/10.1109/infotech63258.2024.10701383
http://xplorestaging.ieee.org/ielx8/10701313/10701322/10701383.pdf?arnumber=10701383

المؤلفون: Peshev, Nedyalko, Tsenev, Valentin

المساهمون: Bulgarian National Science Fund

المصدر: 2024 International Conference on Information Technologies (InfoTech) ; page 1-4

الاتاحة: http://dx.doi.org/10.1109/infotech63258.2024.10701418
http://xplorestaging.ieee.org/ielx8/10701313/10701322/10701418.pdf?arnumber=10701418

المؤلفون: Tsenev, Valentin, Draganov, Teodor

المساهمون: Bulgarian National Science Fund

المصدر: 2024 9th International Conference on Smart and Sustainable Technologies (SpliTech) ; page 1-5

الاتاحة: http://dx.doi.org/10.23919/splitech61897.2024.10612637
http://xplorestaging.ieee.org/ielx8/10612282/10612285/10612637.pdf?arnumber=10612637

المؤلفون: Tsenev, Valentin, Ivanova, Malinka

المساهمون: Research Fund Bulgaria

المصدر: Bulletin of Electrical Engineering and Informatics; Vol 11, No 5: October 2022; 2527-2536 ; 2302-9285 ; 2089-3191 ; 10.11591/eei.v11i5

مصطلحات موضوعية: Electronics, Automatic production line, Measurement system analysis, R&R statistical method, Statistical process control, Supervised machine learning

وصف الملف: application/pdf

Relation: https://beei.org/index.php/EEI/article/view/3664/2895; https://beei.org/index.php/EEI/article/view/3664

الاتاحة: https://beei.org/index.php/EEI/article/view/3664
https://doi.org/10.11591/eei.v11i5.3664

المؤلفون: Ivanova, Malinka, Tsenev, Valentin, Mikova, Vania

المصدر: Engineering, Technology & Applied Science Research; Dec2023, Vol. 13 Issue 6, p12342-12347, 6p

مصطلحات موضوعية: MACHINE learning, SYSTEM analysis, QUALITY control, PREDICTION models, MANUFACTURING processes, MEASUREMENT

المؤلفون: Tsenev, Valentin, Videkov, Valentin, Spasova, Nadejda

المصدر: 2021 XXX International Scientific Conference Electronics (ET)

الاتاحة: http://dx.doi.org/10.1109/et52713.2021.9579659
http://xplorestaging.ieee.org/ielx7/9579469/9579476/09579659.pdf?arnumber=9579659

المؤلفون: Videkov, Valentin, Tsenev, Valentin, Stratev, Aleksei

المصدر: 2018 41st International Spring Seminar on Electronics Technology (ISSE) ; volume 24, page 1-5

الاتاحة: http://dx.doi.org/10.1109/isse.2018.8443662
http://xplorestaging.ieee.org/ielx7/8429901/8443603/08443662.pdf?arnumber=8443662

المؤلفون: Tsenev, Valentin

المصدر: 2018 41st International Spring Seminar on Electronics Technology (ISSE) ; page 1-4

الاتاحة: http://dx.doi.org/10.1109/isse.2018.8443650
http://xplorestaging.ieee.org/ielx7/8429901/8443603/08443650.pdf?arnumber=8443650

المؤلفون: Tsenev, Valentin, Videkov, Valentin

المصدر: 2018 IEEE XXVII International Scientific Conference Electronics - ET ; page 1-4

الاتاحة: http://dx.doi.org/10.1109/et.2018.8549606
http://xplorestaging.ieee.org/ielx7/8519940/8549578/08549606.pdf?arnumber=8549606

المؤلفون: Tsenev, Valentin, Videkov, Valentin

المصدر: 2017 XXVI International Scientific Conference Electronics (ET) ; page 1-4

الاتاحة: http://dx.doi.org/10.1109/et.2017.8124397
http://xplorestaging.ieee.org/ielx7/8116590/8124329/08124397.pdf?arnumber=8124397

المؤلفون: Tsenev, Valentin, Videkov, Valentin, Stratev, Aleksei, Mitov, Mladen, Bankova, Ana, Atanasov, Vasil

المصدر: 2016 39th International Spring Seminar on Electronics Technology (ISSE) ; page 160-162

الاتاحة: http://dx.doi.org/10.1109/isse.2016.7563180
http://xplorestaging.ieee.org/ielx7/7553393/7562869/07563180.pdf?arnumber=7563180