نتائج البحث - "Toshihide Agemura"

1

Academic Journal

120 kVフォトカソード電子銃を用いた高輝度パルス透過電子顕微鏡の開発 / Development of High Brightness Pulse-TEM Using 120-kV Photocathode Elctron Gun

المؤلفون: Isao Nagaoki, Koh Saitoh, Makoto Kuwahara, Rina Yokoi, Takafumi Ishida, Toshihide Agemura, Wataru Nagata, 揚村寿英, 桑原真人, 横井里奈, 永田渉, 石田高史, 長沖功, 齋藤晃

المصدر: JSAP Annual Meetings Extended Abstracts. 2019, :1740

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2

Academic Journal

Development of Electron Gun Utilized Highly-bright NEA Photocathode for SEM / 高輝度NEAホトカソードを電子源としたSEM向け電子銃の開発

المؤلفون: Hideo Morishita, Makoto Kuwahara, Takashi Ohshima, Toshihide Agemura, Yoichi Ose, 大嶋卓, 小瀬洋一, 揚村寿英, 桒原真人, 森下英郎

المصدر: JSAP Annual Meetings Extended Abstracts. 2019, :1722

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3

Academic Journal

Energy and Direction Resolved Secondary Electron Imaging Using Fountain Detector

المؤلفون: Hideo Iwai, Takashi Sekiguchi, Toshihide Agemura

المصدر: Journal of Surface Analysis. 2019, 26(2):148

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4

Academic Journal

Development of electrostatic Cs-corrector for SEM using annular and circular electrodes / 円環・円孔電極を用いたSEM用電界型Csコレクタの開発

المؤلفون: Masahiro Tomita, Ryuji Yoshida, Shunichi Motomura, Tadahiro Kawasaki, Takashi Ikuta, Takeharu Kato, Toshihide Agemura, Tsunenori Nomaguchi, 加藤丈晴, 吉田竜視, 富田正弘, 川崎忠寛, 揚村寿英, 本村俊一, 生田孝, 野間口恒典

المصدر: JSAP Annual Meetings Extended Abstracts. 2018, :1765

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5

Academic Journal

Energy resolved secondary electron imaging of semiconductor pn junctions using fountain detector / 噴水検出器による半導体pn接合のエネルギー分解二次電子像

المؤلفون: Iwai Hideo, Takashi Sekiguchi, Toshihide Agemura, 岩井秀夫, 揚村寿英, 関口隆史

المصدر: Abstract of annual meeting of the Surface Science of Japan. 2018, :10

6

Academic Journal

Observation of Insulators using Fountain Detector / 噴水型低エネルギー二次電子検出器による絶縁体の観察

المؤلفون: Hideo Iwai, Kimura Takashi, Takashi Sekiguchi, Toshihide Agemura, 岩井秀夫, 揚村寿英, 木村隆, 関口隆史

المصدر: JSAP Annual Meetings Extended Abstracts. 2016, :1553

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7

Development of General-purpose Dielectric Constant Imaging Unit for SEM and Direct Observation of Samples in Aqueous Solution

المؤلفون: Toshihiko Ogura, Tomoko Okada, Michio Hatano, Mitsuhiro Nakamura, Toshihide Agemura

المصدر: Microscopy and Microanalysis.

مصطلحات موضوعية: Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4b558235ec72678f58f97bb9796ac2b5
https://doi.org/10.1093/micmic/ozad030

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8

A Novel Monochromator with Offset Cylindrical Lenses and Its Application to a Low-Voltage Scanning Electron Microscope

المؤلفون: Takashi Ogawa, Yu Yamazawa, Satoshi Kawai, Atsushi Mouri, Junichi Katane, In-Yong Park, Yoshizo Takai, Toshihide Agemura

المصدر: Microscopy and Microanalysis. 28:412-424

مصطلحات موضوعية: Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1bae8d4b16ff2cfb003d1f615a54ee17
https://doi.org/10.1017/s1431927622000150

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9

Temporal resolution in transmission electron microscopy using a photoemission electron source

المؤلفون: Makoto Kuwahara, Toshihide Agemura

المصدر: Microscopy (Oxford, England).

مصطلحات موضوعية: Structural Biology, Radiology, Nuclear Medicine and imaging, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bdfd0b6ce5c70bda41e824a9d59d186d
https://pubmed.ncbi.nlm.nih.gov/36508300

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10

Transient electron energy-loss spectroscopy of optically stimulated gold nanoparticles using picosecond pulsed electron beam

المؤلفون: Makoto Kuwahara, Lira Mizuno, Rina Yokoi, Hideo Morishita, Takafumi Ishida, Koh Saitoh, Nobuo Tanaka, Shota Kuwahara, Toshihide Agemura

المصدر: Applied Physics Letters. 121:143503

مصطلحات موضوعية: Physics and Astronomy (miscellaneous)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f6494cb384a74ab29bdcab75f95bb305
https://doi.org/10.1063/5.0108266

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11

Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope

المؤلفون: Takashi Ohshima, Toshihide Agemura, Hideo Morishita, Kazuo Otsuga, Yoichi Ose, Makoto Kuwahara

المصدر: Ultramicroscopy. 230:113386

مصطلحات موضوعية: Brightness, Materials science, Scanning electron microscope, business.industry, Pulse duration, Acceleration voltage, Atomic and Molecular Physics, and Optics, Photocathode, Electronic, Optical and Magnetic Materials, law.invention, Optics, law, Cathode ray, Electron microscope, business, Instrumentation, Electron gun

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fc9acffb36fc5354b09cb69d90ea9fdb
https://doi.org/10.1016/j.ultramic.2021.113386

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12

Resolution improvement of low-voltage scanning electron microscope by bright and monochromatic electron gun using negative electron affinity photocathode

المؤلفون: Makoto Kuwahara, Yoichi Ose, Takashi Ohshima, Toshihide Agemura, Hideo Morishita

المصدر: Journal of Applied Physics. 127:164902

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Scanning electron microscope, Resolution (electron density), General Physics and Astronomy, 02 engineering and technology, Electron, 021001 nanoscience & nanotechnology, 01 natural sciences, Acceleration voltage, Photocathode, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business, Low voltage, Common emitter, Electron gun

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6339a0924d1cc5e23d45ce45915e13ca
https://doi.org/10.1063/5.0005714

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13

A Compact Aberration Corrector for SEMs with Electrostatic-field formed by Annular and Circular Electrodes

المؤلفون: Takeharu Kato, Tadahiro Kawasaki, Toshihide Agemura, Shunichi Motomura, Tsunenori Nomaguchi, Kenichi Nishinaka, Ryuji Yoshida, Takashi Ikuta

المصدر: Microscopy and Microanalysis. 25:502-503

مصطلحات موضوعية: Optics, Materials science, business.industry, Electric field, Electrode, business, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d7cabc06586948bed974de4812743704
https://doi.org/10.1017/s1431927619003246

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14

Spherical Aberration Correction for SEMs with Electrostatic-type Compact Cs-corrector

المؤلفون: Tadahiro Kawasaki, Toshihide Agemura, Takeharu Kato, Shunichi Motomura, Ryuji Yoshida, Takashi Ikuta, Kenichi Nishinaka, Masahiro Tomita, Tsunenori Nomaguchi

المصدر: Microscopy and Microanalysis. 24:152-153

مصطلحات موضوعية: Physics, Spherical aberration, Optics, business.industry, Type (model theory), business, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::46b0189d6f9641b2436273470c0704d0
https://doi.org/10.1017/s1431927618001253

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15

Development of Objective Aperture Holder for Mounting Compact Cs Corrector on Conventional SEM

المؤلفون: Tadahiro Kawasaki, Ryuji Yoshida, Toshihide Agemura, Takeharu Kato, Tsunenori Nomaguchi, Kenichi Nishinaka, Shunichi Motomura

المصدر: Microscopy and Microanalysis. 24:646-647

مصطلحات موضوعية: 010302 applied physics, Optics, Materials science, Aperture, business.industry, 0103 physical sciences, Development (differential geometry), 02 engineering and technology, 021001 nanoscience & nanotechnology, 0210 nano-technology, business, 01 natural sciences, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8ee9afd803281fa85497822fbdeaae1d
https://doi.org/10.1017/s1431927618003720

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16

Development of a Fountain Detector for Spectroscopy of Secondary Electrons in SEM

المؤلفون: Toshihide Agemura, Takashi Sekiguchi, Hideo Iwai

المصدر: Microscopy and Microanalysis. 23:590-591

مصطلحات موضوعية: 010302 applied physics, Physics, Optics, business.industry, 0103 physical sciences, Detector, Atomic physics, Fountain, business, Spectroscopy, 01 natural sciences, Instrumentation, Secondary electrons

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b8859fa2611df0b9aacfda8d9bdf5917
https://doi.org/10.1017/s1431927617003634

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17

Development of Compact Cs/Cc Corrector with Annular and Circular Electrodes

المؤلفون: Ryuji Yoshida, Tsunenori Nomaguchi, Takashi Ikuta, Tadahiro Kawasaki, Toshihide Agemura, Masahiro Tomita, Tetsuji Kodama, Takeharu Kato

المصدر: Microscopy and Microanalysis. 23:466-467

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 0103 physical sciences, Electrode, Optoelectronics, Development (differential geometry), 02 engineering and technology, 021001 nanoscience & nanotechnology, 0210 nano-technology, business, 01 natural sciences, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2c1e98d5f57ecf9bfecd677a1ecd0813
https://doi.org/10.1017/s1431927617003014

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18

High Contrast SEM Observation of Semiconductor Dopant Profile using TripleBeam® System

المؤلفون: Ikuko Nakatani, Toshihide Agemura, Hiroaki Matsumoto, Shota Torikawa, Takahiro Sato, Masahiro Kiyohara, Yuka Aizawa, Takeshi Sunaoshi

المصدر: Microscopy and Microanalysis. 23:1508-1509

مصطلحات موضوعية: 0301 basic medicine, 03 medical and health sciences, High contrast, 030104 developmental biology, Semiconductor, Materials science, Dopant, business.industry, Analytical chemistry, Optoelectronics, business, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5f0d522c13f6e8bd785f44f2fdd1536e
https://doi.org/10.1017/s1431927617008200

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19

Development of a fountain detector for spectroscopy of secondary electrons in scanning electron microscopy

المؤلفون: Takashi Sekiguchi, Takashi Kimura, Toshihide Agemura

المصدر: Japanese Journal of Applied Physics. 57:046701

مصطلحات موضوعية: 010302 applied physics, Materials science, Physics and Astronomy (miscellaneous), business.industry, Scanning electron microscope, Detector, General Engineering, General Physics and Astronomy, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Secondary electrons, 0103 physical sciences, Optoelectronics, 0210 nano-technology, Spectroscopy, Fountain, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::13e55dfb43f691f56ec2bf01151291a3
https://doi.org/10.7567/jjap.57.046701

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20

Measurement technique for the incident electron current in secondary electron detectors and its application in scanning electron microscopes

المؤلفون: Toshihide Agemura, Hideo Todokoro, Satoru Fukuhara

المصدر: Scanning. 23:403-409

مصطلحات موضوعية: Physics, Physics::Instrumentation and Detectors, Scanning electron microscope, business.industry, Detector, Electron, Atomic and Molecular Physics, and Optics, Secondary electrons, Everhart-Thornley detector, Optics, Electron tomography, Scanning transmission electron microscopy, High Energy Physics::Experiment, business, Instrumentation, Environmental scanning electron microscope

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::34507f7436f9bad7b8bd4645f3f9ffe2
https://doi.org/10.1002/sca.4950230607

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