نتائج البحث - "Toshifumi Honda"

المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 768:89-95

مصطلحات موضوعية: Point spread function, Imagination, Physics, Nuclear and High Energy Physics, business.industry, Scanning electron microscope, Image quality, media_common.quotation_subject, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Function (mathematics), Optics, Cathode ray, Deconvolution, business, Instrumentation, Image restoration, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cc4c872f1490e1eddaebf5525fb1c016
https://doi.org/10.1016/j.nima.2014.09.041

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12

Model-based defect detection in multidimensional vector spaces

المؤلفون: Minoru Harada, Toshifumi Honda, Hajime Igarashi, Kenji Obara

المصدر: Electronics and Communications in Japan. 95:44-53

مصطلحات موضوعية: Mahalanobis distance, Standard test image, Pixel, Computer Networks and Communications, business.industry, Applied Mathematics, Subtraction, General Physics and Astronomy, Pattern recognition, Image processing, Signal Processing, Computer vision, Artificial intelligence, Electrical and Electronic Engineering, business, Eigenvalues and eigenvectors, Curse of dimensionality, Mathematics, Vector space

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e5d8ec099df66c7be0a835d7884d6170
https://doi.org/10.1002/ecj.11390

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13

A New Image Restoration Technique for SEM

المؤلفون: Kenji Nakahira, Atsushi Miyamoto, Toshifumi Honda

المصدر: IFAC Proceedings Volumes. 41:8185-8189

مصطلحات موضوعية: Point spread function, Blind deconvolution, Noise (signal processing), business.industry, Iterative method, Resolution (electron density), General Medicine, Computer Science::Computer Vision and Pattern Recognition, Computer vision, Deconvolution, Artificial intelligence, business, Image resolution, Image restoration, Mathematics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e6477582d5cb5cf811ed6b3d48beb5f6
https://doi.org/10.3182/20080706-5-kr-1001.01385

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14

Automated Visual Inspection for Solder Joints of PCB Based on 3-D Image Analysis

المؤلفون: Hisae Yamamura, Mineo Nomoto, Toshifumi Honda, Horii Tomoharu, Miyawaki Yoshio, Takanori Ninomiya

المصدر: Journal of Robotics and Mechatronics. 11:104-111

مصطلحات موضوعية: Automated optical inspection, Engineering drawing, General Computer Science, Computer science, business.industry, Image processing, Image (mathematics), Visual inspection, Automated X-ray inspection, Soldering, Computer vision, Artificial intelligence, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c9eed458a05ed449fb627e8c4961a168
https://doi.org/10.20965/jrm.1999.p0104

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15

Fuzzy selective voting classifier with defect extraction based on comparison within an image

المؤلفون: Yuji Takagi, Ryo Nakagaki, Toshifumi Honda, Obara Kenji

المصدر: MIPPR 2007: Pattern Recognition and Computer Vision.

مصطلحات موضوعية: Production line, Engineering, Brightness, Color image, business.industry, Production control, Computer vision, Image processing, Artificial intelligence, business, Visual control, Classifier (UML), Fuzzy logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9ac985c5a003c49010165c2991c647ea
https://doi.org/10.1117/12.750528

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16

Enhanced Scattered Light Imaging of Nanoparticles by Controlling the Polarization Distribution with Photonic Crystals

المؤلفون: Masahiro Watanabe, Toshifumi Honda, Yuta Urano, Yuko Otani

المصدر: Japanese Journal of Applied Physics. 52:052001

مصطلحات موضوعية: Microscope, Materials science, business.industry, General Engineering, General Physics and Astronomy, Polarization (waves), law.invention, Background noise, Optics, Optical microscope, law, Microscopy, Radial polarization, business, Image resolution, Photonic crystal

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b6ea0ce2badd8271841007accbfba33d
https://doi.org/10.7567/jjap.52.052001

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17

Automatic recognition of defect areas on a semiconductor wafer using multiple scanning electron microscope images

المؤلفون: Toshifumi Honda, Koji Nakamae, Ryo Nakagaki

المصدر: Measurement Science and Technology. 20:075503

مصطلحات موضوعية: Materials science, Fabrication, Scanning electron microscope, Semiconductor device fabrication, business.industry, Applied Mathematics, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Process (computing), Semiconductor device, Secondary electrons, Optics, Surface roughness, Wafer, business, Instrumentation, Engineering (miscellaneous)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb43707a9bcfc736c4f58629f2b09338
https://doi.org/10.1088/0957-0233/20/7/075503

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