المؤلفون: Gamage, Sampath, Manna, Sukriti, Zajac, Marc, Hancock, Steven, Wang, Qi, Singh, Sarabpreet, Ghafariasl, Mahdi, Yao, Kun, Tiwald, Tom, Park, Tae Joon, Landau, David P., Wen, Haidan, Sankaranarayanan, Subramanian, Darancet, Pierre, Ramanathan, Shriram, Abate, Yohannes

مصطلحات موضوعية: Physics - Applied Physics, Condensed Matter - Mesoscale and Nanoscale Physics, Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/2309.04486

المؤلفون: Shoham, Lishai, Baskin, Maria, Tiwald, Tom, Ankonina, Guy, Han, Myung-Geun, Zakharova, Anna, Caspi, Shaked, Joseph, Shay, Zhu, Yimei, Inoue, Isao H., Piamonteze, Cinthia, Rozenberg, Marcelo J., Kornblum, Lior

مصطلحات موضوعية: Condensed Matter - Strongly Correlated Electrons, Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/2302.04372

المؤلفون: Zare, Saman, Pouria, Ramin, Chow, Philippe K., Tiwald, Tom, Tripp, Carl P., Edalatpour, Sheila

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics, Physics - Applied Physics, Physics - Optics

URL الوصول: http://arxiv.org/abs/2302.01419

المؤلفون: Gamage, Sampath, Manna, Sukriti, Zajac, Marc, Hancock, Steven, Wang, Qi, Singh, Sarabpreet, Ghafariasl, Mahdi, Yao, Kun, Tiwald, Tom E., Park, Tae Joon, Landau, David P., Wen, Haidan, Sankaranarayanan, Subramanian K. R. S., Darancet, Pierre, Ramanathan, Shriram, Abate, Yohannes

المساهمون: Energy Frontier Research Centers, Gordon and Betty Moore Foundation, Division of Graduate Education, Air Force Office of Scientific Research, National Science Foundation

المصدر: ACS Nano ; volume 18, issue 3, page 2105-2116 ; ISSN 1936-0851 1936-086X

الاتاحة: http://dx.doi.org/10.1021/acsnano.3c09281
https://pubs.acs.org/doi/pdf/10.1021/acsnano.3c09281

المؤلفون: Hilfiker, James N., Hale, Jeffrey S., Herzinger, Craig M., Tiwald, Tom, Hong, Nina, Schoche, Stefan, Arwin, Hans

المصدر: Applied Surface Science. 421:494-499

مصطلحات موضوعية: Depolarization, Spectroscopic ellipsometry, Mueller matrix, Mueller matrix ellipsometry, Jones matrix quality factor, Index, Thickness nonuniformity, Anisotropy

وصف الملف: electronic

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-141108
https://liu.diva-portal.org/smash/get/diva2:1144796/FULLTEXT01.pdf

المؤلفون: Jin, Tiening, Lin, Hao-Yu Greg, Tiwald, Tom, Lin, Pao Tai

المصدر: Scientific Reports ; volume 9, issue 1 ; ISSN 2045-2322

الاتاحة: http://dx.doi.org/10.1038/s41598-019-39062-z
https://www.nature.com/articles/s41598-019-39062-z.pdf
https://www.nature.com/articles/s41598-019-39062-z

المؤلفون: Naqavi, Ali, Loke, Samuel P., Kelzenberg, Michael D., Callahan, Dennis M., Tiwald, Tom, Warmann, Emily C., Espinet-González, Pilar, Vaidya, Nina, Roy, Tatiana A., Huang, Jing-Shun, Vinogradova, Tatiana G., Atwater, Harry A.

المصدر: Optics Express, 26(14), 18545-18562, (2018-07-09)

Relation: https://arxiv.org/abs/1710.02911; https://doi.org/10.1364/oe.26.018545; eprintid:85131

الاتاحة: https://doi.org/10.1364/oe.26.018545

المؤلفون: Hilfiker, James N., Stadermann, Michael, Sun, Jianing, Tiwald, Tom, Hale, Jeffrey S., Miller, Philip E., Aracne-Ruddle, Chantel

المساهمون: U.S. Department of Energy, LDRD

المصدر: Applied Surface Science ; volume 421, page 508-512 ; ISSN 0169-4332

الاتاحة: http://dx.doi.org/10.1016/j.apsusc.2016.08.131
https://api.elsevier.com/content/article/PII:S0169433216317871?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0169433216317871?httpAccept=text/plain

المؤلفون: Pouria, Ramin, Chow, Philippe K., Tiwald, Tom, Zare, Saman, Edalatpour, Sheila

المساهمون: National Science Foundation

المصدر: Applied Physics Letters ; volume 121, issue 13 ; ISSN 0003-6951 1077-3118

الاتاحة: http://dx.doi.org/10.1063/5.0109819
https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0109819/16449828/131702_1_online.pdf

المؤلفون: Fali, Alireza, Gamage, Sampath, Howard, Marquez, Folland, Thomas. G., Mahadik, Nadeemullah A., Tiwald, Tom, Bolotin, Kirill, Caldwell, Joshua D., Abate, Yohannes

المساهمون: Air Force Office of Scientific Research, H2020 European Research Council, Division of Materials Research

المصدر: ACS Photonics ; volume 8, issue 1, page 175-181 ; ISSN 2330-4022 2330-4022

الاتاحة: http://dx.doi.org/10.1021/acsphotonics.0c00951
https://pubs.acs.org/doi/pdf/10.1021/acsphotonics.0c00951

المؤلفون: Hilfiker, James N., Tiwald, Tom

المصدر: Spectroscopic Ellipsometry for Photovoltaics ; Springer Series in Optical Sciences ; page 115-153 ; ISSN 0342-4111 1556-1534 ; ISBN 9783319753751 9783319753775

الاتاحة: http://dx.doi.org/10.1007/978-3-319-75377-5_5
http://link.springer.com/content/pdf/10.1007/978-3-319-75377-5_5

المؤلفون: Zhang, Cheng, Hong, Nina, Ji, Chengang, Zhu, Wenqi, Chen, Xi, Agrawal, Amit, Zhang, Zhong, Tiwald, Tom E., Schoeche, Stefan, Hilfiker, James N., Guo, L. Jay, Lezec, Henri J.

المساهمون: University of Maryland, U.S. Department of Commerce, National Science Foundation

المصدر: ACS Photonics ; volume 5, issue 6, page 2234-2242 ; ISSN 2330-4022 2330-4022

الاتاحة: http://dx.doi.org/10.1021/acsphotonics.8b00086
https://pubs.acs.org/doi/pdf/10.1021/acsphotonics.8b00086

المؤلفون: Fali, Alireza, Gamage, Sampath, Howard, Marquez, Folland, Thomas. G., Mahadik, Nadeemullah A., Tiwald, Tom, Bolotin, Kirill, Caldwell, Joshua D., Abate, Yohannes

المصدر: ACS Photonics; 1/20/2021, Vol. 8 Issue 1, p175-181, 7p

المؤلفون: Bolduc, Martin, Poirier, Michel, Chauve, Gregory, Oulachgar, Hassane, Tiwald, Tom, Laperle, Pierre, Gay, David, Beaupre, Patrick, Methot, Myriam, Leclerc, Melanie, Deshaies, Sebastien, Briand, Martin, Bouchard, Jean, Galarneau, Pierre

المصدر: MRS Advances ; volume 1, issue 10, page 651-657 ; ISSN 2059-8521

الاتاحة: http://dx.doi.org/10.1557/adv.2015.45
http://link.springer.com/content/pdf/10.1557/adv.2015.45.pdf
http://link.springer.com/article/10.1557/adv.2015.45/fulltext.html
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S2059852115000456

المؤلفون: Pao Tai Lin, Singh, Vivek, Lin, Hao-Yu Greg, Tiwald, Tom, Kimerling, Lionel C., Tan, Dawn T. H., Agarwal, Anuradha Murthy

المصدر: 2014 IEEE Avionics, Fiber-Optics and Photonics Technology Conference (AVFOP) ; page 75-76

الاتاحة: http://dx.doi.org/10.1109/avfop.2014.6999431
http://xplorestaging.ieee.org/ielx7/6985759/6999419/06999431.pdf?arnumber=6999431

المؤلفون: Saenger, Mario Fernando., Schädel, Martin, Hofmann, Tino, Hilfiker, James, Sun, Jianing, Tiwald, Tom E., Schubert, Mathias, Woollam, John A.

المصدر: Materials Research Society Symposium Proceedings

الاتاحة: http://dx.doi.org/10.1557/proc-1123-p02-02

المؤلفون: Korlacki, Rafal, Schöche, Stefan, Hofmann, Tino, Tiwald, Tom E, Schubert, Mathias

المصدر: Faculty Publications from the Department of Electrical and Computer Engineering

مصطلحات موضوعية: rutile, phonon modes, Condensed Matter Physics, Electrical and Computer Engineering

وصف الملف: application/pdf

Relation: https://digitalcommons.unl.edu/electricalengineeringfacpub/668; https://digitalcommons.unl.edu/context/electricalengineeringfacpub/article/1662/viewcontent/JApplPhys_113_164102.pdf

الاتاحة: https://digitalcommons.unl.edu/electricalengineeringfacpub/668
https://digitalcommons.unl.edu/context/electricalengineeringfacpub/article/1662/viewcontent/JApplPhys_113_164102.pdf

المؤلفون: Lin, Pao Tai, Singh, Vivek, Lin, Hao‐Yu Greg, Tiwald, Tom, Kimerling, Lionel C., Agarwal, Anuradha Murthy

المصدر: Advanced Optical Materials ; volume 1, issue 10, page 732-739 ; ISSN 2195-1071 2195-1071

الاتاحة: http://dx.doi.org/10.1002/adom.201300205
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fadom.201300205
https://onlinelibrary.wiley.com/doi/pdf/10.1002/adom.201300205

المؤلفون: Boosalis, Alexander, Hofmann, Tino, Darakchieva, Vanya, Yakimova, Rositza, Tiwald, Tom, Schubert, Mathias

المصدر: MRS Proceedings ; volume 1407 ; ISSN 0272-9172 1946-4274

الاتاحة: http://dx.doi.org/10.1557/opl.2012.457
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1946427412004575

المؤلفون: Guo, Yanen, Dobrowolski, J. A., Li, Li, Poitras, Daniel, Tiwald, Tom

وصف الملف: text

Relation: Applied Optics, Volume: 50, Issue: 9, Publication date: 2011-02-18, Pages: C396–C402

الاتاحة: https://doi.org/10.1364/AO.50.00C396
https://nrc-publications.canada.ca/eng/view/accepted/?id=1f519471-321a-4491-b967-2ddc157e341d
https://nrc-publications.canada.ca/eng/view/object/?id=1f519471-321a-4491-b967-2ddc157e341d
https://nrc-publications.canada.ca/fra/voir/objet/?id=1f519471-321a-4491-b967-2ddc157e341d