المؤلفون: Tzu-Hsien Lin, Yen Chun Liu, Tien-Yu Hsieh, Feng-Ying Hsiao, Yi-Chen Lai, Chin-Shun Chang

المصدر: Journal of Dental Sciences, Vol 7, Iss 1, Pp 65-71 (2012)

مصطلحات موضوعية: dentist, female, musculoskeletal disorder, Nordic questionnaire, oral surgeon, Dentistry, RK1-715

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S1991790212000104; https://doaj.org/toc/1991-7902

URL الوصول: https://doaj.org/article/4bf443fb20ab4a82a1378f48d2e8dd32

المؤلفون: Tzu-Hsien Lin, Tien-Yu Hsieh, Alice M. Horowitz, Ker-Kong Chen, Shiu-Shiung Lin, Yi-Jen Lai, Feng-Ying Hsiao, Chin-Shun Chang

المصدر: Journal of Dental Sciences, Vol 5, Iss 4, Pp 229-236 (2010)

مصطلحات موضوعية: knowledge of dental caries prevention, Taiwanese dentists, sealant fluoride, Dentistry, RK1-715

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S1991790210000127; https://doaj.org/toc/1991-7902

URL الوصول: https://doaj.org/article/14909d4afd0d43b79395bb53369f140e

المؤلفون: Ching-Ming Su, Yi-Hsin Yang, Tien-Yu Hsieh

المصدر: Journal of Dental Sciences, Vol 4, Iss 1, Pp 32-39 (2009)

مصطلحات موضوعية: maximum bite force, oral status, preschool children, Dentistry, RK1-715

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S1991790209600064; https://doaj.org/toc/1991-7902

URL الوصول: https://doaj.org/article/375f8dad50ad4645acbc5091f6d7bb77

المؤلفون: Ming-Yen Tsai, Tien-Yu Hsieh, Cheng-Hsu Chou, Jung-Fang Chang, Ting-Chang Chang, Po-Yung Liao, Bo-Wei Chen, Ann-Kuo Chu

المصدر: Thin Solid Films. 603:359-362

مصطلحات موضوعية: 010302 applied physics, Indium gallium zinc oxide, Electron mobility, Materials science, business.industry, Metals and Alloys, 02 engineering and technology, Surfaces and Interfaces, 021001 nanoscience & nanotechnology, 01 natural sciences, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Stress (mechanics), Gate oxide, Thin-film transistor, Electric field, 0103 physical sciences, Electrode, Materials Chemistry, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::47a1822fae5d37b1c2b67c86b645051e
https://doi.org/10.1016/j.tsf.2016.01.035

المؤلفون: Hua-Mao Chen, Tien-Yu Hsieh, Yu-Xin Yang, Ching-En Chen, Ting-Chang Chang, Po-Yung Liao, Kuo-Kuang Chen, Ming-Yen Tsai, Tsung-Hsiang Shih, Ann-Kuo Chu, Bo-Wei Chen, Hsueh-Hsing Lu

المصدر: SID Symposium Digest of Technical Papers. 46:1147-1150

مصطلحات موضوعية: Stress (mechanics), Materials science, Thin-film transistor, business.industry, Electrical engineering, Degradation (geology), Optoelectronics, Negative bias, Dual gate, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ef09db164855fcf4630809bbdb75dd45
https://doi.org/10.1002/sdtp.10033

المؤلفون: Kuan-Hsien Liu, Ting-Chang Chang, Wu-Ching Chou, Hua-Mao Chen, Ming-Yen Tsai, Ming-Siou Wu, Yi-Syuan Hung, Pei-Hua Hung, Tien-Yu Hsieh, Ya-Hsiang Tai, Ann-Kuo Chu, Bo-Liang Yeh

المصدر: Journal of Applied Physics; 2014, Vol. 116 Issue 15, p1-7, 7p

مصطلحات موضوعية: THIN film transistors, THERMAL instability, ELECTRIC potential, INDIUM gallium zinc oxide, ELECTRIC currents

المؤلفون: Shao Hui Wu, Jia, XY, Mei Kui, Chi Chang Shuai, Tien Yu Hsieh, Hung Chan Lin, Derek Chen, Chen Bin Lin, Wu, J Y, Yew, T R, Endo, Yuta, Kato, Kiyoshi, Yamazaki, Shunpei

المصدر: 2016 IEEE Symposium on VLSI Technology ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/vlsit.2016.7573378
http://xplorestaging.ieee.org/ielx7/7569798/7573353/07573378.pdf?arnumber=7573378

المؤلفون: Ting-Chang Chang, Yi-Chun Wu, Tzu-Chieh Lai, Alan Lien, Kun-Yao Lin, Shih-Feng Huang, Tien-Yu Hsieh, Ming-Yen Tsai, Cheng-Lung Chiang, Ann-Kuo Chu, Chang-Cheng Lo, Po-Lin Chen

المصدر: Thin Solid Films. 572:79-84

مصطلحات موضوعية: Materials science, Passivation, business.industry, Transconductance, Transistor, Gate dielectric, Metals and Alloys, Surfaces and Interfaces, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, law, Thin-film transistor, Gate oxide, Materials Chemistry, Optoelectronics, Electric current, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f0bfa524c949c307b0ba685cd4c99916
https://doi.org/10.1016/j.tsf.2014.09.050

المؤلفون: Jyun Yu Tsai, Cheng Tung Huang, Osbert Cheng, Kuan-Ju Liu, Szu-Han Ho, Ren-Ya Yang, Ching-En Chen, Tien-Yu Hsieh, Ting-Chang Chang

المصدر: Thin Solid Films. 572:39-43

مصطلحات موضوعية: Materials science, business.industry, Metals and Alloys, Surfaces and Interfaces, Band offset, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Stress (mechanics), Impact ionization, Materials Chemistry, Degradation (geology), Optoelectronics, Field-effect transistor, business, p–n junction, Hot carrier degradation, Floating body effect

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::26c8d36fae6c52838ca3ef18609903ee
https://doi.org/10.1016/j.tsf.2014.08.031

المؤلفون: Wu-Wei Tsai, Jing-Yi Yan, Yu-Ju Hung, Ming-Yen Tsai, Wen-Jen Chiang, Po-Yung Liao, Tien-Yu Hsieh, Ting-Chang Chang, Bo-Wei Chen

المصدر: Thin Solid Films. 572:33-38

مصطلحات موضوعية: Materials science, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Oxygen, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Stress (mechanics), Adsorption, chemistry, Thin-film transistor, Chemical physics, Desorption, Materials Chemistry, Oxygen ions, Degradation (geology), Hot carrier effect

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a0b8e3f746bbd0f3e4744b3be6b13345
https://doi.org/10.1016/j.tsf.2014.09.051

المؤلفون: Hui-Chun Huang, Ming-Yen Tsai, Ann-Kuo Chu, Po-Yung Liao, Tien-Yu Hsieh, Kuo-Kuang Chen, Hua-Mao Chen, Ting-Chang Chang, Dershin Gan, Yu-Xin Yang, Hsueh-Hsing Lu, Ching-En Chen, Tsung-Hsiang Shih, Bo-Wei Chen

المصدر: SID Symposium Digest of Technical Papers. 46:772-774

مصطلحات موضوعية: Materials science, Passivation, business.industry, Middle layer, Oxide, Gate insulator, Active layer, Process conditions, chemistry.chemical_compound, chemistry, Thin-film transistor, Electronic engineering, Optoelectronics, business, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f5b4fee77d694bffb8fa292a4f2d698a
https://doi.org/10.1002/sdtp.10216

المؤلفون: Ming-Yen Tsai, Te-Chih Chen, Ting-Chang Chang, Tien-Yu Hsieh

المصدر: ECS Journal of Solid State Science and Technology. 3:Q3058-Q3070

مصطلحات موضوعية: Reliability (semiconductor), Materials science, Thin-film transistor, Engineering physics, Electronic, Optical and Magnetic Materials, Amorphous solid

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ed17578be7c9fe257f4204b32d7d831f
https://doi.org/10.1149/2.013409jss

المؤلفون: Chia-Sheng Lin, Yu-Te Chen, Jing-Yi Yan, Tien-Yu Hsieh, Wu-Wei Tsai, Ming-Yen Tsai, Ting-Chang Chang, Te-Chih Chen, Fu-Yen Jian, Wen-Jen Chiang

المصدر: Surface and Coatings Technology. 231:478-481

مصطلحات موضوعية: Materials science, Passivation, business.industry, Electrical engineering, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Capacitance, Instability, Surfaces, Coatings and Films, Active layer, Threshold voltage, Stress (mechanics), Thin-film transistor, Materials Chemistry, Density of states, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5e5ad47ad58314328a0b5b691ba824e8
https://doi.org/10.1016/j.surfcoat.2012.10.030

المؤلفون: Te-Chih Chen, Chih-Tsung Tsai, Ting-Chang Chang, Shih-Ching Chen, Chia-Sheng Lin, Tien-Yu Hsieh, Ming-Yen Tsai, Fu-Yen Jian

المصدر: Surface and Coatings Technology. 231:465-470

مصطلحات موضوعية: Materials science, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Oxygen, Instability, Surfaces, Coatings and Films, Threshold voltage, Stress (mechanics), Adsorption, chemistry, Chemical physics, Thin-film transistor, Desorption, Materials Chemistry, Molecule

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a1af7c4774ddce0989420432967fd733
https://doi.org/10.1016/j.surfcoat.2011.12.048

المؤلفون: Jung-Fang Chang, Ting-Chang Chang, Ming-Yen Tsai, Wang-Cheng Chung, Yu-Te Chen, Ann-Kuo Chu, Bo-Wei Chen, Te-Chih Chen, Cheng-Hsu Chou, Po-Yung Liao, Yu Chun Chen, Tien-Yu Hsieh

المصدر: IEEE Transactions on Electron Devices. 60:1681-1688

مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical contacts, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), law, Thin-film transistor, Electric field, Electrode, Optoelectronics, Electrical and Electronic Engineering, business, Electronic band structure, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5d6ba6d272dfd8d45c8960441088b6d1
https://doi.org/10.1109/ted.2013.2253611

المؤلفون: Yu-Te Chen, Ting-Chang Chang, Ming-Yen Tsai, Te-Chih Chen, Tien-Yu Hsieh

المصدر: Thin Solid Films. 528:53-56

مصطلحات موضوعية: Materials science, business.industry, Metals and Alloys, Charge (physics), Surfaces and Interfaces, Trapping, Bias stress, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Thin-film transistor, Materials Chemistry, Degradation (geology), Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::01b29ffeeb056d185f5bd853cf9219c4
https://doi.org/10.1016/j.tsf.2012.09.093

المؤلفون: Ann-Kuo Chu, Wen-Jen Chiang, Wu-Wei Tsai, Ming-Yen Tsai, Yu-Te Chen, Jing-Yi Yan, Tien-Yu Hsieh, Ting-Chang Chang, Te-Chih Chen

المصدر: Thin Solid Films. 528:57-60

مصطلحات موضوعية: Work (thermodynamics), Materials science, Field (physics), business.industry, Metals and Alloys, Oxide, Surfaces and Interfaces, Capacitance, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Stress (mechanics), Trap (computing), chemistry.chemical_compound, chemistry, Thin-film transistor, Materials Chemistry, Degradation (geology), Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7cb609a660dcf2c4a841c407330a83ca
https://doi.org/10.1016/j.tsf.2012.10.095

المؤلفون: Chia-Yu Chen, Yu-Te Chen, Ming-Yen Tsai, Hung-Che Ting, Yi-Chen Chung, Te-Chih Chen, Ting-Chang Chang, Tien-Yu Hsieh, Ann-Kuo Chu

المصدر: IEEE Transactions on Electron Devices. 59:3389-3395

مصطلحات موضوعية: Materials science, business.industry, Transistor, Wide-bandgap semiconductor, Electronic, Optical and Magnetic Materials, Threshold voltage, Active layer, law.invention, Stress (mechanics), Thermal conductivity, Thin-film transistor, law, Optoelectronics, Degradation (geology), Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7678fda9775ef6d45e6b3074c15a4537
https://doi.org/10.1109/ted.2012.2219313

المؤلفون: Ming-Yen Tsai, Te-Chih Chen, Tien-Yu Hsieh, Ting-Chang Chang, Yu-Te Che, Ann-Kuo Chu

المصدر: ECS Transactions. 45:119-131

مصطلحات موضوعية: Materials science, Thin-film transistor, business.industry, Forensic engineering, Degradation (geology), Optoelectronics, Hot carrier stress, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8fb8efd34aa8b77aa947dd282ba2228a
https://doi.org/10.1149/1.3701532

المؤلفون: Tien-Yu Hsieh, Te-Chih Chen, Ming-Yen Tsai, Yu-Te Chen, Yi-Chen Chung, Ting-Chang Chang, Chia-Yu Chen, Hung-Che Ting

المصدر: ECS Journal of Solid State Science and Technology. 1:Q6-Q10

مصطلحات موضوعية: Stress (mechanics), Materials science, Terminal (electronics), business.industry, Thin-film transistor, Distortion, Electrical engineering, Optoelectronics, business, Bias stress, Electronic, Optical and Magnetic Materials, Degradation (telecommunications), Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cf10e109c18cf04aed344b09313ba736
https://doi.org/10.1149/2.018201jss