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المؤلفون: Marcin Zielinski, Filippo Giannazzo, Domenico Corso, Patrick Fiorenza, Francesco La Via, Monia Spera, Raffaella Lo Nigro, Salvatore Di Franco, Giuseppe Greco, Fabrizio Roccaforte
المصدر: Materials science forum 963 (2019): 485–489. doi:10.4028/www.scientific.net/MSF.963.485
info:cnr-pdr/source/autori:Spera M.; Greco G.; Lo Nigro R.; Di Franco S.; Corso D.; Fiorenza P.; Giannazzo F.; Zielinski M.; La Via F.; Roccaforte F./titolo:Fabrication and characterization of ohmic contacts to 3C-SiC layers grown on silicon/doi:10.4028%2Fwww.scientific.net%2FMSF.963.485/rivista:Materials science forum/anno:2019/pagina_da:485/pagina_a:489/intervallo_pagine:485–489/volume:963مصطلحات موضوعية: 010302 applied physics, Fabrication, Materials science, Silicon, business.industry, Mechanical Engineering, ohmic contacts, ni2si, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Characterization (materials science), chemistry, Mechanics of Materials, Ti/Al/Ni, 0103 physical sciences, Optoelectronics, General Materials Science, 0210 nano-technology, business, Ohmic contact, 3c-sic
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المؤلفون: Fabrizio Roccaforte, Simone Rascuna, Silvia Scalese, Raffaella Lo Nigro, Marilena Vivona, Salvatore Di Franco, Giuseppe Greco, Mario Saggio, Corrado Bongiorno
المصدر: Materials science forum 924 (2018): 377–380. doi:10.4028/www.scientific.net/MSF.924.377
info:cnr-pdr/source/autori:Vivona M.; Greco G.; Bongiorno C.; Di Franco S.; Lo Nigro R.; Scalese S.; Rascuna S.; Saggio M.; Roccaforte F./titolo:Study of Ti%2FAl%2FNi ohmic contacts to P-type implanted 4H-SiC/doi:10.4028%2Fwww.scientific.net%2FMSF.924.377/rivista:Materials science forum/anno:2018/pagina_da:377/pagina_a:380/intervallo_pagine:377–380/volume:924مصطلحات موضوعية: 010302 applied physics, Materials science, Mechanical Engineering, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, p-type 4H-SiC, 01 natural sciences, Mechanics of Materials, Ti/Al/Ni, 0103 physical sciences, General Materials Science, Composite material, 0210 nano-technology, Ohmic contact, Ohmic contacts
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المؤلفون: Marilena Vivona, R. Lo Nigro, Corrado Bongiorno, Silvia Scalese, Giuseppe Greco, Fabrizio Roccaforte
المصدر: Applied surface science 420 (2017): 331–335. doi:10.1016/j.apsusc.2017.05.065
info:cnr-pdr/source/autori:Vivona, M.; Greco, G.; Bongiorno, C.; Lo Nigro, R.; Scalese, S.; Roccaforte, F./titolo:Electrical and structural properties of surfaces and interfaces in Ti%2FAl%2FNi Ohmic contacts to p-type implanted 4H-SiC/doi:10.1016%2Fj.apsusc.2017.05.065/rivista:Applied surface science/anno:2017/pagina_da:331/pagina_a:335/intervallo_pagine:331–335/volume:420مصطلحات موضوعية: Materials science, Annealing (metallurgy), General Physics and Astronomy, 02 engineering and technology, Thermionic field emission, P-type 4H-SiC, 01 natural sciences, Metal, chemistry.chemical_compound, Ti/Al/Ni, 0103 physical sciences, Silicon carbide, Composite material, Ohmic contact, Ohmic contacts, 010302 applied physics, Metallurgy, Contact resistance, Surfaces and Interfaces, General Chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Surfaces, Coatings and Films, chemistry, visual_art, visual_art.visual_art_medium, 0210 nano-technology
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المؤلفون: R. Lo Nigro, Filippo Giannazzo, Fabrizio Roccaforte, Monia Spera, F. La Via, Corrado Bongiorno, Giuseppe Greco, Marcin Zielinski
المصدر: Materials Science in Semiconductor Processing
Materials science in semiconductor processing 93 (2019): 295–298. doi:10.1016/j.mssp.2019.01.015
info:cnr-pdr/source/autori:Spera, M. 1,2,3; Greco, G. 1; Lo Nigro, R. 1; Bongiorno, C. 1; Giannazzo, F. 1; Zielinski, M. 4; La Via, F. 1; Roccaforte, F. 1/titolo:Ohmic contacts on n-type and p-type cubic silicon carbide (3C-SiC) grown on silicon/doi:10.1016%2Fj.mssp.2019.01.015/rivista:Materials science in semiconductor processing/anno:2019/pagina_da:295/pagina_a:298/intervallo_pagine:295–298/volume:93مصطلحات موضوعية: Materials science, Silicon, Annealing (metallurgy), Analytical chemistry, FOS: Physical sciences, chemistry.chemical_element, Applied Physics (physics.app-ph), 02 engineering and technology, Thermionic field emission, 01 natural sciences, Nickel silicide, Ti/Al/Ni, 0103 physical sciences, General Materials Science, Ohmic contact, 3C-SiC, Ohmic contacts, 010302 applied physics, Mechanical Engineering, Cubic silicon carbide, Doping, Contact resistance, Physics - Applied Physics, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Ni2Si, chemistry, Mechanics of Materials, 0210 nano-technology