المؤلفون: Andreas Gottscholl, Hannes Kraus, Thomas Aichinger, Corey J. Cochrane

المصدر: Scientific Reports, Vol 14, Iss 1, Pp 1-11 (2024)

مصطلحات موضوعية: Medicine, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2045-2322

URL الوصول: https://doaj.org/article/3f159354e7914374b88606d3f077ae0f

المؤلفون: Maximilian W. Feil, Andreas Huerner, Katja Puschkarsky, Christian Schleich, Thomas Aichinger, Wolfgang Gustin, Hans Reisinger, Tibor Grasser

المصدر: Crystals, Vol 10, Iss 12, p 1143 (2020)

مصطلحات موضوعية: hysteresis, device parameters, reproducibility, device characteristics, silicon carbide, threshold voltage, Crystallography, QD901-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2073-4352/10/12/1143; https://doaj.org/toc/2073-4352

URL الوصول: https://doaj.org/article/bbd5655d89664d53bf82cabcad661c74

المؤلفون: Thomas Aichinger, Maximilian Wolfgang Feil, Paul Salmen

المصدر: Key Engineering Materials. 947:69-75

مصطلحات موضوعية: Mechanics of Materials, Mechanical Engineering, General Materials Science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::745d24a79a42e3171169287bb75286d0
https://doi.org/10.4028/p-l30l6n

المؤلفون: Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Paul Salmen, Gerald Rescher, Wolfgang Gustin, Tibor Grasser

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dc2e7effeb63e0564acf63299000578e
https://doi.org/10.1109/irps48203.2023.10117740

المؤلفون: Maximilian W. Feil, Hans Reisinger, André Kabakow, Thomas Aichinger, Christian Schleich, Aleksandr Vasilev, Dominic Waldhör, Michael Waltl, Wolfgang Gustin, Tibor Grasser

المصدر: Communications Engineering. 2

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e8147d01d0225ba0b2dc9c5a01383741
https://doi.org/10.1038/s44172-023-00053-8

المؤلفون: Thomas Aichinger, Gregor Pobegen

المصدر: Wide Bandgap Semiconductors for Power Electronics. :225-247

مصطلحات موضوعية: Materials science, business.industry, Interface (computing), Optoelectronics, Dielectric, business, Active point, Power (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::89dd47d3966d5be2a04abc38e0bf24f7
https://doi.org/10.1002/9783527824724.ch9

المؤلفون: Maximilian W. Feil, Hans Reisinger, Andre Kabakow, Thomas Aichinger, Wolfgang Gustin, Tibor Grasser

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7c8701b2f2fabb88c28e9eaa601dbe0a
https://doi.org/10.1109/irps48227.2022.9764584

المؤلفون: Sudip K. Mazumder, Lars F. Voss, Karen Dowling, Adam Conway, David Hall, Robert J. Kaplar, Greg Pickrell, Jack Flicker, Andrew Binder, Srabanti Chowdhury, Victor Veliadis, Fang Luo, Sameh Khalil, Thomas Aichinger, Sandeep Bahl, Matteo Meneghini, Alain Charles

المصدر: IEEE Journal of Emerging and Selected Topics in Power Electronics. :1-1

مصطلحات موضوعية: Energy Engineering and Power Technology, Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9394cbc132a87eb786fcf565178bd7cb
https://doi.org/10.1109/jestpe.2023.3277828

المؤلفون: Gerald Rescher, Tibor Grasser, Gregor Pobegen, Judith Berens, Thomas Aichinger

المصدر: IEEE Transactions on Electron Devices. 66:4692-4697

مصطلحات موضوعية: Materials science, Passivation, Annealing (metallurgy), business.industry, Oxide, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Gate oxide, Logic gate, MOSFET, Silicon carbide, Optoelectronics, Electrical and Electronic Engineering, business, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1e5bbf1ca00f1e6d50176b25e7415a5a
https://doi.org/10.1109/ted.2019.2941723

المؤلفون: Jonathon Cottom, Manesh V. Mistry, Alexander L. Shluger, Thomas Aichinger, Gernot Gruber, Gregor Pobegen

المصدر: Materials Science Forum. 963:199-203

مصطلحات موضوعية: 010302 applied physics, Materials science, Mechanics of Materials, Chemical physics, Mechanical Engineering, 0103 physical sciences, Ab initio, General Materials Science, 02 engineering and technology, 021001 nanoscience & nanotechnology, 0210 nano-technology, Condensed Matter Physics, 01 natural sciences

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4ee513a714c07fa9d8d3310a247bb2bc
https://doi.org/10.4028/www.scientific.net/msf.963.199

المؤلفون: Gregor Pobegen, Al-Moatasem El-Sayed, Manesh V. Mistry, Alexander L. Shluger, Thomas Aichinger, K. Patel, Jonathon Cottom

المصدر: Materials Science Forum. 963:194-198

مصطلحات موضوعية: Steric effects, Materials science, 010304 chemical physics, Mechanics of Materials, Computational chemistry, Mechanical Engineering, 0103 physical sciences, General Materials Science, 02 engineering and technology, 021001 nanoscience & nanotechnology, 0210 nano-technology, Condensed Matter Physics, 01 natural sciences

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2f6765e8e96e5bc738befbbe065c7188
https://doi.org/10.4028/www.scientific.net/msf.963.194

المؤلفون: Gerald Rescher, Thomas Aichinger, Gregor Pobegen, Judith Berens, Tibor Grasser

المصدر: Materials Science Forum. 963:175-179

مصطلحات موضوعية: Materials science, Trench mosfet, Mechanics of Materials, Post oxidation, business.industry, Mechanical Engineering, Trench, Optoelectronics, General Materials Science, Condensed Matter Physics, business, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::99bad6babd9290d4d403039623dcf393
https://doi.org/10.4028/www.scientific.net/msf.963.175

المؤلفون: Gerald Rescher, Katja Waschneck, Hans Reisinger, Thomas Aichinger, Maximilian W. Feil, P. Salmen

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Test procedures, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Stability (probability), Stress (mechanics), chemistry.chemical_compound, Reliability (semiconductor), chemistry, Stress test, 0103 physical sciences, MOSFET, Silicon carbide, 0210 nano-technology, Simulation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7126ada1b4702033392bceecb19da26b
https://doi.org/10.1109/irps46558.2021.9405207

المؤلفون: Judith Berens, Thomas Aichinger

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 020208 electrical & electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, Threshold voltage, Reliability (semiconductor), Gate oxide, Logic gate, 0103 physical sciences, MOSFET, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Electrical measurements, Power MOSFET, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f987887256c130327f5edf2c0e517f55
https://doi.org/10.1109/irps46558.2021.9405152

المؤلفون: J. Berens, Tibor Grasser, Gerald Rescher, Christian Schleich, M. Weger, Gregor Pobegen, Thomas Aichinger

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Materials science, 020208 electrical & electronic engineering, 02 engineering and technology, 01 natural sciences, Engineering physics, chemistry.chemical_compound, Reliability (semiconductor), chemistry, Temperature instability, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Silicon carbide, Power MOSFET, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7c0f900f1c5facb4ae3d047cb8a98d2c
https://doi.org/10.1109/irps45951.2020.9129259

المؤلفون: Hans Reisinger, Thomas Aichinger, S. Maas, Gerald Rescher

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, High voltage, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Threshold voltage, Impact ionization, chemistry.chemical_compound, chemistry, Gate oxide, Electric field, 0103 physical sciences, Trench, Silicon carbide, Optoelectronics, 0210 nano-technology, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1e9303d6395c9ca1e4b62511fc726395
https://doi.org/10.1109/irps45951.2020.9129232

المؤلفون: M. Schmidt, Thomas Aichinger

المصدر: IRPS

مصطلحات موضوعية: Materials science, Silicon, Dielectric strength, chemistry.chemical_element, Failure rate, Engineering physics, chemistry.chemical_compound, Reliability (semiconductor), stomatognathic system, chemistry, Gate oxide, Silicon carbide, Power MOSFET, Weibull distribution

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d21a8e5a3e4670caed3bd4333cc8813
https://doi.org/10.1109/irps45951.2020.9128223

المؤلفون: Fabian Rasinger, Heiko B. Weber, Michael Krieger, Gregor Pobegen, Thomas Aichinger

المصدر: Materials Science Forum. 924:277-280

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Mechanical Engineering, Electron trapping, Charge (physics), 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, chemistry.chemical_compound, chemistry, Mechanics of Materials, 0103 physical sciences, Silicon carbide, Optoelectronics, General Materials Science, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c7679cc0bc5ba01ca821b5fccabd9ded
https://doi.org/10.4028/www.scientific.net/msf.924.277

المؤلفون: Gregor Pobegen, Thomas Aichinger, Gerald Rescher, Tibor Grasser

المصدر: Materials Science Forum. 924:671-675

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Mechanical Engineering, 020208 electrical & electronic engineering, 02 engineering and technology, Condensed Matter Physics, 01 natural sciences, Mechanics of Materials, 0103 physical sciences, MOSFET, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, General Materials Science, business, Delay time

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8f5f7e67857c37133448ef32914a6409
https://doi.org/10.4028/www.scientific.net/msf.924.671

المؤلفون: Katja Puschkarsky, Hans Reisinger, Tibor Grasser, Thomas Aichinger, Wolfgang Gustin

المصدر: IEEE Transactions on Device and Materials Reliability. 18:144-153

مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, 020208 electrical & electronic engineering, 02 engineering and technology, Function (mathematics), 01 natural sciences, Electronic, Optical and Magnetic Materials, Threshold voltage, Stress (mechanics), Hysteresis, Gate oxide, Negative charge, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Power MOSFET, Safety, Risk, Reliability and Quality

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::53088af4901dabc67be5bf6788e91aad
https://doi.org/10.1109/tdmr.2018.2813063