المؤلفون: Radhakrishna, Kavinesh S., Lee, Y.S., You, K.Y., Thiruvarasu, K.M., Ng, S.T.

مصطلحات موضوعية: TK Electrical engineering. Electronics Nuclear engineering, TK7885-7895 Computer engineer. Computer hardware

وصف الملف: application/pdf

Relation: http://eprints.utm.my/105613/1/KYYou2023_StudyofObstaclesEffectonMobileNetwork.pdf; Radhakrishna, Kavinesh S. and Lee, Y.S. and You, K.Y. and Thiruvarasu, K.M. and Ng, S.T. (2023) Study of obstacles effect on mobile network and WLAN signal strength. International Journal of Electronics and Telecommunications, 69 (1). pp. 155-161. ISSN 2081-8491

الاتاحة: http://eprints.utm.my/105613/
http://eprints.utm.my/105613/1/KYYou2023_StudyofObstaclesEffectonMobileNetwork.pdf
https://doi.org/10.24425/ijet.2023.144345