المساهمون: Padmore, Howard

المصدر: Applied Physics Letters; 83; 1; Other Information: Journal Publication Date: 2003; PBD: 1 Jul 2003

وصف الملف: Medium: X; Size: vp.

URL الوصول: http://www.osti.gov/scitech/biblio/815420

المؤلفون: Zeng, Zhuohui, Yu, Hongyu, Chen, Xian

مصطلحات موضوعية: Buckling dynamics, Differential interference microscope, Stretchable electronics, Thin film buckling

Relation: https://repository.hkust.edu.hk/ir/Record/1783.1-111249; Extreme Mechanics Letters, v. 48, October 2021, article number 101397; https://doi.org/10.1016/j.eml.2021.101397; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=&rft.issue=&rft.date=2021&rft.spage=&rft.aulast=Zeng&rft.aufirst=Zhuohui&rft.atitle=In+situ+characterization+of+buckling+dynamics+in+silicon+microribbon+on+an+elastomer+substrate&rft.title=Extreme+Mechanics+Letters; http://www.scopus.com/record/display.url?eid=2-s2.0-85108321625&origin=inward; http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000686902600009

الاتاحة: https://repository.hkust.edu.hk/ir/Record/1783.1-111249
https://doi.org/10.1016/j.eml.2021.101397
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=&rft.issue=&rft.date=2021&rft.spage=&rft.aulast=Zeng&rft.aufirst=Zhuohui&rft.atitle=In+situ+characterization+of+buckling+dynamics+in+silicon+microribbon+on+an+elastomer+substrate&rft.title=Extreme+Mechanics+Letters
http://www.scopus.com/record/display.url?eid=2-s2.0-85108321625&origin=inward
http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000686902600009

المؤلفون: Li L.A., Ren X.N., Sun J., Jia H.K., Wang S.

المصدر: EPJ Web of Conferences, Vol 6, p 26007 (2010)

مصطلحات موضوعية: thin film buckling, electrical foil, temperature, symmetric loading device, nano-scale, Physics, QC1-999

Relation: http://dx.doi.org/10.1051/epjconf/20100626007; https://doaj.org/toc/2100-014X; https://doaj.org/article/34a12ec615d040d2a01ccc92a28a36d8

الاتاحة: https://doi.org/10.1051/epjconf/20100626007
https://doaj.org/article/34a12ec615d040d2a01ccc92a28a36d8

المؤلفون: Takei, Atsushi, Jin, Lihua, Hutchinson, John Woodside, Fujita, Hiroyuki

مصطلحات موضوعية: Thin film buckling, wrinkling, ridge localization, substrate pre-stretch, ridge networks

وصف الملف: application/pdf

Relation: http://www.seas.harvard.edu/hutchinson/papers/RidgeLocalizationsAdvMatT.pdf; Advanced Materials; Quick submit: 2015-02-02T10:13:31-05:00; Takei, Atsushi, Lihua Jin, John W. Hutchinson, and Hiroyuki Fujita. 2014. “Ridge Localizations and Networks in Thin Films Compressed by the Incremental Release of a Large Equi-Biaxial Pre-Stretch in the Substrate.” Advanced Materials 26 (24) (March 31): 4061–4067. doi:10.1002/adma.201306162.; http://nrs.harvard.edu/urn-3:HUL.InstRepos:14023478

الاتاحة: http://nrs.harvard.edu/urn-3:HUL.InstRepos:14023478
https://doi.org/10.1002/adma.201306162

المؤلفون: Davidovitch, B., Schroll, R. D., Vella, D., Adda-Bedia, M., Cerda, E. A.

المساهمون: University of Massachusetts, Amherst MA, United States, Universite Paris 7- Denis Diderot, Paris, France, University of Oxford, Oxford, United Kingdom, Universidad de Santiago de Chile, Santiago, Chile

مصطلحات موضوعية: Pattern formation, Thin-film buckling

Relation: Davidovitch B, Schroll RD, Vella D, Adda-Bedia M, Cerda EA (2011) Prototypical model for tensional wrinkling in thin sheets. Proceedings of the National Academy of Sciences 108: 18227–18232. Available: http://dx.doi.org/10.1073/pnas.1108553108.; Proceedings of the National Academy of Sciences; PMC3215074; http://hdl.handle.net/10754/599411

الاتاحة: http://hdl.handle.net/10754/599411
https://doi.org/10.1073/pnas.1108553108

المؤلفون: Shixue Wang, Haikun Jia, Linan Li, Jinsheng Sun, Xiang-Kui Ren

المصدر: EPJ Web of Conferences, Vol 6, p 26007 (2010)

مصطلحات موضوعية: nano-scale, Materials science, Physics, QC1-999, Delamination, chemistry.chemical_element, temperature, Substrate (electronics), Atmospheric temperature range, thin film buckling, chemistry, Buckling, symmetric loading device, Thermoelectric effect, electrical foil, Thermal stability, Thin film, Composite material, Titanium

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e433545dd5993101c1e0591235cf094c
https://doaj.org/article/34a12ec615d040d2a01ccc92a28a36d8

المؤلفون: Zhao, Ming Hao, Zhou, Jian, Yang, Feng, Liu, Tong, Zhang, Tongyi

مصطلحات موضوعية: Thin film buckling, Circular delamination, Residual stress, Energy release rate, Phase angle

Relation: https://repository.hkust.edu.hk/ir/Record/1783.1-18974; Engineering Fracture Mechanics, v. 74, (15), October 2007, p. 2334-2351; https://doi.org/10.1016/j.engfracmech.2006.11.007; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=0013-7944&rft.volume=74&rft.issue=15&rft.date=2007&rft.spage=2334&rft.epage=2351&rft.aulast=Zhao&rft.aufirst=MingHao&rft.atitle=Effects+of+substrate+compliance+on+circular+buckle+delamination+of+thin+films; http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000247823000004; http://www.scopus.com/record/display.url?eid=2-s2.0-34249701930&origin=inward

الاتاحة: https://repository.hkust.edu.hk/ir/Record/1783.1-18974
https://doi.org/10.1016/j.engfracmech.2006.11.007
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=0013-7944&rft.volume=74&rft.issue=15&rft.date=2007&rft.spage=2334&rft.epage=2351&rft.aulast=Zhao&rft.aufirst=MingHao&rft.atitle=Effects+of+substrate+compliance+on+circular+buckle+delamination+of+thin+films
http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000247823000004
http://www.scopus.com/record/display.url?eid=2-s2.0-34249701930&origin=inward

المؤلفون: Zhao, Ming-Hao, Yang, Feng, Zhang, Tongyii

مصطلحات موضوعية: Thin film buckling, Indentation test, Residual stress, Interface toughness, Phase angle

Relation: https://repository.hkust.edu.hk/ir/Record/1783.1-18585; Mechanics of Materials, v. 39, (9), September 2007, p. 881-892; https://doi.org/10.1016/j.mechmat.2007.03.003; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=0167-6636&rft.volume=39&rft.issue=9&rft.date=2007&rft.spage=881&rft.epage=892&rft.aulast=Zhao&rft.aufirst=Ming-Hao&rft.atitle=Delamination+buckling+in+the+microwedge+indentation+of+a+thin+film+on+an+elastically+deformable+substrate; http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000247878600005; http://www.scopus.com/record/display.url?eid=2-s2.0-34249297000&origin=inward

الاتاحة: https://repository.hkust.edu.hk/ir/Record/1783.1-18585
https://doi.org/10.1016/j.mechmat.2007.03.003
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=0167-6636&rft.volume=39&rft.issue=9&rft.date=2007&rft.spage=881&rft.epage=892&rft.aulast=Zhao&rft.aufirst=Ming-Hao&rft.atitle=Delamination+buckling+in+the+microwedge+indentation+of+a+thin+film+on+an+elastically+deformable+substrate
http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000247878600005
http://www.scopus.com/record/display.url?eid=2-s2.0-34249297000&origin=inward

المؤلفون: HONG ZHOU, SEN-JIANG YU, YONG-JU ZHANG, MIAO-GEN CHEN

المصدر: Surface Review and Letters. 20(03):1350029-1

مصطلحات موضوعية: Thin film, buckling, sputtering, external disturbance, elastic properties

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od_______645::5567b109bdd4ae5bd40f2dcce6e08afa
http://www.worldscinet.com/cgi-bin/details.cgi?type=pdf&id=pii:S0218625X13500297

المؤلفون: Zhao, MingHao, Zhou, Jian, Yang, Feng, Liu, Tong, Zhang, Tong-Yi

مصطلحات الفهرس: Thin film buckling, Circular delamination, Residual stress, Energy release rate, Phase angle, Article

URL: http://repository.ust.hk/ir/Record/1783.1-18974
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=0013-7944&rft.volume=74&rft.issue=15&rft.date=2007&rft.spage=2334&rft.epage=2351&rft.aulast=Zhao&rft.aufirst=MingHao&rft.atitle=Effects+of+substrate+compliance+on+circular+buckle+delamination+of+thin+films
http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000247823000004
http://www.scopus.com/record/display.url?eid=2-s2.0-34249701930&origin=inward