المؤلفون: A. Kanniainen, Chris Drijbooms, Thijs Boehme, Hugo Bender, N. Bosman, P. van der Heide, Thomas Hantschel, Steven Folkersma, Kristof Paredis, Umberto Celano, Lennaert Wouters, Wilfried Vandervorst

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Materials science, Nanoelectronics, business.industry, Atomic force microscopy, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::65a9e0c7606b3f6841a8e46c66cfa0f3
https://doi.org/10.1109/iedm19573.2019.8993661