المؤلفون: Mukhtar, Maseeh, Thiel, Brad

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 698-699 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927618003987
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618003987

المؤلفون: Mukhtar, Maseeh, Thiel, Brad

المصدر: Microscopy and Microanalysis ; volume 23, issue S1, page 1494-1495 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927617008133
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927617008133

المؤلفون: Thiel, Brad, Mukhtar, Maseeh, Quoi, Kathy, Bunday, Benjamin D., Malloy, Matt

المصدر: Microscopy and Microanalysis ; volume 22, issue S3, page 586-587 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927616003780
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927616003780

المؤلفون: Mukhtar, Maseeh, Quoi, Kathy, Bunday, Benjamin D, Malloy, Matt, Thiel, Brad

المصدر: Microscopy and Microanalysis ; volume 22, issue S3, page 620-621 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927616003950
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927616003950

المؤلفون: Lena Eberle, Anna, Schalek, Richard, Lichtman, Jeff W., Malloy, Matt, Thiel, Brad, Zeidler, Dirk

المصدر: Microscopy Today ; volume 23, issue 2, page 12-19 ; ISSN 1551-9295 2150-3583

الاتاحة: https://doi.org/10.1017/s1551929515000012
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1551929515000012

المؤلفون: Roe, James, Weiland, Mary, Thiel, Brad

المصدر: History News, 1998 Apr 01. 53(2), 6-11.

URL الوصول: https://www.jstor.org/stable/42653651

المؤلفون: Malloy, Matt, Thiel, Brad, Bunday, Benjamin D., Wurm, Stefan, Mukhtar, Maseeh, Quoi, Kathy, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski, Tomasz, Dellemann, Gregor, Peters, Jan Hendrik

المساهمون: Resnick, Douglas J., Bencher, Christopher

المصدر: Alternative Lithographic Technologies VII ; SPIE Proceedings ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2175535

المؤلفون: Bunday, Benjamin D., Mukhtar, Maseeh, Quoi, Kathy, Thiel, Brad, Malloy, Matt

المساهمون: Cain, Jason P., Sanchez, Martha I.

المصدر: SPIE Proceedings ; Metrology, Inspection, and Process Control for Microlithography XXIX ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2175573

المؤلفون: Kemen, Thomas, Malloy, Matt, Thiel, Brad, Mikula, Shawn, Denk, Winfried, Dellemann, Gregor, Zeidler, Dirk

المساهمون: Cain, Jason P., Sanchez, Martha I.

المصدر: SPIE Proceedings ; Metrology, Inspection, and Process Control for Microlithography XXIX ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2188560

المؤلفون: Malloy, Matt, Thiel, Brad, Bunday, Benjamin D., Wurm, Stefan, Jindal, Vibhu, Mukhtar, Maseeh, Quoi, Kathy, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski, Tomasz, Dellemann, Gregor, Peters, Jan Hendrik

المساهمون: Behringer, Uwe F.W., Finders, Jo

المصدر: SPIE Proceedings ; 31st European Mask and Lithography Conference ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2196120

المؤلفون: Mukhtar, Maseeh, Bunday, Benjamin D., Quoi, Kathy, Malloy, Matt, Thiel, Brad

المصدر: Journal of Micro/Nanolithography, MEMS, and MOEMS ; volume 15, issue 3, page 034004 ; ISSN 1932-5150

الاتاحة: http://dx.doi.org/10.1117/1.jmm.15.3.034004
http://nanolithography.spiedigitallibrary.org/article.aspx?articleid=2546623

المؤلفون: Thiel, Brad, Lercel, Michael, Bunday, Benjamin, Malloy, Matt

المساهمون: Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K.

المصدر: SPIE Proceedings ; Scanning Microscopies 2014 ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2069302

المؤلفون: Settens, Charles, Bunday, Benjamin, Thiel, Brad, Kline, R. Joseph, Sunday, Daniel, Wang, Chengqing, Wu, Wen-li, Matyi, Richard

المساهمون: Starikov, Alexander, Cain, Jason P.

المصدر: SPIE Proceedings ; Metrology, Inspection, and Process Control for Microlithography XXVII ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2012019

المؤلفون: Brainard, Robert, Hassanein, Elsayed, Li, Juntao, Pathak, Piyush, Thiel, Brad, Cerrina, Franco, Moore, Richard, Rodriguez, Miguel, Yakshinskiy, Boris, Loginova, Elena, Madey, Theodore, Matyi, Richard, Malloy, Matt, Rudack, Andrew, Naulleau, Patrick, Wüest, Andrea, Dean, Kim

المساهمون: Henderson, Clifford L.

المصدر: Advances in Resist Materials and Processing Technology XXV ; SPIE Proceedings ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.773869

المؤلفون: Toth, Milos, Thiel, Brad L., Knowles, William R.

المساهمون: Geer, Robert E., Meyendorf, Norbert, Baaklini, George Y., Michel, Bernd

المصدر: SPIE Proceedings ; Testing, Reliability, and Application of Micro- and Nano-Material Systems III ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.603070

المؤلفون: Thiel, Brad L., Guess, Keith B., Viney, Christopher

المصدر: Biopolymers ; volume 41, issue 7, page 703-719 ; ISSN 0006-3525 1097-0282

الاتاحة: http://dx.doi.org/10.1002/(sici)1097-0282(199706)41:7%3C703::aid-bip1%3E3.0.co%3B2-t
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F(SICI)1097-0282(199706)41:7%3C703::AID-BIP1%3E3.0.CO%3B2-T
https://onlinelibrary.wiley.com/doi/full/10.1002/(SICI)1097-0282(199706)41:7%3C703::AID-BIP1%3E3.0.CO%3B2-T

المؤلفون: Dunaway, Dwayne L., Thiel, Brad L., Viney, Christopher

المصدر: Journal of Applied Polymer Science ; volume 58, issue 3, page 675-683 ; ISSN 0021-8995 1097-4628

الاتاحة: http://dx.doi.org/10.1002/app.1995.070580322
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fapp.1995.070580322
https://onlinelibrary.wiley.com/doi/pdf/10.1002/app.1995.070580322

المؤلفون: Thiel, Brad L., Viney, Christopher

المصدر: MRS Bulletin ; volume 20, issue 9, page 52-56 ; ISSN 0883-7694 1938-1425

الاتاحة: http://dx.doi.org/10.1557/s0883769400034941
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S0883769400034941

المؤلفون: Malloy, Matt, Bunday, Benjamin, Wurm, Stefan, Thiel, Brad, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski, Tomasz, Dellemann, Gregor, Peters, Jan Hendrik

المصدر: 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC); 2015, p266-271, 6p

المؤلفون: Thiel, Brad L., Kunkel, Dennis D., Viney, Christopher

المصدر: Biopolymers ; volume 34, issue 8, page 1089-1097 ; ISSN 0006-3525 1097-0282

الاتاحة: http://dx.doi.org/10.1002/bip.360340812
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fbip.360340812
https://onlinelibrary.wiley.com/doi/pdf/10.1002/bip.360340812