المؤلفون: Serra Di Santa Maria, F., Zota, C. B., Cha, E., Balestra, Francis, Theodorou, C., Ghibaudo, G.

المساهمون: Chaire CHORUS - Fondation Grenoble-INP, Fondation Grenoble INP, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA)

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS)
IEEE International Reliability Physics Symposium (IRPS)
https://cnrs.hal.science/hal-04246081
IEEE International Reliability Physics Symposium (IRPS), Mar 2023, Monterey, United States. ⟨10.1109/IRPS48203.2023.10118294⟩

مصطلحات موضوعية: [SPI]Engineering Sciences [physics]

جغرافية الموضوع: Monterey, United States

الاتاحة: https://cnrs.hal.science/hal-04246081
https://cnrs.hal.science/hal-04246081v1/document
https://cnrs.hal.science/hal-04246081v1/file/SERRA%20IRPS%2023.pdf
https://doi.org/10.1109/IRPS48203.2023.10118294

المؤلفون: Kom Kammeugne, R., Theodorou, C., Leroux, C., Vauche, L., Mescot, X., Gwoziecki, R., Becu, S., Charles, M., Bano, E., Ghibaudo, G.

المصدر: Solid-State Electronics ; volume 200, page 108555 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2022.108555
https://api.elsevier.com/content/article/PII:S0038110122003276?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0038110122003276?httpAccept=text/plain

المؤلفون: Boutayeb, A., Golanski, D., Guyader, F., Joblot, S., Baron, F., Chantraine, P., Escarabajal, Y., Gourhant, O., Inard, A., Jenny, C., Duval, J., Delmedico, S., Theodorou, C., Ponthenier, F., Lacord, J.

المصدر: 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) ; page 9-12

الاتاحة: http://dx.doi.org/10.1109/esserc62670.2024.10719520
http://xplorestaging.ieee.org/ielx8/10719398/10719399/10719520.pdf?arnumber=10719520

المؤلفون: Bosch, D., Viey, A., Frutuoso, T. Mota, Lheritier, P., Licitra, C., Zerhouni, N., Albouy, A., Brunet, L., Magalhaes-Lucas, A., da Silva, L. M. B., Boutry, H., Fahmy Taha Abdelrahman, M. Husien, Cristiano, F., Gassilloud, R., Ribotta, M., Romano, G., Vandendaele, W., Benevent, V., Opprecht, M., Kerdilès, S., Milesi, F., Mazen, F., Sklenard, B., Euvrard-Colnat, C., Sturm, J., Lambert, A., Candebage, C., Laraignou, L., Boulard, F., Sarrazin, A., De Souza, M., Theodorou, C., Garros, X., Batude, P.

المصدر: 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/vlsitechnologyandcir46783.2024.10631398
http://xplorestaging.ieee.org/ielx8/10631290/10631310/10631398.pdf?arnumber=10631398

المؤلفون: Ghibaudo, Gérard, Cassé, M., Maria, F. Serra Di Santa, Theodorou, C., Balestra, Francis

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

المصدر: ISSN: 0038-1101 ; Solid-State Electronics ; https://cnrs.hal.science/hal-03852787 ; Solid-State Electronics, 2022, ⟨10.1016/j.sse.2022.108265⟩.

مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

الاتاحة: https://cnrs.hal.science/hal-03852787
https://cnrs.hal.science/hal-03852787v1/document
https://cnrs.hal.science/hal-03852787v1/file/Ghibaudo-SHE-SSE-2022%20final.pdf
https://doi.org/10.1016/j.sse.2022.108265

المؤلفون: Kim, Donghyun, Theodorou, C., Chanuel, A., Gobil, Y., Charles, M., Morvan, E., Woo Lee, Jae, Mouis, M., Ghibaudo, G.

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA), Korea University Seoul, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), European Project: 783274,H2020,H2020-ECSEL-2017-2-RIA-two-stage,5G_GaN2(2018), European Project: 871764,SEQUENCE

المصدر: ISSN: 0038-1101 ; Solid-State Electronics ; https://hal.science/hal-03769945 ; Solid-State Electronics, 2022, 197, pp.108448. ⟨10.1016/j.sse.2022.108448⟩ ; https://www.sciencedirect.com/science/article/pii/S0038110122002192.

مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

Relation: info:eu-repo/grantAgreement//783274/EU/Advanced RF Transceivers for 5G base stations based on GaN Technology/5G_GaN2; info:eu-repo/grantAgreement//871764/EU/Cryogenic 3D Nanoelectronics -Des approches non conventionnelles pour développer l’électronique cryogénique - DOI 10.3030/871764/SEQUENCE

الاتاحة: https://hal.science/hal-03769945
https://hal.science/hal-03769945v1/document
https://hal.science/hal-03769945v1/file/Kim-SSE2022-Accepted-AuthorVersion.pdf
https://doi.org/10.1016/j.sse.2022.108448

المؤلفون: Serra di Santa Maria, F., Contamin, L., Cassé, M., Theodorou, C., Balestra, F., Ghibaudo, G.

المساهمون: H2020

المصدر: Solid-State Electronics ; volume 192, page 108271 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2022.108271
https://api.elsevier.com/content/article/PII:S0038110122000430?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0038110122000430?httpAccept=text/plain

المؤلفون: Di Santa Maria, F. Serra, Contamin, L., Cassé, M., Theodorou, C., Balestra, Francis, Ghibaudo, G.

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

المصدر: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)
https://cnrs.hal.science/hal-03852877
2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Sep 2021, Caen, France. ⟨10.1109/EuroSOI-ULIS53016.2021.9560694⟩

مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Caen, France

الاتاحة: https://cnrs.hal.science/hal-03852877
https://cnrs.hal.science/hal-03852877v1/document
https://cnrs.hal.science/hal-03852877v1/file/F-Serra-SSE-ULIS%202021%20.pdf
https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560694

المؤلفون: Serra di Santa Maria, F., Contamin, L., Cardoso Paz, B., Cassé, M., Theodorou, C., Balestra, F., Ghibaudo, G.

المساهمون: European Commission

المصدر: Solid-State Electronics ; volume 186, page 108175 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2021.108175
https://api.elsevier.com/content/article/PII:S0038110121002185?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0038110121002185?httpAccept=text/plain

المؤلفون: Ghibaudo, G., Aouad, M., Casse, M., Poiroux, T., Theodorou, C.

المصدر: Solid-State Electronics ; volume 176, page 107949 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2020.107949
https://api.elsevier.com/content/article/PII:S0038110120304160?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0038110120304160?httpAccept=text/plain

المؤلفون: Sideris, P., Brunet, L., Ciampolini, L., Sicard, G., Batude, P., Theodorou, C.

المساهمون: Université Grenoble Alpes

المصدر: Solid-State Electronics ; volume 168, page 107715 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2019.107715
https://api.elsevier.com/content/article/PII:S003811011930718X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S003811011930718X?httpAccept=text/plain

المؤلفون: Naoum, V., Naoum, P., Tsiantou, V., Karampli, E., Spiliopoulos, P., Ntoumas, K., Zavras, D., Delakas, D.S., Theodorou, C., Athanasakis, K., Kyriopoulos, J.

المصدر: Value in Health ; volume 22, page S499-S500 ; ISSN 1098-3015

الاتاحة: http://dx.doi.org/10.1016/j.jval.2019.09.522
https://api.elsevier.com/content/article/PII:S1098301519329006?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1098301519329006?httpAccept=text/plain

المؤلفون: Boutayeb, A., Theodorou, C., Golanski, D., Batude, P., Brunet, L., Bosch, D., Guyader, F., Joblot, S., Ponthenier, F., Lacord, J.

المساهمون: STMicroelectronics

المصدر: Solid-State Electronics ; volume 209, page 108736 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2023.108736
https://api.elsevier.com/content/article/PII:S0038110123001491?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0038110123001491?httpAccept=text/plain

المؤلفون: Karatsori, T., Theodorou, C., Lavieville, R., Chiarella, T., Mitard, J., Horiguchi, N., Dimitriadis, C., Ghibaudo, G.

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ), Aristotle University of Thessaloniki, IMEC (IMEC), Catholic University of Leuven = Katholieke Universiteit Leuven (KU Leuven), European Project: 654384,H2020,H2020-INFRAIA-2014-2015,ASCENT(2015)

المصدر: 2017 ICMTS Proceedings
2017 International Conference of Microelectronic Test Structures (ICMTS)
https://hal.science/hal-02002304
2017 International Conference of Microelectronic Test Structures (ICMTS), Mar 2017, Grenoble, France. pp.41-45, ⟨10.1109/ICMTS.2017.7954263⟩

مصطلحات موضوعية: modeling, FinFET, variability, Mismatch, drain current, characterization, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.TRON]Engineering Sciences [physics]/Electronics

جغرافية الموضوع: Grenoble, France

Relation: info:eu-repo/grantAgreement//654384/EU/Access to European Nanoelectronics Network/ASCENT

الاتاحة: https://hal.science/hal-02002304
https://doi.org/10.1109/ICMTS.2017.7954263

المؤلفون: Tsiantou, V., Karampli, E., Magoulas, C., Maina, A., Naoum, V., Delakas, D.S., Ntoumas, K., Athanasakis, K., Theodorou, C., Kyriopoulos, J.

المصدر: Value in Health ; volume 21, page S64 ; ISSN 1098-3015

الاتاحة: http://dx.doi.org/10.1016/j.jval.2018.09.376
https://api.elsevier.com/content/article/PII:S1098301518336763?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1098301518336763?httpAccept=text/plain

المؤلفون: Karatsori, T., Theodorou, C., Haendler, S., Dimitriadis, C., Ghibaudo, G.

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ), Aristotle University of Thessaloniki, STMicroelectronics Crolles (ST-CROLLES), European Project: 325633,EC:FP7:SP1-JTI,ENIAC-2012-2,PLACES2BE(2012), European Project: 662175,H2020,ECSEL-2014-2,WAYTOGO FAST(2015)

المصدر: 2016 EUROSOI-ULIS Proceedings
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
https://hal.science/hal-02002291
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.92-95, ⟨10.1109/ULIS.2016.7440060⟩

مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.TRON]Engineering Sciences [physics]/Electronics

جغرافية الموضوع: Vienna, Austria

Relation: info:eu-repo/grantAgreement/EC/FP7/325633/EU/Pilot Lines for Advanced CMOS EmbodimentS in 2x nodes, Built in Europe/PLACES2BE; info:eu-repo/grantAgreement//662175/EU/Which Architecture Yields Two Other Generations Of Fully depleted Advanced Substrate and Technologies/WAYTOGO FAST

الاتاحة: https://hal.science/hal-02002291
https://doi.org/10.1109/ULIS.2016.7440060

المؤلفون: Lavieville, R., Karatsori, T., Theodorou, C., Barraud, S., Dimitriadis, C., Ghibaudo, G.

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ), Aristotle University of Thessaloniki, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), European Project: 662175,H2020,ECSEL-2014-2,WAYTOGO FAST(2015)

المصدر: 2016 ESSDERC Proceedings
2016 ESSDERC - 46th European Solid-State Device Research Conference
https://hal.science/hal-02002267
2016 ESSDERC - 46th European Solid-State Device Research Conference, Sep 2016, Lausanne, Switzerland. pp.142-145, ⟨10.1109/ESSDERC.2016.7599607⟩

مصطلحات موضوعية: Modelling, Trigate nanowire, Mismatch, Drain Current, Characterization, Variability, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.TRON]Engineering Sciences [physics]/Electronics

جغرافية الموضوع: Lausanne, Switzerland

Relation: info:eu-repo/grantAgreement//662175/EU/Which Architecture Yields Two Other Generations Of Fully depleted Advanced Substrate and Technologies/WAYTOGO FAST

الاتاحة: https://hal.science/hal-02002267
https://doi.org/10.1109/ESSDERC.2016.7599607

المؤلفون: Ioannidis, E., Theodorou, C., Haendler, S., Joo, M.-K., Josse, E., Dimitriadis, C., Ghibaudo, G.

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics Crolles (ST-CROLLES), School of Electrical Engineering Korea University, Korea University Seoul, Aristotle University of Thessaloniki, NANO2017, European Project: 325633,EC:FP7:SP1-JTI,ENIAC-2012-2,PLACES2BE(2012)

المصدر: 2015 EUROSOI-ULIS Proceedings
2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
https://hal.science/hal-02002261
2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.181-184, ⟨10.1109/ULIS.2015.7063803⟩

مصطلحات موضوعية: Low-frequency Noise, characterization, CMOS, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.TRON]Engineering Sciences [physics]/Electronics

جغرافية الموضوع: Bologna, Italy

Relation: info:eu-repo/grantAgreement/EC/FP7/325633/EU/Pilot Lines for Advanced CMOS EmbodimentS in 2x nodes, Built in Europe/PLACES2BE

الاتاحة: https://hal.science/hal-02002261
https://doi.org/10.1109/ULIS.2015.7063803

المؤلفون: Karatsori, T., Theodorou, C., Ioannidis, E., Haendler, S., Josse, E., Dimitriadis, C., Ghibaudo, G.

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS), Aristotle University of Thessaloniki, STMicroelectronics Crolles (ST-CROLLES), ARISTEIA II(Project 4154 of the GreekGeneral Secretariat for Research and Technology, co-funded by theEuropean Social Fund and national funds), European Project: 325633,EC:FP7:SP1-JTI,ENIAC-2012-2,PLACES2BE(2012)

المصدر: 2015 DRC Proceedings
2015 73rd Annual Device Research Conference (DRC)
https://hal.science/hal-02001968
2015 73rd Annual Device Research Conference (DRC), Jun 2015, Columbus, United States. pp.115-116, ⟨10.1109/DRC.2015.7175582⟩

مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.TRON]Engineering Sciences [physics]/Electronics

جغرافية الموضوع: Columbus, United States

Relation: info:eu-repo/grantAgreement/EC/FP7/325633/EU/Pilot Lines for Advanced CMOS EmbodimentS in 2x nodes, Built in Europe/PLACES2BE

الاتاحة: https://hal.science/hal-02001968
https://doi.org/10.1109/DRC.2015.7175582

المؤلفون: Mavropoulis, A., Vasileiadis, N., Theodorou, C., Sygellou, L., Normand, P., Ch. Sirakoulis, G., Dimitrakis, P.

المساهمون: GSRT, Hellenic Foundation for Research and Innovation

المصدر: Solid-State Electronics ; volume 194, page 108375 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2022.108375
https://api.elsevier.com/content/article/PII:S0038110122001472?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0038110122001472?httpAccept=text/plain