المؤلفون: Huster, Stefan, Ströbele, Jonas, Ruf, Jürgen, Kropf, Thomas, Rosenstiel, Wolfgang

المساهمون: Eberhard Karls Universität Tübingen = University of Tübingen, Nina Yevtushenko, Ana Rosa Cavalli, Hüsnü Yenigün, TC 6, WG 6.1

المصدر: Lecture Notes in Computer Science ; 29th IFIP International Conference on Testing Software and Systems (ICTSS) ; https://inria.hal.science/hal-01678963 ; 29th IFIP International Conference on Testing Software and Systems (ICTSS), Oct 2017, St. Petersburg, Russia. pp.54-70, ⟨10.1007/978-3-319-67549-7_4⟩

مصطلحات موضوعية: Software verification, Robustness testing, Test vector generation, [INFO]Computer Science [cs], [INFO.INFO-NI]Computer Science [cs]/Networking and Internet Architecture [cs.NI]

جغرافية الموضوع: St. Petersburg, Russia

Relation: hal-01678963; https://inria.hal.science/hal-01678963; https://inria.hal.science/hal-01678963/document; https://inria.hal.science/hal-01678963/file/449632_1_En_4_Chapter.pdf

الاتاحة: https://inria.hal.science/hal-01678963
https://inria.hal.science/hal-01678963/document
https://inria.hal.science/hal-01678963/file/449632_1_En_4_Chapter.pdf
https://doi.org/10.1007/978-3-319-67549-7_4

المؤلفون: Hyeonsik Son, Dae Sin Kim, Changwook Jeong, Ko Jeong-Hoon, In Huh, Jung Yun Choi, Jae-hoon Jeong, Kiwon Kwon, Seung-ju Kim, Joonwan Chai, Youn-sik Park, Choi Hyojin

المصدر: DAC

مصطلحات موضوعية: Test vector generation, Computer engineering, Artificial neural network, Linear programming, Computer science, Reinforcement learning, Transfer of learning, Gradient method, Dram, Euclidean vector

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b872a835b1c2a4a855fa765d205f556a
https://doi.org/10.1109/dac18074.2021.9586282

المؤلفون: Ahmad Patooghy, Hakem Beitollahi, Seyed Mohammad Sebt

المصدر: Journal of Electronic Testing. 35:839-852

مصطلحات موضوعية: Digital electronics, Test vector generation, Exploit, business.industry, Computer science, Trojan, Hardware Trojan, Benchmark (computing), State (computer science), Electrical and Electronic Engineering, business, Computer hardware

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0fd23a0fe0d14761129d52d916f33519
https://doi.org/10.1007/s10836-019-05848-2

المؤلفون: Kaihua Deng, Kun Yin, Zhijian Dai, Wanyu Yang, Jiacheng Hui

المصدر: 2021 IEEE 4th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC).

مصطلحات موضوعية: Digital electronics, Test vector generation, Test vector, business.industry, Computer science, Electronic engineering, Digital integrated circuits, Enhanced Data Rates for GSM Evolution, Transceiver, business, Field-programmable gate array, Automation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::19891d38018f748e55fc2b2b003c9188
https://doi.org/10.1109/imcec51613.2021.9481998

المؤلفون: Yann Oddos, Katell Morin-allory, Dominique Borrione, Marc Boulé, Zeljko Zilic

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.iml.ece.mcgill.ca/people/professors/zilic/documents/p75-oddos.pdf.

مصطلحات موضوعية: Test generation, B.5.2 [Design Aids, Verification General Terms Verification Keywords Test vector generation, semi-formal verification, PSL, generator

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.511.5260; http://www.iml.ece.mcgill.ca/people/professors/zilic/documents/p75-oddos.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.511.5260
http://www.iml.ece.mcgill.ca/people/professors/zilic/documents/p75-oddos.pdf

المؤلفون: Amit Prakash Singh, Namita Arya

مصطلحات موضوعية: Combinational logic, Test vector generation, Computer science, Test set, electrical_electronic_engineering, Probability mass function, Hardware_PERFORMANCEANDRELIABILITY, Algorithm, Fault detection and isolation

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::01519fbccd5d3704c72e85e0748b57bc
https://doi.org/10.20944/preprints201810.0199.v1

المؤلفون: D. Michael MILLER, Masao MUKAIDONO, Yasunori NAGATA

المصدر: The Journal of Reliability Engineering Association of Japan. 2005, 27(6):435

المؤلفون: Kenta TERASHIMA, Kohei MIYASE, Seiji KAJIHARA, Sudhakar M. REDDY, Xiaoqing WEN

المصدر: IEICE Transactions on Information and Systems. 2008, E91.D(3):683

المؤلفون: Veskoukis, Damianos

المصدر: Theses

مصطلحات موضوعية: MC/DC, PODEM, test vector generation

وصف الملف: application/pdf

Relation: https://opensiuc.lib.siu.edu/theses/2377; https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=3391&context=theses

الاتاحة: https://opensiuc.lib.siu.edu/theses/2377
https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=3391&context=theses

المؤلفون: Ming Yin, Yanyi Xu, Kui Xu

المصدر: Advanced Materials Research. 771:163-166

مصطلحات موضوعية: Digital electronics, Engineering, Test vector generation, business.industry, General Engineering, Information technology, Fault (power engineering), law.invention, Set (abstract data type), Printed circuit board, law, Embedded system, Radar, business, Electronic materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::72e8d5bf78ab721e618f7d025b0ce09e
https://doi.org/10.4028/www.scientific.net/amr.771.163

المؤلفون: K Sarvani, B Viswanathan

المصدر: International Journal of Engineering & Technology. 7:354

مصطلحات موضوعية: Environmental Engineering, Test vector generation, Hardware and Architecture, Computer science, General Chemical Engineering, General Engineering, Computer Science (miscellaneous), Bridging fault, Hardware_PERFORMANCEANDRELIABILITY, Boolean satisfiability problem, Algorithm, Biotechnology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b4446618a96f1cf89481804b08021862
https://doi.org/10.14419/ijet.v7i3.12.16105

المؤلفون: Zhong Liang Pan, Ling Chen

المصدر: Applied Mechanics and Materials. :647-652

مصطلحات موضوعية: Digital electronics, Engineering, Test vector generation, business.industry, Hardware_PERFORMANCEANDRELIABILITY, General Medicine, Test method, Fault detection and isolation, Crosstalk, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Signal integrity, business, Hardware_LOGICDESIGN, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f7be7815b22b6832d6e5e7dac02ff210
https://doi.org/10.4028/www.scientific.net/amm.20-23.647

المؤلفون: Manel Tekaya, Nedra Ebdelli, Mohamed Taha Bennani, Samir Ben Ahmed

المساهمون: Université de Carthage - University of Carthage, Université de Tunis El Manar (UTM), Université de la Manouba [Tunisie] (UMA), Elvira Albert, Ivan Lanese, TC 6, WG 6.1

المصدر: Formal Techniques for Distributed Objects, Components, and Systems ISBN: 9783319395692
FORTE
Lecture Notes in Computer Science
36th International Conference on Formal Techniques for Distributed Objects, Components, and Systems (FORTE)
36th International Conference on Formal Techniques for Distributed Objects, Components, and Systems (FORTE), Jun 2016, Heraklion, Greece. pp.267-274, ⟨10.1007/978-3-319-39570-8_18⟩

مصطلحات موضوعية: Model checking, Test vector generation, Scale (ratio), Computer science, business.industry, Automotive industry, 020207 software engineering, 02 engineering and technology, 020202 computer hardware & architecture, Test (assessment), [INFO.INFO-NI]Computer Science [cs]/Networking and Internet Architecture [cs.NI], Computer engineering, Formal language, Metric (mathematics), 0202 electrical engineering, electronic engineering, information engineering, [INFO]Computer Science [cs], business, Algorithm, Formal verification

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8ce3c80f4422403adfbcc9460963c7ff
https://doi.org/10.1007/978-3-319-39570-8_18

المؤلفون: A. E. Lyul'kin

المصدر: Russian Microelectronics. 32:243-246

مصطلحات موضوعية: Combinational logic, Test vector generation, Sequential logic, CMOS, Computer science, Cmos combinational circuits, Materials Chemistry, Electrical and Electronic Engineering, Arithmetic, Condensed Matter Physics, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b1ef214d2586e45d52de9f955eae0d31
https://doi.org/10.1023/a:1024527632636

المؤلفون: Kazuya Shimizu, Kozo Kinoshita, Noriyoshi Itazaki

المصدر: Systems and Computers in Japan. 33:35-47

مصطلحات موضوعية: Very-large-scale integration, Test vector generation, Sequential logic, Computer science, Hardware_PERFORMANCEANDRELIABILITY, Theoretical Computer Science, Crosstalk, Computational Theory and Mathematics, Built-in self-test, Hardware and Architecture, Fault coverage, Electronic engineering, Algorithm, Information Systems, Delay time, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0db529a8c65811e26f102fdd8e98a3c3
https://doi.org/10.1002/scj.1171

المؤلفون: Samir Boubezari, Jayant Chhabria

المصدر: IDT

مصطلحات موضوعية: Stuck-at fault, Engineering, Test vector generation, business.industry, Embedded system, Code coverage, System on a chip, Hardware_PERFORMANCEANDRELIABILITY, Automatic test pattern generation, business, Fault (power engineering), Root cause analysis, Chip

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1aa620e1f877c8870e300dc9f3424dd7
https://doi.org/10.1109/idt.2014.7038578

المؤلفون: Rui Wang, Yong Guan, Xiaojuan Li, Jie Zhang, Yilin Lu

المصدر: ICRA

مصطلحات موضوعية: Model checking, Test vector generation, Computer science, Mobile manipulator, Control engineering, Manipulator

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::917ba2f84e3355ed3750e248c4626205
https://doi.org/10.1109/icra.2014.6907479

المؤلفون: Amiri Moslem, Přenosil Václav

المصدر: Deterioration, Dependability, Diagnostics 2013

مصطلحات موضوعية: fault list generation, test vector generation, fault paths, Generování seznamu poruch, generování testovacích vektorů, cesty šíření poruchy

Relation: https://is.muni.cz/publication/1125452

الاتاحة: https://is.muni.cz/publication/1125452

المؤلفون: AHMED, BADAR UD DIN, YOUREN, WANG, AHMED, NAJAM-UD-DIN

المصدر: Turkish Journal of Electrical Engineering and Computer Sciences

مصطلحات موضوعية: Analog fault detection, analog test vector generation, asymmetrical periodic signals, Computer Engineering, Computer Sciences, Electrical and Computer Engineering

وصف الملف: application/pdf

Relation: https://journals.tubitak.gov.tr/elektrik/vol20/iss4/6; https://journals.tubitak.gov.tr/context/elektrik/article/3296/viewcontent/elk_20_4_6_1007_652.pdf

الاتاحة: https://journals.tubitak.gov.tr/elektrik/vol20/iss4/6
https://doi.org/10.3906/elk-1007-652
https://journals.tubitak.gov.tr/context/elektrik/article/3296/viewcontent/elk_20_4_6_1007_652.pdf

المؤلفون: AHMED, Badar-ud-din, YOUREN, Wang, AHMED, Najam-ud-din

المصدر: Volume: 20, Issue: 4 523-536 ; 1300-0632 ; 1303-6203 ; Turkish Journal of Electrical Engineering and Computer Science

مصطلحات موضوعية: Analog fault detection,analog test vector generation,asymmetrical periodic signals

وصف الملف: application/pdf

Relation: https://dergipark.org.tr/tr/download/article-file/125644; https://dergipark.org.tr/tr/pub/tbtkelektrik/issue/12062/144221

الاتاحة: https://dergipark.org.tr/tr/pub/tbtkelektrik/issue/12062/144221