المؤلفون: Derakhshanfar, Pouria, Devroey, Xavier, Panichella, Annibale, Zaidman, Andy, van Deursen, Arie

المصدر: Derakhshanfar , P , Devroey , X , Panichella , A , Zaidman , A & van Deursen , A 2023 , ' Generating Class-Level Integration Tests Using Call Site Information ' , IEEE Transactions on Software Engineering , vol. 49 , no. 4 , pp. 2069-2087 . https://doi.org/10.1109/TSE.2022.3209625

مصطلحات موضوعية: Automobiles, CLING, Class integration testing, Codes, Couplings, Coverage criteria, Search problems, Search-based software testing, Software testing, Test adequacy, Test pattern generators, Testing

وصف الملف: application/pdf

الاتاحة: https://researchportal.unamur.be/en/publications/eda4d839-3634-4723-96ae-1b44a2258723
https://doi.org/10.1109/TSE.2022.3209625
https://pure.unamur.be/ws/files/68361762/derakhshanfar_2022_b.pdf
http://www.scopus.com/inward/record.url?scp=85140755953&partnerID=8YFLogxK

المؤلفون: Beyazıt, Mutlu, TuÄŸlular, TuÄŸkan, Öztürk Kaya, Dilek

مصطلحات موضوعية: Test pattern generators, Software product lines, Software testing, Behavioral sciences, Computational modeling, Time complexity, Incremental testing

Relation: IEEE Access; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; https://doi.org/10.1109/ACCESS.2023.3234186; https://hdl.handle.net/11147/12895; 11; WOS:000912456400001; 2-s2.0-85147230304; Q2; Q1

الاتاحة: https://hdl.handle.net/11147/12895
https://doi.org/10.1109/ACCESS.2023.3234186

المؤلفون: Silistre, Alper, Kilincceker, Onur, Belli, Fevzi, Challenger, Moharram

مصطلحات موضوعية: Graphical user interfaces, Testing, Software, Adaptation models, Test pattern generators, Reliability, Object oriented modeling, GUI testing, holistic testing, ideal testing, model-based testing, mutation testing, test generation, regular expression, Generation, Injection

Relation: Ieee Access; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; https://hdl.handle.net/11454/77447; https://doi.org/10.1109/ACCESS.2021.3077518; Silistre, Alper/0000-0002-2255-1036; Challenger, Moharram/0000-0002-5436-6070; Belli, Fevzi/0000-0002-8421-3497; Kilincceker, Onur/0000-0001-5996-4398; 68966; 68984

الاتاحة: https://hdl.handle.net/11454/77447
https://doi.org/10.1109/ACCESS.2021.3077518

المؤلفون: Ravi, Parthiban, Sakthi, M. Mano, Satheesan, S. Abin, Kumar, R. Saravana

المصدر: International Journal of Research in Engineering, Science and Management; Vol. 3 No. 8 (2020); 384-387 ; 2581-5792

مصطلحات موضوعية: Low Power, Pseudorandom test pattern generators (PRPGs), Test Patterns, Test data volume compression

وصف الملف: application/pdf

Relation: https://journal.ijresm.com/index.php/ijresm/article/view/205/188; https://journal.ijresm.com/index.php/ijresm/article/view/205

الاتاحة: https://journal.ijresm.com/index.php/ijresm/article/view/205

المؤلفون: Ebadi, Hamid, Helali Moghadam, Mahshid, Borg, Markus, Gay, Gregory, Fontes, Afonso, Socha, Kasper

المصدر: 2021 IEEE International Conference on Artificial Intelligence Testing (AITest). :103-110

مصطلحات موضوعية: Software testing, Quality assurance, Web and internet services, Software algorithms, Test pattern generators, Artificial intelligence, Autonomous vehicles, Search-Based Test Generation, Evolutionary Algorithm, Advanced Driver Assistance Systems, Pedestrian Detection, Automotive Simulators

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-57441

المؤلفون: Sedaghatbaf, Ali, Helali Moghadam, Mahshid, Saadatmand, Mehrdad, 1980

المصدر: 2021 IEEE/ACM International Conference on Automation of Software Test (AST). :11-19

مصطلحات موضوعية: Deep learning, Uncertainty, Automation, Benchmark testing, Generative adversarial networks, Software systems, Test pattern generators, Performance testing, automated test generation, active learning, conditional generative adversarial networks

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-55414

المؤلفون: Irith Pomeranz

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 40:2189-2193

مصطلحات موضوعية: Computer science, Test pattern generators, Context (language use), Hardware_PERFORMANCEANDRELIABILITY, Computer Graphics and Computer-Aided Design, Multiplexing, Reliability engineering, Built-in self-test, Test set, Logic gate, System on a chip, Electrical and Electronic Engineering, Software, Test data

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b74dfeb01cacfc0f84eab3b876e63d39
https://doi.org/10.1109/tcad.2020.3035133

المؤلفون: G. Sowmiya, S. Malarvizhi

المصدر: IETE Journal of Research. 69:1783-1788

مصطلحات موضوعية: Computer science, Transition (fiction), Test pattern generators, Computer Science Applications, Theoretical Computer Science, Bit (horse), Encoding (memory), Fault coverage, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electrical and Electronic Engineering, Arithmetic, Hardware_REGISTER-TRANSFER-LEVELIMPLEMENTATION, Randomness, Linear feedback shift register, Shift register

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b5bcc7aa5c17c5a310e8adf8289bb5c5
https://doi.org/10.1080/03772063.2021.1958072

المؤلفون: Irith Pomeranz, M. Enamul Amyeen

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 40:1711-1720

مصطلحات موضوعية: Data collection, Computer science, Test set, Benchmark (computing), Volume (computing), Test pattern generators, Electrical and Electronic Engineering, Hybrid approach, Fault (power engineering), Computer Graphics and Computer-Aided Design, Software, Electronic mail, Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::83f8f18f496f23f55189a36ac5849c01
https://doi.org/10.1109/tcad.2020.3025091

المؤلفون: Vogl, Sebastian (author), Schweikl, Sebastian (author), Fraser, Gordon (author), Arcuri, Andrea (author), Campos, José (author), Panichella, A. (author)

المساهمون: O'Conner, L. (editor)

مصطلحات موضوعية: Software testing, Java, Conferences, Tools, Test pattern generators

Relation: 2021 IEEE/ACM 14th International Workshop on Search-Based Software Testing (SBST)--978-1-6654-4572-6; 2021 IEEE/ACM 14th International Workshop on Search-Based Software Testing (SBST)--25cb345b-815f-4de5-b344-63186f8e38d2; http://resolver.tudelft.nl/uuid:c023ce98-9315-42e9-9da9-aedc98ed64d6; https://doi.org/10.1109/SBST52555.2021.00012

الاتاحة: http://resolver.tudelft.nl/uuid:c023ce98-9315-42e9-9da9-aedc98ed64d6
https://doi.org/10.1109/SBST52555.2021.00012

المؤلفون: Bhavani Chaithanya, B., Naresh Kumar, D.

المصدر: International Journal of Innovative Technology and Research; Vol 4, No 5 (2016): August - September 2016; 3755-3757

مصطلحات موضوعية: ECE, Built-In Self-Test (BIST), Low-Power (LP) Test, Pseudorandom Test Pattern Generators (PRPGS)

وصف الملف: application/pdf

Relation: http://www.ijitr.com/index.php/ojs/article/view/1060/pdf; http://www.ijitr.com/index.php/ojs/article/view/1060

الاتاحة: http://www.ijitr.com/index.php/ojs/article/view/1060

المؤلفون: Furkan Eris, Ajay Joshi, Michael Taylor, Manuel Egele, Leila Delshadtehrani, Sadullah Canakci

المصدر: DAC

مصطلحات موضوعية: business.industry, Software testing, Computer science, Embedded system, Test pattern generators, Electronic design automation, Fuzz testing, business, Test (assessment)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2be13b9be403839898bf2118ba82f409
https://doi.org/10.1109/dac18074.2021.9586289

المؤلفون: Kazuki Ohtomo, Yoshinobu Higami, Tsutomu Inamoto

المصدر: 2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC).

مصطلحات موضوعية: Yield (engineering), Artificial neural network, Analogue electronics, Built-in self-test, law, Computer science, Spice, Transistor, Test pattern generators, Hardware_PERFORMANCEANDRELIABILITY, Fault (power engineering), Simulation, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2b3c0eb8bfe721bb90688f2ae18e053e
https://doi.org/10.1109/itc-cscc52171.2021.9501263

المؤلفون: Ramesh Bhakthavatchalu, Bodavula Jagadeesh, Doriginti Mohammad, Kanna Rakesh, Chinnapapakkagari Sreenivasa Vikranth, Geethu Remadevi Somanathan

المصدر: 2021 5th International Conference on Trends in Electronics and Informatics (ICOEI).

مصطلحات موضوعية: Pseudorandom number generator, Logical circuit, Computer science, Control signal, Test pattern generators, Hardware_ARITHMETICANDLOGICSTRUCTURES, Algorithm, Linear feedback shift register, Power (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8775f35a2bc0f34b350bf76cd363e662
https://doi.org/10.1109/icoei51242.2021.9452847

المؤلفون: Navya Mohan, Charitha Reddy P, Anuja T J, Rajarajeswari R, SaiTulasi K

المصدر: 2021 5th International Conference on Trends in Electronics and Informatics (ICOEI).

مصطلحات موضوعية: geography, geography.geographical_feature_category, Computer science, Test power, business.industry, Test pattern generators, Pattern recognition, Hardware_PERFORMANCEANDRELIABILITY, Artificial intelligence, Fault (geology), Automatic test pattern generation, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7bb92e301687f7c1d6e6f5b9f06593bf
https://doi.org/10.1109/icoei51242.2021.9452949

المؤلفون: BENSO, Alfredo, BOSIO, ALBERTO, DI CARLO, STEFANO, DI NATALE, Giorgio, PRINETTO, Paolo Ernesto

المساهمون: Benso, Alfredo, Bosio, Alberto, DI CARLO, Stefano, DI NATALE, Giorgio, Prinetto, Paolo Ernesto

مصطلحات موضوعية: DIGITAL SYSTEM DESIGN TEST AND VERIFICATION, Automatic test pattern generation, Circuit testing, Condition monitoring, Semiconductor device reliability, Test pattern generators

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000245209300012; ispartofbook:IEEE 15th Asian Test Symposium (ATS), 2006; IEEE 15th Asian Test Symposium (ATS); firstpage:75; lastpage:82; numberofpages:8; http://hdl.handle.net/11583/1499991; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-33947690760

الاتاحة: http://hdl.handle.net/11583/1499991
https://doi.org/10.1109/ATS.2006.260996

المؤلفون: Juan Pablo Galeotti, Ignacio Manuel Lebrero Rial

المصدر: SBST@ICSE

مصطلحات موضوعية: Unit testing, Java, Computer science, Programming language, Test pattern generators, computer.file_format, Symbolic execution, computer.software_genre, Competition (economics), Software testing, Java code, Executable, computer, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::97944b05c86ae14e2c6e82fa104a895c
https://doi.org/10.1109/sbst52555.2021.00013

المؤلفون: Khen Wee, Kun-Han Tsai, Xijiang Lin, Wei Li, Ricardo Sanchez, Jay Desai, Shih-Yu Yang

المصدر: VTS

مصطلحات موضوعية: Scheme (programming language), Very-large-scale integration, Multi-core processor, Atom (system on chip), Computer science, Test pattern generators, Fault (power engineering), computer, Critical path method, Computational science, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5cdf39d707b99490f77c9759a8f3506d
https://doi.org/10.1109/vts50974.2021.9441049

المؤلفون: Robert Feldt, Eduard Paul Enoiu

المصدر: 2021 IEEE/ACM 13th International Workshop on Cooperative and Human Aspects of Software Engineering (CHASE)
CHASE@ICSE

مصطلحات موضوعية: FOS: Computer and information sciences, Test design, Computer Science - Artificial Intelligence, Computer science, Mental model, Test pattern generators, Cognition, Test (assessment), Software Engineering (cs.SE), Computer Science - Software Engineering, Test case, Artificial Intelligence (cs.AI), Software testing, Human–computer interaction

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b4b80189c47759544b1c0e7eab94b44b

المؤلفون: Diptikalyan Saha, Aniya Aggarwal, Samiulla Shaikh, Swastik Haldar, Sandeep Hans, Rema Ananthanarayanan

المصدر: ICSE (Companion Volume)

مصطلحات موضوعية: Black box (phreaking), FOS: Computer and information sciences, Computer Science - Machine Learning, Modalities, Computer Science - Artificial Intelligence, Computer science, business.industry, Reliability (computer networking), Test pattern generators, Machine learning, computer.software_genre, Test (assessment), Machine Learning (cs.LG), Artificial Intelligence (cs.AI), Robustness (computer science), Artificial intelligence, business, computer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::692cb507cd4a51d8e55babd03cb88fd7