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1Academic Journal
Relation: 2fbe76bd-ec96-4d7e-9d68-1fe7f0c2c3d7; https://avesis.gazi.edu.tr/publication/details/2fbe76bd-ec96-4d7e-9d68-1fe7f0c2c3d7/oai
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2Academic Journal
المؤلفون: Yerişkin, S. Altındal, Taşçıoğlu, İlke, Badali, Yosef
المساهمون: orcid:0000-0001-9563-4396, orcid:0000-0001-7723-4188, Fakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümü
مصطلحات موضوعية: Schottky diodes (SDs), PVC and (PVC:Gt-GO) interlayers, frequency dependent dielectric and electric modulus features, relaxation phoneme and conductivity
Relation: Journal of Physics D: Applied Physics; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; http://hdl.handle.net/11467/7290; 57; 31
الاتاحة: http://hdl.handle.net/11467/7290
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3Academic Journal
المؤلفون: Taşçıoğlu, İlke, Badali, Yosef, Altındal Yerişkin, Seçkin
المساهمون: orcid:0000-0001-9563-4396, orcid:0000-0001-7723-4188, orcid:0000-0002-9772-1212, Fakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümü
مصطلحات موضوعية: organic-based interlayer, graphite/graphene-oxide nanoparticles, electronic parameters and conduction mechanisms, surface states and series resistance
Relation: Physica Scripta; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; http://hdl.handle.net/11467/7370; 99
الاتاحة: http://hdl.handle.net/11467/7370
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4Academic Journal
المؤلفون: ALTINDAL, ŞEMSETTİN, Tascioglu, Ilke, Tan, Serhat Orkun
Relation: b1e8c548-8422-4956-a784-664631c3b80f; https://avesis.gazi.edu.tr/publication/details/b1e8c548-8422-4956-a784-664631c3b80f/oai
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5Academic Journal
المؤلفون: Tascioglu, Ilke, Farooq, W. A., Turan, Raşit, ALTINDAL, ŞEMSETTİN, YAKUPHANOĞLU, FAHRETTİN
مصطلحات موضوعية: Mechanical Engineering, Materials Chemistry, Mechanics of Materials, Metals and Alloys
Relation: Tascioglu I., Farooq W. A. , TURAN R., ALTINDAL Ş., YAKUPHANOĞLU F., "Charge transport mechanisms and density of interface traps in MnZnO/p-Si diodes", JOURNAL OF ALLOYS AND COMPOUNDS, cilt.590, ss.157-161, 2014; 161; 84891809471; 157; https://hdl.handle.net/11511/39237; 590; WOS:000330579600026
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6Academic Journal
المؤلفون: ŞAFAK ASAR, YASEMİN, Arslan, Engin, ÖZBAY, Ekmel, ALTINDAL, ŞEMSETTİN, Tascioglu, Ilke, Butun, Serkan, Uslu, Habibe
Relation: 299e2ca6-0a8b-4d13-86a9-c7dc8d243e7b; https://avesis.gazi.edu.tr/publication/details/299e2ca6-0a8b-4d13-86a9-c7dc8d243e7b/oai
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7Academic Journal
المؤلفون: Arslan, Engin, Butun, Serkan, Safak, Yasemin, Uslu, Habibe, Tascioglu, Ilke, Altindal, Semsettin, Ozbay, Ekmel
المصدر: MICROELECTRONICS RELIABILITY 51(2) 370-375
Relation: https://aperta.ulakbim.gov.tr/record/18523; oai:zenodo.org:18523
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8Academic Journal
المؤلفون: Arslan, Engin, Tascioglu, Ilke, Uslu, Habibe, ÖZBAY, Ekmel, ŞAFAK ASAR, YASEMİN
Relation: 08bd7f6d-1103-4215-8760-d980f0f1def2; https://avesis.gazi.edu.tr/publication/details/08bd7f6d-1103-4215-8760-d980f0f1def2/oai
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9Academic Journal
Relation: 3719be23-9e2a-4fc8-ae01-43245c1d3482; https://avesis.gazi.edu.tr/publication/details/3719be23-9e2a-4fc8-ae01-43245c1d3482/oai
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10Conference
المؤلفون: Başköse, Ceren, Sağlam, Semran, Özbay, Akif, Taşçıoğlu, İlke
Relation: fbf5dfc5-0bf1-4b91-9c5f-d255c70cfd8e; https://avesis.gazi.edu.tr/publication/details/fbf5dfc5-0bf1-4b91-9c5f-d255c70cfd8e/oai
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11Academic Journal
Relation: 78b677d0-332d-4149-b5ef-1068e567fb08; https://avesis.ksbu.edu.tr/publication/details/78b677d0-332d-4149-b5ef-1068e567fb08/oai
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12Academic Journal
مصطلحات موضوعية: Nanostructures, Electrical Data, Schottky Photodiodes, CdZnO Interlayer, Illumination, Surface States
وصف الملف: application/pdf
Relation: Silicon; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; Künye girilecek; http://dx.doi.org/ 10.1007/s12633-020-00382-9; https://hdl.handle.net/20.500.12294/2548; 12; 2885; 2891
الاتاحة: http://dx.doi.org/ 10.1007/s12633-020-00382-9
https://hdl.handle.net/20.500.12294/2548
https://doi.org/10.1007/s12633-020-00382-9 -
13Academic Journal
المؤلفون: Tan, Serhat Orkun1 serhatorkuntan@karabuk.edu.tr, Tascioglu, Ilke2 ilketascioglu@gmail.com, Altindal, Semsettin3 altundal@gazi.edu.tr
المصدر: IEEE Transactions on Electron Devices. Oct2021, Vol. 68 Issue 10, p5085-5089. 5p.
مصطلحات موضوعية: SAPPHIRES, ELECTRIC admittance measurement, ELECTRIC admittance, SURFACE states, PHOTONIC band gap structures, ATOMIC layer deposition
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14Conference
Relation: cd717ef3-0ea3-4ccc-ab58-d177c20189cf; https://avesis.gazi.edu.tr/publication/details/cd717ef3-0ea3-4ccc-ab58-d177c20189cf/oai
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15Academic Journal
وصف الملف: application/pdf
Relation: JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; https://dx.doi.org/10.1007/s10854-019-01570-z; https://hdl.handle.net/20.500.12294/1686; 30; 13; 12122; 12129
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16Academic Journal
المؤلفون: Taşçıoğlu, İlke, Altındal, Şemsettin
وصف الملف: application/pdf
Relation: Journal of Materials Science-Materials in Electronics; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; Tascioglu, I., Tan, S. O., & Altindal, S. (2019). Frequency, voltage and illumination interaction with the electrical characteristics of the CdZnO interlayered Schottky structure. Journal of Materials Science-Materials in Electronics, 30(12), 11536-11541. doi:10.1007/s10854-019-01509-4; https://hdl.handle.net/20.500.12294/1555; 30; 12; 11536; 11541
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17Academic Journal
المؤلفون: ALTINDAL, ŞEMSETTİN, Azizian-Kalandaragh, YASHAR, Boughdachi, Sana, Tascioglu, Ilke, SEVGİLİ, ÖMER
Relation: c0886d77-3f10-4f35-a446-89101a8499e8; https://avesis.gazi.edu.tr/publication/details/c0886d77-3f10-4f35-a446-89101a8499e8/oai
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18
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19Academic Journal
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20Academic Journal
المؤلفون: Taşçıoğlu, İlke, Özmen Tüzün, Ö., Şağban, H. M., Yağlıoğlu, E., Altındal, Ş.
مصطلحات موضوعية: Organic Film, Frequency and Voltage Dependence, Density of Interface States, Electrical Conductivity
وصف الملف: application/pdf
Relation: Journal of Electronic Materials; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; Tascioglu, I., Ozmen, O. T., Sagban, H. M., Yaglioglu, E., & Altindal, S. (2017). Frequency Dependent Electrical and Dielectric Properties of Au/P3HT:PCBM:F4-TCNQ/n-Si Schottky Barrier Diode. Journal of Electronic Materials, 46(4), 2379-2386. doi:10.1007/s11664-017-5294-2; https://hdl.handle.net/20.500.12294/1559; 46; 2379; 2386