يعرض 1 - 20 نتائج من 113 نتيجة بحث عن '"TRL calibration"', وقت الاستعلام: 0.61s تنقيح النتائج
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    Academic Journal
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    Academic Journal
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    Academic Journal

    وصف الملف: application/pdf

    Relation: info:eu-repo/grantAgreement/FCT/9471 - RIDTI/PTDC%2FEEI-TEL%2F29670%2F2017/PT; POCI-01-0145-FEDER-029670; info:eu-repo/grantAgreement/FCT/POR_NORTE/SFRH%2FBD%2F141462%2F2018/PT; info:eu-repo/grantAgreement/FCT/POR_NORTE/SFRH%2FBD%2F137529%2F2018/PT; info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDB%2F04436%2F2020/PT; info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDP%2F04436%2F2020/PT; info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDB%2F04650%2F2020/PT; https://www.mdpi.com/2072-666X/14/1/215; Colmiais, I.; Silva, V.; Borme, J.; Alpuim, P.; Mendes, P.M. Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration. Micromachines 2023, 14, 215. https://doi.org/10.3390/mi14010215; https://hdl.handle.net/1822/84923; 215

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    Academic Journal
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    Conference
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    Conference

    المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)

    المصدر: 2021 IEEE MTT-S International Microwave Symposium (IMS)
    2021 IEEE/MTT-S International Microwave Symposium - IMS 2021
    https://hal.science/hal-03851109
    2021 IEEE/MTT-S International Microwave Symposium - IMS 2021, Jun 2021, Atlanta, United States. pp.511-514, ⟨10.1109/IMS19712.2021.9574928⟩

    جغرافية الموضوع: Atlanta, United States

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    Dissertation/ Thesis
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    Dissertation/ Thesis
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    Academic Journal

    المساهمون: National Institute of Technology Calicut, Université de Bordeaux (UB), Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)

    المصدر: ISSN: 0894-6507 ; IEEE Transactions on Semiconductor Manufacturing ; https://hal.archives-ouvertes.fr/hal-03273325 ; IEEE Transactions on Semiconductor Manufacturing, Institute of Electrical and Electronics Engineers, 2021, 34 (2), pp.145-152. ⟨10.1109/TSM.2021.3073486⟩.

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    Academic Journal
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    Academic Journal

    المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)

    المصدر: ISSN: 2156-342X.

    Relation: hal-02884144; https://hal.science/hal-02884144; https://hal.science/hal-02884144/document; https://hal.science/hal-02884144/file/TRL%20Calibration%20and%20its%20Impact%20on%20Transistor%20Measurement_Final_version.pdf

    الاتاحة: https://hal.science/hal-02884144
    https://hal.science/hal-02884144/document
    https://hal.science/hal-02884144/file/TRL%20Calibration%20and%20its%20Impact%20on%20Transistor%20Measurement_Final_version.pdf
    https://doi.org/10.1109/TTHZ.2020.3004517