المؤلفون: Ahmet Unudulmaz, Mustafa Özgür Cingiz, Oya Kalıpsız

المصدر: Electronics; Volume 11; Issue 13; Pages: 1985

مصطلحات موضوعية: TMMI, agile, SAFE, testing techniques, risk-based tests, test metrics, quality, quality management, TMMI level 2, TMMI level 3, TMMI level 4

وصف الملف: application/pdf

Relation: Computer Science & Engineering; https://dx.doi.org/10.3390/electronics11131985

الاتاحة: https://doi.org/10.3390/electronics11131985