المؤلفون: L Hollberg, S Diddams, A Bartels, T Fortier, K Kim, Lmr Laser Magnetic Resonance

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://tf.nist.gov/timefreq/general/pdf/2037.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.1033.3266; http://tf.nist.gov/timefreq/general/pdf/2037.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.1033.3266
http://tf.nist.gov/timefreq/general/pdf/2037.pdf

المؤلفون: J. Olson, R. Fox, T. Fortier, C. W. Oates, A. D. Ludlow

المصدر: Conference on Lasers and Electro-Optics.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::30f07064e5f911b7bce8776bdef6c6ca
https://doi.org/10.1364/cleo_si.2019.sw3g.7

المؤلفون: Theodore T, Fortier

المصدر: Journal of the California Dental Association. 32(6)

مصطلحات موضوعية: Dental Implants, Clinical Protocols, Humans

URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid________::f2d819caec34838654b6a3b1dba276f6
https://pubmed.ncbi.nlm.nih.gov/15344432

المؤلفون: T. Fortier, H. Yilmaz, I. Bencuya, K. Owyang, T. Tsui

المصدر: 20th Annual IEEE Power Electronics Specialists Conference.

مصطلحات موضوعية: Safe operating area, Materials science, business.industry, Thermal resistance, Transconductance, Bipolar junction transistor, Optoelectronics, Power semiconductor device, Hybrid-pi model, Dissipation, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f70535a2e522a47132293cb4ec85eafe
https://doi.org/10.1109/pesc.1989.48487

المؤلفون: M T, Fortier

المصدر: Dental assistant (Chicago, Ill. : 1994). 67(3)

مصطلحات موضوعية: Dental Impression Technique, Tooth Bleaching, Humans, Tooth Discoloration, Dental Devices, Home Care, Peroxides

URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid________::9d898bf3e07aa25c65132e5e78891d36
https://pubmed.ncbi.nlm.nih.gov/9852816

المؤلفون: L. Lorini, N. Ashby, A. Brusch, S. Diddams, R. Drullinger, E. Eason, T. Fortier, P. Hastings, T. Heavner, D. Hume, W. Itano, S. Jefferts, N. Newbury, T. Parker, T. Rosenb, J. Stalnaker, W. Swann, D. Winel, J. Bergquist

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://tf.nist.gov/general/pdf/2295.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.631.5105; http://tf.nist.gov/general/pdf/2295.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.631.5105
http://tf.nist.gov/general/pdf/2295.pdf

المؤلفون: G. K. Campbell, M. M. Boyd, J. W. Thomsen, M. J. Martin, S. Blatt, M. D. Swallows, T. L. Nicholson, T. Fortier, C. W. Oates, S. A. Diddams, N. D. Lemke, P. Naidon, P. Julienne, Jun Ye, A. D. Ludlow

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://arxiv.org/pdf/0902.2558v2.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.248.336; http://arxiv.org/pdf/0902.2558v2.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.248.336
http://arxiv.org/pdf/0902.2558v2.pdf

المؤلفون: G. K. Campbell, M. M. Boyd, J. W. Thomsen, M. J. Martin, S. Blatt, M. D. Swallows, T. L. Nicholson, T. Fortier, C. W. Oates, S. A. Diddams, N. D. Lemke, P. Naidon, P. Julienne, Jun Ye, A. D. Ludlow

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://arxiv.org/pdf/0902.2558v1.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.248.1905; http://arxiv.org/pdf/0902.2558v1.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.248.1905
http://arxiv.org/pdf/0902.2558v1.pdf

المؤلفون: A.C. Tsui, F.I. Hshieh, T. Fortier, M. Chang, H. Yilmaz

المصدر: Fifth Annual Proceedings on Applied Power Electronics Conference and Exposition.

مصطلحات موضوعية: Engineering, business.industry, Bipolar junction transistor, Electrical engineering, Schottky diode, Carrier lifetime, Inductive load, Power (physics), Safe operating area, Power electronics, Electronic engineering, Device under test, Field-effect transistor, Power semiconductor device, Stress conditions, Electrical and Electronic Engineering, Reverse recovery, business, Voltage, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bf29f7d073190e7e736bb7e13b10f26f
https://doi.org/10.1109/apec.1990.66452

المؤلفون: LORINI, LUCA, N. ASHBY, A. BRUSCH, S. DIDDAMS, R. DRULLINGER, E. EASON, T. FORTIER, P. HASTINGS, T. HEAVNER, D. HUME, W. ITANO, S. JEFFERTS, N. NEWBURY, T. PARKER, T. ROSENBAND, J. STALNAKER, W. SWANN, D. WINELAND, J. BERGQUIST

المساهمون: Lorini, Luca, N., Ashby, A., Brusch, S., Diddam, R., Drullinger, E., Eason, T., Fortier, P., Hasting, T., Heavner, D., Hume, W., Itano, S., Jeffert, N., Newbury, T., Parker, T., Rosenband, J., Stalnaker, W., Swann, D., Wineland, J., Bergquist

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000260889500003; volume:163; firstpage:19; lastpage:35; numberofpages:17; journal:THE EUROPEAN PHYSICAL JOURNAL. SPECIAL TOPICS; http://hdl.handle.net/11696/33565; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-56549108771; http://www.springerlink.com/content/n60r56l604577k77/

الاتاحة: http://hdl.handle.net/11696/33565
https://doi.org/10.1140/epjst/e2008-00807-7
http://www.springerlink.com/content/n60r56l604577k77/

المؤلفون: J. STALNAKER, S. A. DIDDAMS, T. FORTIER, K. KIM, L. HOLLBERG, J. C. BERGQUIST, W. M. ITANO, M. J. DELANEY, LORINI, LUCA, W. H. OSKAY, T. P. HEAVNER, S. R. JEFFERTS, LEVI, FILIPPO, T. E. PARKER, AND J. SHIRLEY

المساهمون: J., Stalnaker, S. A., Diddam, T., Fortier, K., Kim, L., Hollberg, J. C., Bergquist, W. M., Itano, M. J., Delaney, Lorini, Luca, W. H., Oskay, T. P., Heavner, S. R., Jeffert, Levi, Filippo, T. E., Parker, AND J., Shirley

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000250629900007; volume:89; issue:2-3; firstpage:167; lastpage:176; numberofpages:10; journal:APPLIED PHYSICS. B, LASERS AND OPTICS; http://hdl.handle.net/11696/32970; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-35648949997; http://www.springerlink.com/content/w5686j55576218j4/

الاتاحة: http://hdl.handle.net/11696/32970
https://doi.org/10.1007/s00340-007-2762-z
http://www.springerlink.com/content/w5686j55576218j4/

المؤلفون: T. ROSENBAND, D. HUME, A. BRUSCH, P. O. SCHMIDT, T. FORTIER, J. E. STALNAKER, S. A. DIDDAMS, N. R. NEWBURY, W. C. SWANN, W. H. OSKAY, W. M. ITANO, D. J. WINELAND, J. C. BERGQUIST, LORINI, LUCA

المساهمون: T., Rosenband, D., Hume, A., Brusch, Lorini, Luca, P. O., Schmidt, T., Fortier, J. E., Stalnaker, S. A., Diddam, N. R., Newbury, W. C., Swann, W. H., Oskay, W. M., Itano, D. J., Wineland, J. C., Bergquist

Relation: ispartofbook:Proceedings of 2007 ICOLS Meeting; ICOLS; firstpage:297; lastpage:302; numberofpages:6; http://hdl.handle.net/11696/33729

الاتاحة: http://hdl.handle.net/11696/33729

المؤلفون: T, Fortier, M, Hooton

المصدر: L'union medicale du Canada. 111(7)

مصطلحات موضوعية: Schools, Nursing, Quebec, Education, Nursing, Baccalaureate, Philosophy, Nursing, Curriculum, Holistic Health

URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid________::89327ce243ce24ef5ed50de03c685654
https://pubmed.ncbi.nlm.nih.gov/7135653