المؤلفون: Syed, G. S., Brew, K., Vasilopoulos, A., Jonnalagadda, V. P., Kersting, B., Philip, T., Bragaglia, V., Ambrogio, S., Büchel, J., Giannopoulos, J., Gallo, M. Le, Cheng, C.-W., BrightSky, M., Narayanan, V., Saulnier, N., Sebastian, A.

المصدر: 2023 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45741.2023.10413792
http://xplorestaging.ieee.org/ielx7/10413659/10413660/10413792.pdf?arnumber=10413792