المؤلفون: Chkhalo, N. I., Akhsakhalyan, A. A., Vainer, Yu. A., Zorina, M. V., Pestov, A. E., Svechnikov, M. V., Toropov, M. N., Kumar, N., Tokunov, Yu. M.

المصدر: Technical Physics; 2024, Vol. 69 Issue 4, p824-832, 9p

مصطلحات موضوعية: X-ray optics, SURFACE roughness, SILICON oxide, RESEARCH methodology, SILICON

المؤلفون: Akhasakhalyan, A. A., Garakhin, S. A., Dar'in, F. A., Zorina, M. V., Kriventsov, V. V., Pershin, D. D., Pestov, A. E., Pleshkov, R. S., Polkovnikov, V. N., Rakshun, Ya. V., Salaschenko, N. N., Svetokhin, S. S., Svechnikov, M. V., Sorokoletov, D. S., Chernov, V. A., Chkhalo, N. I.

المصدر: Technical Physics; 2024, Vol. 69 Issue 3, p468-474, 7p

مصطلحات موضوعية: SYNCHROTRON radiation, HARD X-rays, REFLECTANCE, ANGULAR measurements, SYNCHROTRONS

المؤلفون: Nechay, A. N., Chkhalo, N. I., Drozdov, M. N., Garakhin, S. A., Pariev, D. E., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Vainer, Yu. A., Meltchakov, E., Delmotte, F.

المساهمون: Russian Foundation for Basic Research, Russian Science Foundation

المصدر: AIP Advances ; volume 8, issue 7 ; ISSN 2158-3226

الاتاحة: http://dx.doi.org/10.1063/1.5007008
https://pubs.aip.org/aip/adv/article-pdf/doi/10.1063/1.5007008/12957407/075202_1_online.pdf

المؤلفون: Chkhalo, N. I., Garakhin, S. A., Kumar, N., Nikolaev, K. V., Polkovnikov, V. N., Rogachev, A., Svechnikov, M. V., Tatarsky, D. A., Yakunin, S. N.

المصدر: Journal of Applied Crystallography; Dec2022, Vol. 55 Issue 6, p1455-1464, 10p

مصطلحات موضوعية: X-ray photoelectron spectroscopy, MULTILAYERS, X-ray reflection, SILICON films, SMALL-angle X-ray scattering

المؤلفون: null Chkhalo N. I., null Chernov V. A., null Sorokoletov D. S., null Svechnikov M. V., null Svetokhin S. S, null Salashchenko N. N., null Rakshun Ya. V., null Polkovnikov V. N., null Pleshkov R. S., null Pestov A. E., null Pershin D. D., null Kriventsov V. V., null Zorina M. V., null Dar'in F. A., null Garakhin S. A., null Akhsakhalyan A. A.

المصدر: Technical Physics. 92:2085

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ad8f77502722116fc2b7fce6f8fc3631
https://doi.org/10.21883/tp.2022.13.52227.128-21

المؤلفون: Garakhin, S. A., Chkhalo, N. I., Kas’kov, I. A., Lopatin, A. Ya., Malyshev, I. V., Nechay, A. N., Pestov, A. E., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Tsybin, N. N., Zabrodin, I. G., Zuev, S. Yu.

المساهمون: Russian Foundation for Basic Research, The State Assignment for IPM RAS

المصدر: Review of Scientific Instruments ; volume 91, issue 6 ; ISSN 0034-6748 1089-7623

الاتاحة: http://dx.doi.org/10.1063/1.5144489
https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/1.5144489/14087566/063103_1_online.pdf

المؤلفون: Barysheva, M M, Garakhin, S A, Zuev, S Yu, Polkovnikov, V N, Salashchenko, N N, Svechnikov, M V, Chkhalo, N I, Yulin, S

المصدر: Quantum Electronics ; volume 49, issue 4, page 380-385 ; ISSN 1063-7818 1468-4799

الاتاحة: http://dx.doi.org/10.1070/qel16990
http://stacks.iop.org/1063-7818/49/i=4/a=380/pdf
http://stacks.iop.org/1063-7818/49/i=4/a=380?key=crossref.a77cec5ac6188c42807df75826674350

المؤلفون: Goray, L. I., Pirogov, E. V., Svechnikov, M. V., Sobolev, M. S., Polyakov, N. K., Gerchikov, L. G., Nikitina, E. V., Dashkov, A. S., Borisov, M. M., Yakunin, S. N., Bouravleuv, A. D.

المصدر: Technical Physics Letters; Oct2021, Vol. 47 Issue 10, p757-760, 4p

مصطلحات موضوعية: X-ray reflectometry, SUPERLATTICES, AUDITING standards, GALLIUM arsenide, SYNCHROTRONS, EPITAXY

المؤلفون: Goray, L. I., Pirogov, E. V., Sobolev, M. S., Polyakov, N. K., Dashkov, A. S., Svechnikov, M. V., Bouravleuv, A. D.

المصدر: Technical Physics; Nov2020, Vol. 65 Issue 11, p1822-1827, 6p

مصطلحات موضوعية: X-ray reflectometry, SYNCHROTRON radiation sources, EPITAXY, DOPED semiconductor superlattices, QUANTUM wells, MOLECULAR beam epitaxy, STANDARD deviations

المؤلفون: Polkovnikov, V. N., Garakhin, S. A., Kvashennikov, D. S., Malyshev, I. V., Salashchenko, N. N., Svechnikov, M. V., Smertin, R. M., Chkhalo, N. I.

المصدر: Technical Physics; Nov2020, Vol. 65 Issue 11, p1809-1813, 5p

مصطلحات موضوعية: REFLECTANCE, MIRRORS, ELECTRIC power, REFLECTIONS

المؤلفون: Garakhin, S. A., Barysheva, M. M., Vishnyakov, E. A., Zuev, S. Yu., Kirichenko, A. S., Kuzin, S. V., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Chkhalo, N. I.

المصدر: Technical Physics; Nov2020, Vol. 65 Issue 11, p1792-1799, 8p

مصطلحات موضوعية: MIRRORS, OBSERVATORIES, REFLECTIONS, FACILITIES

المؤلفون: Pleshkov, R. S., Zuev, S. Yu., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Chkhalo, N. I., Jonnard, P.

المصدر: Technical Physics; Nov2020, Vol. 65 Issue 11, p1786-1791, 6p

مصطلحات موضوعية: SILICON films, MIRRORS, GRAZING incidence, REFLECTANCE, BUFFER layers

المؤلفون: Garakhin, S A, Zabrodin, I G, Zuev, S Yu, Kas'kov, I A, Lopatin, A Ya, Nechay, A N, Polkovnikov, V N, Salashchenko, N N, Tsybin, N N, Chkhalo, N I, Svechnikov, M V

المصدر: Quantum Electronics ; volume 47, issue 4, page 385-392 ; ISSN 1063-7818 1468-4799

الاتاحة: http://dx.doi.org/10.1070/qel16300
http://stacks.iop.org/1063-7818/47/i=4/a=385/pdf
http://stacks.iop.org/1063-7818/47/i=4/a=385?key=crossref.dc2082f3d26b0ea1896afddf17778700

المؤلفون: Vainer, Yu. A., Garakhin, S. A., Zuev, S. Yu., Nechay, A. N., Pleshkov, R. S., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Sertsu, M. G., Smertin, R. M., Sokolov, A., Chkhalo, N. I., Schäfers, F.

المصدر: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Jan2020, Vol. 14 Issue 1, p124-134, 11p

المؤلفون: Goray, L. I., Pirogov, E. V., Sobolev, M. S., Ilkiv, I. V., Dashkov, A. S., Vainer, Yu. A., Svechnikov, M. V., Yunin, P. A., Chkhalo, N. I., Bouravlev, A. D.

المصدر: Semiconductors; Dec2019, Vol. 53 Issue 14, p1910-1913, 4p

مصطلحات موضوعية: X-ray reflectometry, HETEROSTRUCTURES, MOLECULAR beam epitaxy, QUANTUM wells, INVERSE problems, SUPERLATTICES, MAGNITUDE (Mathematics)

المؤلفون: Smertin, R. M., Garakhin, S. A., Zuev, S. Yu., Nechai, A. N., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Sertsu, M. G., Sokolov, A., Chkhalo, N. I., Schäfers, F., Yunin, P. A.

المصدر: Technical Physics; Nov2019, Vol. 64 Issue 11, p1692-1697, 6p, 6 Graphs

مصطلحات موضوعية: THERMAL properties, X-ray optics, REFLECTANCE, MIRRORS, ANNEALING of metals, VACUUM, MULTILAYERED thin films

المؤلفون: Zuev, S. Yu., Pleshkov, R. S., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Chkhalo, N. I., Schäfers, F., Sertsu, M. G., Sokolov, A.

المصدر: Technical Physics; Nov2019, Vol. 64 Issue 11, p1688-1691, 4p, 1 Diagram, 2 Charts, 3 Graphs

مصطلحات موضوعية: MIRRORS, REFLECTANCE, BERYLLIUM

المؤلفون: Barysheva, M. M., Garakhin, S. A., Zuev, S. Yu., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Smertin, R. M., Chkhalo, N. I., Meltchakov, E.

المصدر: Technical Physics; Nov2019, Vol. 64 Issue 11, p1673-1679, 7p, 1 Diagram, 3 Charts, 6 Graphs

مصطلحات موضوعية: UNIFORM spaces, MIRRORS, WAVELENGTHS

المؤلفون: Zuyev, S. Yu., Pariev, D. E., Pleshkov, R. S., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Sertsu, M. G., Sokolov, A., Chkhalo, N. I., Schäfers, F.

المصدر: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Mar2019, Vol. 13 Issue 2, p169-172, 4p

المؤلفون: Chkhalo, N. I., Pestov, A. E., Salashchenko, N. N., Sherbakov, A. V., Skorokhodov, E. V., Svechnikov, M. V.

المساهمون: Russian Foundation for Basic Research, Ministry of Education and Science of the Russian Federation

المصدر: Review of Scientific Instruments ; volume 86, issue 6 ; ISSN 0034-6748 1089-7623

الاتاحة: http://dx.doi.org/10.1063/1.4921849
https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/1.4921849/15792045/063701_1_online.pdf