-
1Academic Journal
المؤلفون: Yaohe Li, Long Jin, Min Liu, Youtang Mo, Weiguang Zheng, Dongyuan Ge, Yindi Bai
المصدر: Processes ; Volume 12 ; Issue 10 ; Pages: 2271
مصطلحات موضوعية: part surface quality inspection, edge detection, mixed filter, adaptive algorithm, selective processing
جغرافية الموضوع: agris
وصف الملف: application/pdf
Relation: Manufacturing Processes and Systems; https://dx.doi.org/10.3390/pr12102271
الاتاحة: https://doi.org/10.3390/pr12102271
-
2Conference
المؤلفون: Nurit, Marvin, Le Goïc, Gaëtan, Maniglier, Stephane, Jochum, Pierre, Chatoux, Hermine, Mansouri, Alamin
المساهمون: Equipe CORES ImViA - EA7535 (CORES), Imagerie et Vision Artificielle Dijon (ImViA), Université de Bourgogne (UB)-Université de Bourgogne (UB), CEntre Technique des Industries Mécaniques (CETIM), CEntre Technique des Industries Mécaniques - Cetim (FRANCE), CETEHOR Département technique du Comité FRANCECLAT, Comité Francéclat, ANR-17-CE10-0005,NAPS,Mesure, Modélisation et Pilotage de l'APparence des états de SUrfaces tridimensionnels(2017)
المصدر: Fifteenth International Conference on Quality Control by Artificial Vision ; https://hal.science/hal-03479036 ; Fifteenth International Conference on Quality Control by Artificial Vision, May 2021, Tokushima, Japan. pp.51, ⟨10.1117/12.2589748⟩
مصطلحات موضوعية: RTI, HDR Imaging, Visual appearance, Visual saliency, Surface quality inspection, [INFO.INFO-TS]Computer Science [cs]/Signal and Image Processing, [INFO.INFO-CV]Computer Science [cs]/Computer Vision and Pattern Recognition [cs.CV], [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]
Relation: hal-03479036; https://hal.science/hal-03479036; https://hal.science/hal-03479036/document; https://hal.science/hal-03479036/file/Article.pdf
-
3Academic Journal
المؤلفون: Kentaro Sato, Takashi Iwama, Takayuki Futatsuka, Yoshikiyo Tamai, 二塚 貴之, 佐藤 健太郎, 岩間 隆史, 玉井 良清
المصدر: 自動車技術会論文集 / Transactions of Society of Automotive Engineers of Japan. 2022, 53(1):177
-
4Academic Journal
المؤلفون: Heger, Jens, Desai, Gururaj, Zein El Abdine, Mazhar
المصدر: Heger , J , Desai , G & Zein El Abdine , M 2020 , ' Anomaly detection in formed sheet metals using convolutional autoencoders ' , Procedia CIRP , vol. 93 , pp. 1281-1285 . https://doi.org/10.1016/j.procir.2020.04.106
مصطلحات موضوعية: /dk/atira/pure/core/keywords/559014392, Engineering, Artifical intelligence, Deep autoencoders, Process monitoring, Surface quality inspection
وصف الملف: application/pdf
الاتاحة: http://fox.leuphana.de/portal/de/publications/anomaly-detection-in-formed-sheet-metals-using-convolutional-autoencoders(340e356d-f41b-4efe-8ddd-8afb4ddb78ef).html
https://doi.org/10.1016/j.procir.2020.04.106
https://pure.leuphana.de/ws/files/21956681/repo_16051169_oa_byncnd.pdf
http://www.scopus.com/inward/record.url?scp=85092439400&partnerID=8YFLogxK -
5Academic Journal
المؤلفون: Carlos Madrigal, John Branch, Alejandro Restrepo, Domingo Mery
المصدر: Sensors; Volume 17; Issue 10; Pages: 2262
مصطلحات موضوعية: 3D point cloud, 3D inspection, surface quality inspection, defects detection
وصف الملف: application/pdf
Relation: Physical Sensors; https://dx.doi.org/10.3390/s17102262
الاتاحة: https://doi.org/10.3390/s17102262
-
6
المؤلفون: Alamin Mansouri, Marvin Nurit, Hermine Chatoux, S. Maniglier, Pierre Jochum, Gaëtan Le Goïc
المساهمون: Equipe CORES [ImViA - EA7535] (CORES), Imagerie et Vision Artificielle [Dijon] (ImViA), Université de Bourgogne (UB)-Université de Bourgogne (UB), CEntre Technique des Industries Mécaniques (CETIM), CEntre Technique des Industries Mécaniques - Cetim (FRANCE), CETEHOR [Département technique du Comité FRANCECLAT], Comité Francéclat, ANR-17-CE10-0005,NAPS,Mesure, Modélisation et Pilotage de l'APparence des états de SUrfaces tridimensionnels(2017)
المصدر: Fifteenth International Conference on Quality Control by Artificial Vision
Fifteenth International Conference on Quality Control by Artificial Vision, May 2021, Tokushima, Japan. pp.51, ⟨10.1117/12.2589748⟩مصطلحات موضوعية: Surface (mathematics), Visual saliency, Computer science, Machine vision, ComputingMethodologies_SIMULATIONANDMODELING, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, 02 engineering and technology, 030218 nuclear medicine & medical imaging, HDR Imaging, 03 medical and health sciences, 020210 optoelectronics & photonics, 0302 clinical medicine, [INFO.INFO-TS]Computer Science [cs]/Signal and Image Processing, High-dynamic-range imaging, Robustness (computer science), Surface quality inspection, 0202 electrical engineering, electronic engineering, information engineering, Computer vision, ComputingMethodologies_COMPUTERGRAPHICS, Coupling, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, [INFO.INFO-CV]Computer Science [cs]/Computer Vision and Pattern Recognition [cs.CV], Visual appearance, Surface metrology, Artificial intelligence, RTI, Polynomial texture mapping, business
-
7Conference
المؤلفون: Hsiao, T.-Y., Liu, Y.-L., Lin, T.-H.
مصطلحات موضوعية: Phase shifting, Surface quality inspection, Three-dimensional shape reconstruction
وصف الملف: 177 bytes; text/html
Relation: 23rd International Display Workshops in conjunction with Asia Display, IDW/AD 2016, Volume 4 , Page: 2403 - 2406; http://ir.lib.ntust.edu.tw/handle/987654321/74663; http://ir.lib.ntust.edu.tw/bitstream/987654321/74663/1/index.html
-
8
المؤلفون: Nikolay Voznesenskiy, Malgorzata Kujawinska, Mariia Voznesenskaia, Maciej Trusiak, Kamil Liżewski, Heidi Ottevaere, Diwaker Jha
المساهمون: Lehmann, Peter, Goncalves, Armando Albertazzi, Osten, Wolfgang, Applied Physics and Photonics, Brussels Photonics Team
مصطلحات موضوعية: surface quality inspection, Materials science, Extreme ultraviolet lithography, X-ray optics, 02 engineering and technology, Substrate (printing), Diamond turning, Residual, high numerical aperture, point diffraction interferometry, 01 natural sciences, 010309 optics, Point diffraction interferometer, Optics, 0103 physical sciences, damping stray interference, Electrical and Electronic Engineering, industrial application of point diffraction interferometer, Wavefront, asphere, business.industry, Applied Mathematics, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Computer Science Applications, Lapping, sub-nanometer accuracy, 0210 nano-technology, business, EUV optics
-
9Periodical
المؤلفون: Małkiński, W., Zając, J., Karliński, M.
مصطلحات موضوعية: przetwarzanie i analiza obrazów, systemy wizji maszynowej, inspekcja automatyczna optyczna, inspekcja jakości powierzchni, systemy zarządzania jakością, proces honowania, image processing and analysis, machine vision systems, automated optical inspection, surface quality inspection, quality management systems, honing process
-
10Dissertation/ Thesis
المؤلفون: Sippola, Tomi
المساهمون: Kenola, Pasi, Teknillinen korkeakoulu, Helsinki University of Technology, Sähkö- ja tietoliikennetekniikan osasto, Lampinen, Jouko, Aalto-yliopisto, Aalto University
مصطلحات موضوعية: feature selection, surface quality inspection, machine vision, piirteiden valinta, pinnantarkastus, konenäkö
Relation: https://aaltodoc.aalto.fi/handle/123456789/95090; URN:NBN:fi:aalto-2020120553924