يعرض 1 - 10 نتائج من 10 نتيجة بحث عن '"Surface quality inspection"', وقت الاستعلام: 0.37s تنقيح النتائج
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    Academic Journal

    المصدر: Processes ; Volume 12 ; Issue 10 ; Pages: 2271

    جغرافية الموضوع: agris

    وصف الملف: application/pdf

    Relation: Manufacturing Processes and Systems; https://dx.doi.org/10.3390/pr12102271

  2. 2
    Conference

    المساهمون: Equipe CORES ImViA - EA7535 (CORES), Imagerie et Vision Artificielle Dijon (ImViA), Université de Bourgogne (UB)-Université de Bourgogne (UB), CEntre Technique des Industries Mécaniques (CETIM), CEntre Technique des Industries Mécaniques - Cetim (FRANCE), CETEHOR Département technique du Comité FRANCECLAT, Comité Francéclat, ANR-17-CE10-0005,NAPS,Mesure, Modélisation et Pilotage de l'APparence des états de SUrfaces tridimensionnels(2017)

    المصدر: Fifteenth International Conference on Quality Control by Artificial Vision ; https://hal.science/hal-03479036 ; Fifteenth International Conference on Quality Control by Artificial Vision, May 2021, Tokushima, Japan. pp.51, ⟨10.1117/12.2589748⟩

    جغرافية الموضوع: Tokushima, Japan

  3. 3
    Academic Journal
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    Academic Journal
  5. 5
    Academic Journal

    المصدر: Sensors; Volume 17; Issue 10; Pages: 2262

    وصف الملف: application/pdf

    Relation: Physical Sensors; https://dx.doi.org/10.3390/s17102262

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    المساهمون: Equipe CORES [ImViA - EA7535] (CORES), Imagerie et Vision Artificielle [Dijon] (ImViA), Université de Bourgogne (UB)-Université de Bourgogne (UB), CEntre Technique des Industries Mécaniques (CETIM), CEntre Technique des Industries Mécaniques - Cetim (FRANCE), CETEHOR [Département technique du Comité FRANCECLAT], Comité Francéclat, ANR-17-CE10-0005,NAPS,Mesure, Modélisation et Pilotage de l'APparence des états de SUrfaces tridimensionnels(2017)

    المصدر: Fifteenth International Conference on Quality Control by Artificial Vision
    Fifteenth International Conference on Quality Control by Artificial Vision, May 2021, Tokushima, Japan. pp.51, ⟨10.1117/12.2589748⟩

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    Conference
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  10. 10
    Dissertation/ Thesis

    المؤلفون: Sippola, Tomi

    المساهمون: Kenola, Pasi, Teknillinen korkeakoulu, Helsinki University of Technology, Sähkö- ja tietoliikennetekniikan osasto, Lampinen, Jouko, Aalto-yliopisto, Aalto University

    Relation: https://aaltodoc.aalto.fi/handle/123456789/95090; URN:NBN:fi:aalto-2020120553924