نتائج البحث - "Sungyoung Yoon"

1

Academic Journal

Effect of physical therapy scoliosis specific exercises using breathing pattern on adolescent idiopathic scoliosis

المؤلفون: Min-Hyung Rhee, Sungyoung Yoon

المصدر: Journal of Physical Therapy Science. 2016, 28(11):3261

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2

A systematic literature review on the effects of physical functions on braking ability of elderly drivers

المؤلفون: Jaeseok Heo, Sangyeol Lee, Sungyoung Yoon, Seunghoon Lee, Him Seok

المصدر: The Journal of Korean Academy of Physical Therapy Science. 29:43-53

مصطلحات موضوعية: General Medicine

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::261c8d9d76559446b2bbfc08e96d9c2e
https://doi.org/10.26862/jkpts.2022.12.29.4.43

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3

The Effect of 3-Dimensional Posture Correction Exercise Program Incorporating PNF Respiratory Muscle Strengthening Exercise on the Spinal Alignment and the Trunk Expansion in Patients with Idiopathic Scoliosis

المؤلفون: Sungyoung Yoon, Him Seok, Jaeseok Heo, Sangyeol Lee

المصدر: Physical Therapy Rehabilitation Science. 10:430-437

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::599fc46ef7a7658092d4ad3151b83f06
https://doi.org/10.14474/ptrs.2021.10.4.430

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4

Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application

المصدر: 2021 IEEE International Memory Workshop (IMW).

مصطلحات موضوعية: Reduction (complexity), Flash (photography), Reliability (semiconductor), business.industry, Computer science, Robustness (computer science), Automotive industry, Failure rate, Hardware_PERFORMANCEANDRELIABILITY, Sense (electronics), Static random-access memory, business, Automotive engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::77520e6b5e0c91ff52b383f30b542789
https://doi.org/10.1109/imw51353.2021.9439602

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5

Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology

المؤلفون: Sangsu Ha, Hyun-Jin Kim, Tae-Young Jeong, Sang-chul Shin, Minhyeok Choe, Sungyoung Yoon, Hyewon Shim, Hyun Chul Sagong, Junekyun Park, Seungjin Choo, Sangwoo Pae

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Pressure range, Materials science, Reliability (semiconductor), Passivation, 0103 physical sciences, Gate dielectric, Dangling bond, Process (computing), Forming gas, 01 natural sciences, Engineering physics, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f4681acc47ccbe4c0e653bb26a07d76d
https://doi.org/10.1109/irps.2018.8353649

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6

Considering physical mechanisms and geometry dependencies in 14nm FinFET circuit aging and product validations

المؤلفون: Hyunchul Sagong, Seungjin Choo, Jin-soak Kim, Minjung Jin, Yeshin Kim, Sungyoung Yoon, Seung Chul Shin, Changze Liu, Sangwoo Pae, Seung-Hyun Park, Ju-Seop Park, Hyeonwoo Nam, Hwa-Kyung Kim, Hyewon Shim, Junekyun Park

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Engineering, Fin, Product design, business.industry, Transistor, Work (physics), Geometry, law.invention, Reliability engineering, Stress (mechanics), Reliability (semiconductor), law, Product (mathematics), Stress conditions, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::db222c11cb9a817ac51c35177685375c
https://doi.org/10.1109/iedm.2015.7409744

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7

Experimental study on BTI variation impacts in SRAM based on high-k/metal gate FinFET: From transistor level Vth mismatch, cell level SNM to product level Vmin

المؤلفون: Sungmock Ha, Jongwoo Park, Hye-Jin Kim, Hyun-Jin Kim, Jinju Kim, Yoohwan Kim, Lira Hwang, Seungjin Choo, Minjung Jin, Changze Liu, Soonyoung Lee, Hyun Chul Sagong, Junekyun Park, Jungin Kim, Sungyoung Yoon, Sangwoo Pae, Kangjung Kim, Hyeonwoo Nam

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Circuit design, Transistor, Hardware_PERFORMANCEANDRELIABILITY, law.invention, Reliability (semiconductor), law, Electronic engineering, Inverter, Node (circuits), Process optimization, Static random-access memory, business, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::63dee6b834292e8680c78abc22023b7d
https://doi.org/10.1109/iedm.2015.7409675

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8

High-Tcramp-edge junctions and dc SQUIDs with a Ga-doped YBCO barrier

المؤلفون: Sungyoung Yoon, In-Yong Song, Eunha Lee, Gwangseo Park

المصدر: Superconductor Science and Technology. 12:795-797

مصطلحات موضوعية: Superconductivity, Materials science, Plasma cleaning, business.industry, Doping, Metals and Alloys, Plasma, Condensed Matter Physics, Barrier layer, Transmission electron microscopy, Torr, Materials Chemistry, Ceramics and Composites, Optoelectronics, Electrical and Electronic Engineering, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f430953f7e01104fcd4e156a89d454a8
https://doi.org/10.1088/0953-2048/12/11/331

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