المؤلفون: Ding, Jingtao, Zhang, Yunke, Shang, Yu, Zhang, Yuheng, Zong, Zefang, Feng, Jie, Yuan, Yuan, Su, Hongyuan, Li, Nian, Sukiennik, Nicholas, Xu, Fengli, Li, Yong

مصطلحات موضوعية: Computer Science - Computation and Language, Computer Science - Artificial Intelligence, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2411.14499

المؤلفون: Su, Hongyuan, Zheng, Yu, Ding, Jingtao, Jin, Depeng, Li, Yong

مصطلحات موضوعية: Computer Science - Machine Learning, Computer Science - Artificial Intelligence, Computer Science - Computers and Society, 68T20

URL الوصول: http://arxiv.org/abs/2409.01588

المؤلفون: Su, Hongyuan, Zheng, Yu, Ding, Jingtao, Jin, Depeng, Li, Yong

مصطلحات موضوعية: Computer Science - Social and Information Networks, 68T09

URL الوصول: http://arxiv.org/abs/2403.09217

المؤلفون: Su, Hongyuan, Zheng, Yu, Ding, Jingtao, Jin, Depeng, Li, Yong

مصطلحات موضوعية: Computer Science - Computers and Society, 68T09

URL الوصول: http://arxiv.org/abs/2403.09197

المؤلفون: Zheng, Yu, Su, Hongyuan, Ding, Jingtao, Jin, Depeng, Li, Yong

مصطلحات موضوعية: Computer Science - Artificial Intelligence, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2305.13060

المؤلفون: Zhang, Chong, Wu, Qi, Ma, Liqian, Su, Hongyuan

مصطلحات موضوعية: Computer Science - Robotics

URL الوصول: http://arxiv.org/abs/2112.03735

المؤلفون: Zheng, Zichen, Liu, Kewei, Zhou, Yiwen, Zhang, Zicong, Su, Hongyuan, Nie, Xudong, Debliquy, Marc, Yu, Zexin, Zhang, Chao

المساهمون: F502 - Science des Matériaux, R400 - Institut de Recherche en Science et Ingénierie des Matériaux

المصدر: Materials Today Chemistry, 36, 101928 (2024-03-01)

مصطلحات موضوعية: Gas sensor, Morphology regulation, Nanostructure, Semiconductor metal oxide, Sensing mechanism, Agricultural productions, Chemoresistance, Environmental Monitoring, Gas-sensors, P-type, Semiconductor metal oxides, Sensing performance, Spinel-type, Catalysis, Electronic, Optical and Magnetic Materials, Biomaterials, Polymers and Plastics, Colloid and Surface Chemistry, Materials Chemistry, Engineering, computing & technology, Materials science & engineering, Ingénierie, informatique & technologie, Science des matériaux & ingénierie

Relation: https://api.elsevier.com/content/article/PII:S246851942400034X?httpAccept=text/xml; urn:issn:2468-5194; https://orbi.umons.ac.be/handle/20.500.12907/49438; info:hdl:20.500.12907/49438; https://orbi.umons.ac.be/bitstream/20.500.12907/49438/1/Spinel%20type%20MCo2O4%20%28M%20%3d%20Mn%2c%20Mg%2c%20Ni%2c%20Cu%2c%20Fe%20and%20Zn%29%20for%20chemoresistance.pdf

الاتاحة: https://orbi.umons.ac.be/handle/20.500.12907/49438
https://hdl.handle.net/20.500.12907/49438
https://orbi.umons.ac.be/bitstream/20.500.12907/49438/1/Spinel%20type%20MCo2O4%20%28M%20%3d%20Mn%2c%20Mg%2c%20Ni%2c%20Cu%2c%20Fe%20and%20Zn%29%20for%20chemoresistance.pdf
https://doi.org/10.1016/j.mtchem.2024.101928

المؤلفون: Su, Hongyuan, Wu, Duoli, Li, Chengxin, Li, Changjiu, Zhang, Chao

المصدر: Progress in Natural Science: Materials International ; volume 33, issue 3, page 309-319 ; ISSN 1002-0071

الاتاحة: http://dx.doi.org/10.1016/j.pnsc.2023.08.014
https://api.elsevier.com/content/article/PII:S1002007123000692?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1002007123000692?httpAccept=text/plain

المؤلفون: Wang Lixin, Su Hongyuan, Jiajun Luo, Zhao Fazhan, Lulu Wang

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: Current distribution, Computer science, Electrical Evaluation, Electronic engineering, Insulated-gate bipolar transistor, Transient current, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fbd7904b56419e4790af2de8687a4d73
https://doi.org/10.1109/ipfa.2018.8452484

المؤلفون: Zhou, Xintian, Su, Hongyuan, Yue, Ruifeng, Dai, Gang, Li, Juntao, Wang, Yan, Yu, Zhiping

المصدر: IEEE Transactions on Power Electronics ; volume 33, issue 6, page 5251-5261 ; ISSN 0885-8993 1941-0107

الاتاحة: http://dx.doi.org/10.1109/tpel.2017.2730259
http://xplorestaging.ieee.org/ielx7/63/8299601/07987746.pdf?arnumber=7987746

المؤلفون: Jia, Yunpeng, Peng, Ling, Su, Hongyuan, Hu, Dongqing, Wu, Yu

المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ; page 276-279

الاتاحة: http://dx.doi.org/10.1109/ipfa.2016.7564299
http://xplorestaging.ieee.org/ielx7/7562271/7564233/07564299.pdf?arnumber=7564299

المؤلفون: Jia, Yunpeng, Su, Hongyuan, Jin, Rui, Hu, Dongqing, Wu, Yu

المصدر: Journal of Semiconductors ; volume 37, issue 2, page 024008 ; ISSN 1674-4926

الاتاحة: http://dx.doi.org/10.1088/1674-4926/37/2/024008
http://stacks.iop.org/1674-4926/37/i=2/a=024008/pdf
http://stacks.iop.org/1674-4926/37/i=2/a=024008?key=crossref.8e814fcf092c9cdac9bdb212c27e4db6

المؤلفون: Zhou, Xintian, Su, Hongyuan, Wang, Yan, Yue, Ruifeng, Dai, Gang, Li, Juntao

المساهمون: National Program on Key Basic Research Project of China

المصدر: IEEE Transactions on Electron Devices ; volume 63, issue 11, page 4346-4351 ; ISSN 0018-9383 1557-9646

الاتاحة: http://dx.doi.org/10.1109/ted.2016.2606882
http://xplorestaging.ieee.org/ielx7/16/7592488/07582490.pdf?arnumber=7582490

المؤلفون: Zheng, Zichen, Liu, Kewei, Zhou, Yiwen, Zhang, Zicong, Su, Hongyuan, Nie, Xudong, Debliquy, Marc, Yu, Zexin, Zhang, Chao

المصدر: Materials Today Chemistry; March 2024, Vol. 36 Issue: 1