المؤلفون: Neykova, N. (Neda), Stuchlík, J. (Jiří), Hruška, K. (Karel), Poruba, A. (Aleš), Remeš, Z. (Zdeněk), Pop-Georgievski, O. (Ognen)

مصطلحات موضوعية: 3-dimensional solar cells, hydrothermal growth, optical spectroscopy, photothermal deflection spectroscopy, plasma treatment, XPS

Relation: urn:pissn: 2190-4286; urn:eissn: 2190-4286; http://hdl.handle.net/11104/0276766

الاتاحة: https://doi.org/10.3762/bjnano.8.48
http://hdl.handle.net/11104/0276766

المؤلفون: Remeš, Z. (Zdeněk), Stuchlík, J. (Jiří), Purkrt, A. (Adam), Ledinský, M. (Martin), Kupčík, J. (Jaroslav)

مصطلحات موضوعية: amorphous silicon, chemical vapor deposition, photothermal deflection spectroscopy

Relation: urn:pissn: 0862-5468; urn:eissn: 1804-5847; http://hdl.handle.net/11104/0271823

الاتاحة: https://doi.org/10.13168/cs.2017.0008
http://hdl.handle.net/11104/0271823

المؤلفون: Galkin, N.G., Galkin, K.N., Chernev, I.M., Fajgar, R. (Radek), Stuchlíková, T. (The-Ha), Stuchlík, J. (Jiří), Remeš, Z. (Zdeněk)

مصطلحات موضوعية: hydrogenated amorphous silicon, chemical vapour deposition, nanoparticles

Relation: urn:isbn: 978-4-86348-491-7; http://hdl.handle.net/11104/0257170

الاتاحة: https://doi.org/10.7567/JJAPCP.3.011104
http://hdl.handle.net/11104/0257170

المؤلفون: Pham, T.T., Le, V.T.H., Cu, S.T., Stuchlík, J. (Jiří)

مصطلحات موضوعية: electrical-properties, growth, silicon nanowires (Si-NWs), PECVD, ZnO, VLS process, Sn nanoparticles

Relation: urn:pissn: 2043-6254; http://hdl.handle.net/11104/0301556

الاتاحة: https://doi.org/10.1088/2043-6262/5/4/045011
http://hdl.handle.net/11104/0301556

المؤلفون: Krivyakin, G.K., Volodin, V., Kochubei, S.A., Kamaev, G.N., Purkrt, A. (Adam), Remeš, Z. (Zdeněk), Fajgar, R. (Radek), Stuchlíková, T. (The-Ha), Stuchlík, J. (Jiří)

مصطلحات موضوعية: hydrogenated amorphous silicon, nanocrystals, laser annealing

Relation: urn:pissn: 1063-7826; urn:eissn: 1090-6479; http://hdl.handle.net/11104/0265612

الاتاحة: https://doi.org/10.1134/S1063782616070101
http://hdl.handle.net/11104/0265612

المؤلفون: Chernev, I.M., Shevlyagin, A.V., Galkin, K.N., Stuchlík, J. (Jiří), Remeš, Z. (Zdeněk), Fajgar, R. (Radek), Galkin, N.G.

مصطلحات موضوعية: silicides, amorphous silicon

Relation: urn:pissn: 0003-6951; urn:eissn: 1077-3118; http://hdl.handle.net/11104/0262006

الاتاحة: https://doi.org/10.1063/1.4960011
http://hdl.handle.net/11104/0262006

المؤلفون: Remeš, Z. (Zdeněk), Novák, T., Stuchlík, J. (Jiří), Stuchlíková, T. (The-Ha), Dřínek, V. (Vladislav), Fajgar, R. (Radek), Zhuravlev, K.

مصطلحات موضوعية: infrared photoluminescence, PbS, Langmuir–Blodgett, laser ablation

Relation: urn:pissn: 1210-2709; urn:eissn: 1805-2363; http://hdl.handle.net/11104/0242790

الاتاحة: https://doi.org/10.14311/AP.2014.54.0426
http://hdl.handle.net/11104/0242790

المؤلفون: Galkin, N.G., Galkin, K.N., Chernev, I.M., Fajgar, R. (Radek), Stuchlíková, T. (The-Ha), Remeš, Z. (Zdeněk), Stuchlík, J. (Jiří)

مصطلحات موضوعية: Mg2Si, nanoparticles, technology

Relation: urn:pissn: 1862-6351; http://hdl.handle.net/11104/0228156

الاتاحة: https://doi.org/10.1002/pssc.201300362
http://hdl.handle.net/11104/0228156

المؤلفون: Fejfar, A. (Antonín), Hývl, M. (Matěj), Ledinský, M. (Martin), Vetushka, A. (Aliaksi), Stuchlík, J. (Jiří), Kočka, J. (Jan), Misra, S., O'Donnell, B., Foldyna, M., Yu, L., Roca i Cabarrocas, P.

مصطلحات موضوعية: silicon, thin films, nanowires, random diode arrays, atomic force microscopy, photoresponse

Relation: urn:pissn: 0927-0248; urn:eissn: 1879-3398; http://hdl.handle.net/11104/0224089

الاتاحة: https://doi.org/10.1016/j.solmat.2013.07.042
http://hdl.handle.net/11104/0224089

المؤلفون: Vetushka, A. (Aliaksi), Fejfar, A. (Antonín), Ledinský, M. (Martin), Rezek, B. (Bohuslav), Stuchlík, J. (Jiří), Kočka, J. (Jan)

مصطلحات موضوعية: conductive atomic force microscopy, oxidation, microcrystalline silicon

Relation: info:eu-repo/grantAgreement/EC/FP7/240826/EU//PolySiMode; urn:pissn: 1098-0121; urn:eissn: 2469-9969; http://hdl.handle.net/11104/0193885

الاتاحة: https://doi.org/10.1103/PhysRevB.81.237301
http://hdl.handle.net/11104/0193885

المؤلفون: Červenka, J. (Jiří), Ledinský, M. (Martin), Stuchlík, J. (Jiří), Stuchlíková, T. (The-Ha), Bakardjieva, S. (Snejana), Hruška, K. (Karel), Fejfar, A. (Antonín), Kočka, J. (Jan)

مصطلحات موضوعية: nanoneedles, nanowires, silicon, plasma, chemical vapor deposition, crystal structure, growth, phonon, SEM, Raman

Relation: info:eu-repo/grantAgreement/EC/FP7/240826/EU//PolySiMode; urn:pissn: 0957-4484; urn:eissn: 1361-6528; http://hdl.handle.net/11104/0192169

الاتاحة: https://doi.org/10.1088/0957-4484/21/41/415604
http://hdl.handle.net/11104/0192169

المؤلفون: Červenka, J. (Jiří), Ledinský, M. (Martin), Stuchlíková, T. (The-Ha), Stuchlík, J. (Jiří), Výborný, Z. (Zdeněk), Holovský, J. (Jakub), Hruška, K. (Karel), Fejfar, A. (Antonín), Kočka, J. (Jan)

مصطلحات موضوعية: nanowires, silicon, scanning electron microscopy, hemical vapor deposition, Raman spectroscopy

Relation: urn:pissn: 1862-6254; urn:eissn: 1862-6270; http://hdl.handle.net/11104/0184509

الاتاحة: https://doi.org/10.1002/pssr.200903348
http://hdl.handle.net/11104/0184509

المؤلفون: Verveniotis, E. (Elisseos), Rezek, B. (Bohuslav), Šípek, E. (Emil), Stuchlík, J. (Jiří), Kočka, J. (Jan)

مصطلحات موضوعية: amorphous materials, atomic force microscopy (AFM), conductivity, crystallization, nanostructures, silicon, nickel

Relation: http://hdl.handle.net/11104/0193834

الاتاحة: https://doi.org/10.1016/j.tsf.2010.05.107
http://hdl.handle.net/11104/0193834

المؤلفون: Vašek, P. (Petr), Svoboda, P. (Pavel), Novák, V. (Vít), Cukr, M. (Miroslav), Výborný, K. (Karel), Jurka, V. (Vlastimil), Stuchlík, J. (Jiří), Orlita, M. (Milan), Maude, D. K.

مصطلحات موضوعية: GaMnAs, anisotropic magnetoresistance, hydrogenation

Relation: http://hdl.handle.net/11104/0192992

الاتاحة: https://doi.org/10.1007/s10948-010-0664-5
http://hdl.handle.net/11104/0192992

المؤلفون: Fejfar, A. (Antonín), Vetushka, A. (Aliaksi), Kalusová, V., Čertík, O. (Ondřej), Ledinský, M. (Martin), Rezek, B. (Bohuslav), Stuchlík, J. (Jiří), Kočka, J. (Jan)

مصطلحات موضوعية: conductive atomic force microscopy (C-AFM), mixed phase silicon thin films

Relation: http://hdl.handle.net/11104/0188510

الاتاحة: https://doi.org/10.1002/pssa.200982907
http://hdl.handle.net/11104/0188510

المؤلفون: Ledinský, M. (Martin), Vetushka, A. (Aliaksi), Stuchlík, J. (Jiří), Fejfar, A. (Antonín), Kočka, J. (Jan)

مصطلحات موضوعية: Raman, atomic force microscopy, microcrystalline silicon

Relation: http://hdl.handle.net/11104/0188466

الاتاحة: https://doi.org/10.1002/pssc.200982832
http://hdl.handle.net/11104/0188466

المؤلفون: Vetushka, A. (Aliaksi), Fejfar, A. (Antonín), Ledinský, M. (Martin), Rezek, B. (Bohuslav), Stuchlík, J. (Jiří), Kočka, J. (Jan)

مصطلحات موضوعية: local anodic oxidation (LAO), conductive atomic force microscopy (C-AFM)

Relation: http://hdl.handle.net/11104/0188465

الاتاحة: https://doi.org/10.1002/pssc.200982777
http://hdl.handle.net/11104/0188465

المؤلفون: Rezek, B. (Bohuslav), Šípek, E. (Emil), Stuchlík, J. (Jiří), Kočka, J. (Jan)

مصطلحات موضوعية: silicon, nanocrystals, crystallization

Relation: http://hdl.handle.net/11104/0193243

الاتاحة: http://hdl.handle.net/11104/0193243