المؤلفون: T. Lundquist, Arkadiusz Glowacki, U. Kindereit, Rudolf Schlangen, Tuba Kiyan, Steven Kasapi, Christian Boit, U. Kerst, H. Suzuki

المصدر: Advances in Radio Science, Vol 6, Pp 265-272 (2008)

مصطلحات موضوعية: Materials science, Silicon, media_common.quotation_subject, Process (computing), chemistry.chemical_element, Nanotechnology, General Medicine, Hardware_PERFORMANCEANDRELIABILITY, Chip, Focused ion beam, Debugging, chemistry, lcsh:TA1-2040, Shallow trench isolation, Nano, Hardware_INTEGRATEDCIRCUITS, lcsh:Engineering (General). Civil engineering (General), Nanoscopic scale, media_common

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::91df061168537f92497981fe56baedc1
https://www.adv-radio-sci.net/6/265/2008/

المؤلفون: I. Kapilevich, Joy Liao, Cathy Kardach, Yin S. Ng, Jeffrey A. Block, Bruce Cory, Steven Kasapi, Ted R. Lundquist

المصدر: Microelectronics Reliability. 51:1668-1672

مصطلحات موضوعية: Engineering, Yield (engineering), business.industry, media_common.quotation_subject, Electrical Failure, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Manufacturing engineering, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability engineering, Workflow, Debugging, Wafer, Electrical and Electronic Engineering, Foundry, Safety, Risk, Reliability and Quality, business, Voltage, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ba45a22e39216c8c24e8db7ae9e3db70
https://doi.org/10.1016/j.microrel.2011.07.079

المؤلفون: Howard Lee Marks, Steven Kasapi, Yin S. Ng, Joy Liao, Bruce Cory

المصدر: Microelectronics Reliability. 50:1422-1426

مصطلحات موضوعية: Engineering, business.industry, Design for testing, Scan chain, Condensed Matter Physics, Laser, Atomic and Molecular Physics, and Optics, Fault detection and isolation, Die (integrated circuit), Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, CMOS, law, Microscopy, Electronic engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::74801a05693b24a8cdae02777c2c3fd2
https://doi.org/10.1016/j.microrel.2010.07.101

المؤلفون: Howard Lee Marks, Yin S. Ng, William Lo, Nathan Slattengren, Tung Ton, Steven Kasapi, Ted R. Lundquist, Joy Liao

المصدر: Microelectronics Reliability. 49:1127-1131

مصطلحات موضوعية: Engineering, business.industry, Clock signal, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Condensed Matter Physics, Laser, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Phase-locked loop, law, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Waveform, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, AND gate, Jitter, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::af0cc73d494644b7d4c85a3125508826
https://doi.org/10.1016/j.microrel.2009.07.017

المؤلفون: Radu Ispasoiu, William Lo, U. Kindereit, U. Kerst, Roy Ng, Steven Kasapi, Christian Boit

المصدر: Microelectronics Reliability. 48:1322-1326

مصطلحات موضوعية: Spectrum analyzer, Materials science, business.industry, Electrical engineering, Ring oscillator, Integrated circuit, Condensed Matter Physics, Laser, Signal, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Modulation, law, Optoelectronics, Continuous wave, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::79dbe5a3453b35d8a08a0725e05f47d0
https://doi.org/10.1016/j.microrel.2008.07.040

المؤلفون: Brian Johnston, Chris Shaw, Steven Kasapi, Peter Ouimet, Jason Goertz, Tom Crawford, Radu Ispasoiu, Olivier Rinaudo

المصدر: Microelectronics Reliability. 46:1504-1507

مصطلحات موضوعية: Physics, Time-resolved photon emission, business.industry, Detector, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reduction (complexity), Optics, CMOS, Electronic engineering, Figure of merit, Acquisition time, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Photon detection, Jitter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d7e83094f47ea449ec57b612442c2854
https://doi.org/10.1016/j.microrel.2006.07.026

المؤلفون: Steven Kasapi, Seema Somani, Ken Wilsher, William Lo, Chun-Cheng Tsao

المصدر: Microelectronics Reliability. 39:957-961

مصطلحات موضوعية: Engineering, Silicon, business.industry, Bandwidth (signal processing), chemistry.chemical_element, Static timing analysis, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, CMOS, chemistry, law, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Waveform, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Laser beams, Flip chip

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::341f4cad7766335c351eaa37f48906ce
https://doi.org/10.1016/s0026-2714(99)00130-4

المؤلفون: Howard Lee Marks, Joy Liao, William Lo, Bruce Cory, Steven Kasapi

المصدر: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

مصطلحات موضوعية: Engineering, Computer science, business.industry, Design for testing, Scan chain, Laser modulation, Identification (information), Software, Chain (algebraic topology), Electronic engineering, Continuous wave, Isolation (database systems), business, Computer-aided software engineering, Frequency modulation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::13cdebc723701e1d58bd24f9e58dbc9a
https://doi.org/10.1109/ipfa.2012.6306326

المؤلفون: Howard Lee Marks, Roy Ng, William Lo, Joy Liao, Steven Kasapi, Bruce Cory

المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS).

مصطلحات موضوعية: Materials science, Silicon, business.industry, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Physics::Optics, chemistry.chemical_element, Perturbation (astronomy), Laser probing, Laser, law.invention, chemistry, CMOS, Photon emission, law, Optoelectronics, Photonics, business, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2ac890e5ba0afedb9b6dc69aa78541bd
https://doi.org/10.1109/irps.2012.6241782

المؤلفون: Richard Portune, Yin Shyang Ng, Joy Liao, Izak Kapilevich, Bruce Cory, Steven Kasapi, Elaine Cheng, Cathy Kardach

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Materials science, Volume (thermodynamics), business.industry, Yield (chemistry), Product (mathematics), Electrical Failure, Process engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bc4c368be727c8083e567482274a13b9
https://doi.org/10.31399/asm.cp.istfa2010p0038

المؤلفون: Howard Lee Marks, Joy Liao, Dmitry Skvortsov, Steven Kasapi, Yin S. Ng, Ted R. Lundquist

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Materials science, business.industry, law, Perspective (graphical), Optoelectronics, business, Laser, Voltage, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::496b7206aad00178f473abace782f74f
https://doi.org/10.31399/asm.cp.istfa2010p0005

المؤلفون: Yoshihisa Yamamoto, Steven Kasapi, Seema Lathi

المصدر: Optics letters. 21(19)

مصطلحات موضوعية: Distributed feedback laser, Materials science, Relative intensity noise, business.industry, Physics::Optics, Laser, Atomic and Molecular Physics, and Optics, law.invention, Interferometry, Optics, law, Reference beam, Laser beam quality, business, Frequency modulation, Noise (radio)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::76d12ae2ee16476e4c528a6776b26447
https://pubmed.ncbi.nlm.nih.gov/19881738

المؤلفون: Steven Kasapi, Kurt Gibble, Steven Chu

المصدر: Optics letters. 17(7)

مصطلحات موضوعية: Condensed Matter::Quantum Gases, Materials science, business.industry, Time constant, chemistry.chemical_element, Trapping, Laser, Atomic and Molecular Physics, and Optics, Boltzmann distribution, Magnetic field, law.invention, Optics, chemistry, law, Laser cooling, Caesium, Physics::Atomic Physics, business, Magneto

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9f552920321db896494fef82a2561847
https://pubmed.ncbi.nlm.nih.gov/19794547

المؤلفون: Franco Stellari, Radu Ispasoiu, Steven Kasapi, Jim Vickers, Chris Shaw, Peilin Song

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Materials science, business.industry, Silicon on insulator, Optoelectronics, business, Low voltage, Pica (typography)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a67b5966559bfdc22f0c995c6e0bdf19
https://doi.org/10.31399/asm.cp.istfa2008p0407

المؤلفون: Steven Kasapi, Gary Woods

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Materials science, Optics, Time resolved emission, business.industry, Voltage noise, business, Jitter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fd88899d5e4010b43f714eb3078f6ea7
https://doi.org/10.31399/asm.cp.istfa2006p0438

المؤلفون: Tung Ton, Chris Shaw, Steven Kasapi, Howard Lee Marks, Jeffrey A. Block

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Materials science, Time resolved emission, business.industry, Optical probing, Optoelectronics, Hardware_PERFORMANCEANDRELIABILITY, Graphics, business, PC Card

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eff850a1ab50060bca6e9007efe8990d
https://doi.org/10.31399/asm.cp.istfa2003p0036

المؤلفون: Jim Vickers, Steven Kasapi, Nader Pakdaman

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Materials science, Optics, Time-resolved photon emission, Debugging, business.industry, media_common.quotation_subject, business, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::16a216a26b36a54f53df8579624e8a43
https://doi.org/10.31399/asm.cp.istfa2002p0645

المؤلفون: William Lo, Steven Kasapi, Kenneth R. Wilsher

المصدر: ISTFA 2001: Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Materials science, Optics, law, business.industry, Laser, business, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::943f8ff81a736df9f79f846e2d5116d9
https://doi.org/10.31399/asm.cp.istfa2001p0033

المؤلفون: Mike Bruce, Charles Bachand, Victoria J. Bruce, Jeffrey A. Block, Shawn McBride, Greg Dabney, Steven Kasapi, Jason Mulig

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Materials science, Silicon, chemistry, business.industry, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, chemistry.chemical_element, Waveform, Hardware_PERFORMANCEANDRELIABILITY, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cf4d1adc4aba22ff681610a19ab3ef5c
https://doi.org/10.31399/asm.cp.istfa1999p0019

المؤلفون: William Lo, Steven Kasapi, Kenneth Wilsher

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.nptest.com/assets/about/pdf/probe_next_generation_optical_design_2001.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.196.62; http://www.nptest.com/assets/about/pdf/probe_next_generation_optical_design_2001.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.196.62
http://www.nptest.com/assets/about/pdf/probe_next_generation_optical_design_2001.pdf