المؤلفون: Luca Panarella, Ben Kaczer, Quentin Smets, Stanislav Tyaginov, Pablo Saraza Canflanca, Andrea Vici, Devin Verreck, Tom Schram, Dennis Lin, Theresia Knobloch, Tibor Grasser, César Lockhart de la Rosa, Gouri S. Kar, Valeri Afanas’ev

المصدر: npj 2D Materials and Applications, Vol 8, Iss 1, Pp 1-9 (2024)

مصطلحات موضوعية: Materials of engineering and construction. Mechanics of materials, TA401-492, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2397-7132

URL الوصول: https://doaj.org/article/4dc4c462dd604865a0278a59c121b370

المؤلفون: Stanislav Tyaginov, Erik Bury, Alexander Grill, Zhuoqing Yu, Alexander Makarov, An De Keersgieter, Mikhail Vexler, Michiel Vandemaele, Runsheng Wang, Alessio Spessot, Adrian Chasin, Ben Kaczer

المصدر: Micromachines, Vol 14, Iss 11, p 2018 (2023)

مصطلحات موضوعية: hot-carrier degradation, compact physics model, secondary carriers, impact ionization, interface traps, carrier transport, Mechanical engineering and machinery, TJ1-1570

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2072-666X/14/11/2018; https://doaj.org/toc/2072-666X

URL الوصول: https://doaj.org/article/a89ea25261ac49ac9cd9be88b909e5f2

المؤلفون: Stanislav Tyaginov, Barry O’Sullivan, Adrian Chasin, Yaksh Rawal, Thomas Chiarella, Camila Toledo de Carvalho Cavalcante, Yosuke Kimura, Michiel Vandemaele, Romain Ritzenthaler, Jerome Mitard, Senthil Vadakupudhu Palayam, Jason Reifsnider, Ben Kaczer

المصدر: Micromachines, Vol 14, Iss 8, p 1514 (2023)

مصطلحات موضوعية: bias temperature instability, hard breakdown, nitridation, nitrogen content, nitrided oxide, ramped voltages stress, Mechanical engineering and machinery, TJ1-1570

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2072-666X/14/8/1514; https://doaj.org/toc/2072-666X

URL الوصول: https://doaj.org/article/159b72733fdd4cceaa85f3f66d7c71b7

المؤلفون: Alexander Makarov, Philippe Roussel, Erik Bury, Michiel Vandemaele, Alessio Spessot, Dimitri Linten, Ben Kaczer, Stanislav Tyaginov

المصدر: Micromachines, Vol 11, Iss 7, p 657 (2020)

مصطلحات موضوعية: hot-carrier degradation, random dopants, variability, physical modeling, FinFETs, carrier transport, Mechanical engineering and machinery, TJ1-1570

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2072-666X/11/7/657; https://doaj.org/toc/2072-666X

URL الوصول: https://doaj.org/article/de1e1038d00446ea9940a4a755f0a572

المؤلفون: Michiel Vandemaele, Kai-Hsin Chuang, Erik Bury, Stanislav Tyaginov, Guido Groeseneken, Ben Kaczer

مصطلحات موضوعية: Hot-carrier degradation, anneal, recovery, Pb-centers

Relation: https://zenodo.org/communities/eu; https://doi.org/10.5281/zenodo.4085166; https://doi.org/10.5281/zenodo.4085167; oai:zenodo.org:4085167

الاتاحة: https://doi.org/10.5281/zenodo.4085167

المؤلفون: Stanislav Tyaginov, Alexander Makarov, Erik Bury, Michiel Vandemaele, Markus Jech, Alexander Grill, An De Keersgieter, Dimitri Linten, Ben Kaczer

مصطلحات موضوعية: Hot-carrier degradation, self-heating, transport, interface states, NWFET, modeling

Relation: https://zenodo.org/communities/eu; https://doi.org/10.5281/zenodo.4085053; https://doi.org/10.5281/zenodo.4085054; oai:zenodo.org:4085054

الاتاحة: https://doi.org/10.5281/zenodo.4085054

المؤلفون: Alexander Vasilev, Markus Jech, Alexander Grill, Gerhard Rzepa, Christian Schleich, Stanislav Tyaginov, Alexander Makarov, Gregor Pobegen, Tibor Grasser, Michael Waltl

المصدر: IEEE Transactions on Electron Devices. 69:3290-3295

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f9ecef773b3d043274bf58051ebe9c84
https://doi.org/10.1109/ted.2022.3166123

المؤلفون: Al-Moatasem El-Sayed, Markus Jech, Dominic Waldhör, Alexander Makarov, Mikhail I. Vexler, Stanislav Tyaginov

المصدر: Physical Review Materials. 6

مصطلحات موضوعية: Physics and Astronomy (miscellaneous), General Materials Science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::242e4e47c6b80059e41bcb604f13ee3d
https://doi.org/10.1103/physrevmaterials.6.125002

المؤلفون: Stanislav Tyaginov, A. Grill, Kookjin Lee, Robin Degraeve, Mario Gonzalez, Ingrid De Wolf, Anastasiia Kruv, Ben Kaczer

المصدر: IEEE Electron Device Letters. 42:1424-1427

مصطلحات موضوعية: Materials science, Transistor, Finite element method, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), Impact ionization, Gate oxide, law, Logic gate, MOSFET, Nanoindenter, Electrical and Electronic Engineering, Composite material

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8b602c7940d456832c96be66dbcefa00
https://doi.org/10.1109/led.2021.3104885

المؤلفون: Stanislav Tyaginov, Jacopo Franco, Michiel Vandemaele, Ben Kaczer, Guido Groeseneken

المصدر: IEEE Transactions on Electron Devices. 68:1454-1460

مصطلحات موضوعية: Technology, Materials science, Passivation, Applied physics, Annealing (metallurgy), Gaussian, 01 natural sciences, Temperature measurement, Molecular physics, Dissociation (chemistry), Physics, Applied, Stress (mechanics), recovery, symbols.namesake, Engineering, 0103 physical sciences, Bulk CMOS technology, Electrical and Electronic Engineering, 010302 applied physics, hot-carrier (HC) degradation, Science & Technology, Hydrogen bond, Physics, Engineering, Electrical & Electronic, poly-Si heater, Si-H bond, Electronic, Optical and Magnetic Materials, Physical Sciences, symbols, high temperature anneal

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fea5e1d486cee1e0c09ef8e302ab1ba4
https://doi.org/10.1109/ted.2021.3061025

المؤلفون: Adrian Chasin, Dimitri Linten, Tibor Grasser, Al-Moatasem El-Sayed, Stanislav Tyaginov, Geert Hellings, Philippe Roussel, Alexander Makarov, Ben Kaczer, A. Grill, Michiel Vandemaele

المصدر: IEEE Electron Device Letters

مصطلحات موضوعية: interface traps, Technology, FinFETs, Materials science, Extrapolation, physical modeling, 01 natural sciences, law.invention, Stress (mechanics), Engineering, law, 0103 physical sciences, Electrical and Electronic Engineering, 010302 applied physics, Science & Technology, carrier transport, Dopant, random dopants, Hot-carrier degradation, Doping, Transistor, Engineering, Electrical & Electronic, FLUCTUATIONS, Electronic, Optical and Magnetic Materials, Computational physics, Distribution (mathematics), 13. Climate action, Degradation (geology), Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c3a95dba4fadfd42c538b95a6472f42a
https://doi.org/10.1109/led.2019.2913625

المؤلفون: Foudhil Bouakline, Michael Waltl, Christoph Jungemann, Dominic Jabs, Al-Moatasem El-Sayed, Dominic Waldhör, Peter Saalfrank, M. Jech, Tibor Grasser, Stanislav Tyaginov

المصدر: Physical Review Applied. 16

مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, Condensed matter physics, business.industry, General Physics and Astronomy, chemistry.chemical_element, Non-equilibrium thermodynamics, 02 engineering and technology, Semiconductor device, 021001 nanoscience & nanotechnology, 01 natural sciences, Quantum chemistry, chemistry, 0103 physical sciences, MOSFET, Microelectronics, Charge carrier, 0210 nano-technology, business, Quantum

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ce536e1866291f25adb1b5452c358c31
https://doi.org/10.1103/physrevapplied.16.014026

المؤلفون: Erik Bury, Y. Xiang, Jacopo Franco, Michiel Vandemaele, Stanislav Tyaginov, Bertrand Parvais, Ben Kaczer, Z. Wu, Dimitri Linten, Brecht Truijen

المساهمون: Faculty of Economic and Social Sciences and Solvay Business School, Teacher Education, Electronics and Informatics, Electricity

المصدر: IRPS

مصطلحات موضوعية: SPICE, Computer science, Transistor, Spice, power-performance, BSIM, law.invention, Threshold voltage, Reliability (semiconductor), law, compact model, Scalability, Electronic engineering, Transient (oscillation), Hot Carrier Degradation (HCD), Engineering(all), Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1053241c64c305f200b7d60a27939559
https://doi.org/10.1109/irps46558.2021.9405222

المؤلفون: Z. Wu, Hans Mertens, Ben Kaczer, Jacopo Franco, Guido Groeseneken, Robin Degraeve, Adrian Chasin, Stanislav Tyaginov, Michiel Vandemaele, Erik Bury, Y. Xiang

المصدر: IRPS

مصطلحات موضوعية: Technology, Materials science, Engineering, Multidisciplinary, 02 engineering and technology, Series and parallel circuits, interface defects, 01 natural sciences, Physics, Applied, law.invention, Stress (mechanics), Engineering, law, MOSFETS, 0103 physical sciences, VOLTAGE, CHARGES, 010302 applied physics, Science & Technology, TCAD, Physics, Hot-carrier degradation, Transistor, Engineering, Electrical & Electronic, DEGRADATION, PERFORMANCE, 021001 nanoscience & nanotechnology, Exponential function, Threshold voltage, Physical Sciences, Degradation (geology), Field-effect transistor, simulations, 0210 nano-technology, Biological system, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b1d76e54b9272bfdcf63c0c778b434b
https://doi.org/10.1109/irps46558.2021.9405164

المؤلفون: Gerhard Rzepa, Michael Waltl, Alexander Makarov, A. Grill, Christian Schleich, Tibor Grasser, Alexander Vasilev, Stanislav Tyaginov, Gregor Pobegen, M. Jech

المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW).

مصطلحات موضوعية: 010302 applied physics, Range (particle radiation), Materials science, Condensed matter physics, Electron capture, Oxide, Charge (physics), 02 engineering and technology, Atmospheric temperature range, 021001 nanoscience & nanotechnology, 01 natural sciences, chemistry.chemical_compound, Hysteresis, chemistry, 0103 physical sciences, MOSFET, Silicon carbide, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::02c92c48ab45b1e7a94b6da29781caca
https://doi.org/10.1109/iirw49815.2020.9312864

المؤلفون: M. Jech, Erik Bury, Adrian Chasin, D. Linten, B. Kaczer, Stanislav Tyaginov, Michiel Vandemaele, A. Grill, Alexander Makarov, A. De Keersgieter

المصدر: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: 010302 applied physics, Materials science, Transistor, Nanowire, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Molecular physics, Boltzmann equation, Dissociation (chemistry), law.invention, Distribution function, law, Lattice (order), 0103 physical sciences, Thermal, Heat equation, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b8f75f553e4cabed21d8894599e2f9ba
https://doi.org/10.1109/ipfa49335.2020.9260648

المؤلفون: Michiel Vandemaele, Geert Hellings, M. Jech, A. Grill, Dimitri Linten, Tibor Grasser, Alexander Makarov, Stanislav Tyaginov, Ben Kaczer

المصدر: IRPS
2020 IEEE International Reliability Physics Symposium (IRPS)

مصطلحات موضوعية: 010302 applied physics, Reliability (semiconductor), Analytical expressions, 0103 physical sciences, Stress time, 02 engineering and technology, Mechanics, 021001 nanoscience & nanotechnology, 0210 nano-technology, Drain current, 01 natural sciences, Hot carrier degradation, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5cd2ae99c6b0a1548859cd1e39f6b96
https://doi.org/10.1109/irps45951.2020.9128327

المؤلفون: Geert Hellings, Tibor Grasser, Mikhail I. Vexler, Stanislav Tyaginov, D. Linten, Adrian Chasin, M. Jech, A. Grill, B. Kaczer, Alexander Makarov

المصدر: Semiconductors. 52:1738-1742

مصطلحات موضوعية: 010302 applied physics, Materials science, Fin, business.industry, Transistor, Gate length, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Semiconductor, law, 0103 physical sciences, Optoelectronics, Degradation (geology), Stress conditions, 0210 nano-technology, business, Hot carrier degradation, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a37e36de0f372c38dbc0d9795b2e7e97
https://doi.org/10.1134/s1063782618130183

المؤلفون: Tibor Grasser, B. Kaczer, M. Jech, Mikhail I. Vexler, Alexander Makarov, D. Linten, A. Grill, Geert Hellings, Stanislav Tyaginov, Adrian Chasin

المصدر: Semiconductors. 52:1298-1302

مصطلحات موضوعية: 010302 applied physics, Materials science, Energy distribution, business.industry, Transistor, 02 engineering and technology, Semiconductor device, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Boltzmann equation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Planar, law, 0103 physical sciences, Optoelectronics, Degradation (geology), 0210 nano-technology, business, Hot carrier degradation, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1c3032ffcf509cbc273fd8f2e06eabaf
https://doi.org/10.1134/s1063782618100081

المؤلفون: Jacopo Franco, Stanislav Tyaginov, M. Jech, Alexander Makarov, Tibor Grasser, Mikhail I. Vexler, Ben Kaczer

المصدر: Semiconductors. 52:242-247

مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, Condensed matter physics, Transistor, chemistry.chemical_element, 02 engineering and technology, Semiconductor device, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Impact ionization, chemistry, law, Ionization, 0103 physical sciences, Field-effect transistor, Charge carrier, 0210 nano-technology, Electronic band structure

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fd45c2d23bb57b51ba3606bdad3756e8
https://doi.org/10.1134/s1063782618020203