المؤلفون: Fang, L., Stals, L.

مصطلحات موضوعية: Mathematics - Numerical Analysis, 65D10, 65N50, 65N30

URL الوصول: http://arxiv.org/abs/2302.10442

المؤلفون: Agullo E., Altenbernd M., Anzt H., Bautista-Gomez L., Benacchio T., Bonaventura L., Bungartz H. -J., Chatterjee S., Ciorba F. M., DeBardeleben N., Drzisga D., Eibl S., Engelmann C., Gansterer W. N., Giraud L., Goddeke D., Heisig M., Jezequel F., Kohl N., Li X. S., Lion R., Mehl M., Mycek P., Obersteiner M., Quintana-Orti E. S., Rizzi F., Rude U., Schulz M., Fung F., Speck R., Stals L., Teranishi K., Thibault S., Thonnes D., Wagner A., Wohlmuth B.

المساهمون: Agullo, E., Altenbernd, M., Anzt, H., Bautista-Gomez, L., Benacchio, T., Bonaventura, L., Bungartz, H. -J., Chatterjee, S., Ciorba, F. M., Debardeleben, N., Drzisga, D., Eibl, S., Engelmann, C., Gansterer, W. N., Giraud, L., Goddeke, D., Heisig, M., Jezequel, F., Kohl, N., Li, X. S., Lion, R., Mehl, M., Mycek, P., Obersteiner, M., Quintana-Orti, E. S., Rizzi, F., Rude, U., Schulz, M., Fung, F., Speck, R., Stals, L., Teranishi, K., Thibault, S., Thonnes, D., Wagner, A., Wohlmuth, B.

مصطلحات موضوعية: fault tolerance, Numerical algorithms, parallel computer architecture, resilience

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000730172300001; volume:36; issue:2; firstpage:251; lastpage:285; numberofpages:35; journal:INTERNATIONAL JOURNAL OF HIGH PERFORMANCE COMPUTING APPLICATIONS; http://hdl.handle.net/11311/1202623; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85121347479

الاتاحة: http://hdl.handle.net/11311/1202623
https://doi.org/10.1177/10943420211055188

المؤلفون: Agullo, E., Altenbernd, M., Anzt, H., Bautista-Gomez, L., Benacchio, T., Bonaventura, L., Bungartz, H.-J., Chatterjee, S., Ciorba, F. M., DeBardeleben, N., Drzisga, D., Eibl, S., Engelmann, C., Gansterer, W. N., Giraud, L., Göddeke, D., Heisig, M., Jézéquel, F., Kohl, N., Li, X. S., Lion, R., Mehl, M., Mycek, P., Obersteiner, M., Quintana-Ortí, E. S., Rizzi, F., Rüde, U., Schulz, M., Fung, F., Speck, R., Stals, L., Teranishi, K., Thibault, S., Thönnes, D., Wagner, A., Wohlmuth, B.

المصدر: International Journal of High Performance Computing Applications, 36 (2), 251-285 ; ISSN: 1094-3420, 1078-3482, 1741-2846

مصطلحات موضوعية: ddc:510, Mathematics, info:eu-repo/classification/ddc/510

Relation: info:eu-repo/semantics/altIdentifier/wos/000730172300001; info:eu-repo/semantics/altIdentifier/issn/1094-3420; info:eu-repo/semantics/altIdentifier/issn/1078-3482; info:eu-repo/semantics/altIdentifier/issn/1741-2846; https://publikationen.bibliothek.kit.edu/1000141587

الاتاحة: https://publikationen.bibliothek.kit.edu/1000141587

المؤلفون: Larson, J.W., Hegland, M., Harding, B., Roberts, S., Stals, L., Rendell, A.P., Strazdins, P., Ali, M.M., Kowitz, C., Nobes, R., Southern, J., Wilson, N., Li, M., Oishi, Y.

المساهمون: Alexandrov, V., Lees, M., Krzhizhanovskaya, V., Dongarra, J., Sloot, P.M.A., International Conference on Computational Science (ICCS) (5 Jun 2013 - 7 Jun 2013 : Barcelona, Spain)

المصدر: http://dx.doi.org/10.1016/j.procs.2013.05.176.

مصطلحات موضوعية: Parallel computing, partial differential equations, fault-tolerance, sparse grids, MapReduce

وصف الملف: application/pdf

Relation: Procedia Computer Science; http://purl.org/au-research/grants/arc/LP110200410; Procedia Computer Science, 2013 / Alexandrov, V., Lees, M., Krzhizhanovskaya, V., Dongarra, J., Sloot, P.M.A. (ed./s), vol.18, iss.Special issue, pp.130-139; http://hdl.handle.net/2440/120126; Harding, B. [0000-0002-6755-9998]

الاتاحة: http://hdl.handle.net/2440/120126
https://doi.org/10.1016/j.procs.2013.05.176

المؤلفون: Gani, J., Stals, L.

المصدر: The ANZIAM Journal ; volume 48, issue 3, page 409-418 ; ISSN 1446-1811 1446-8735

الاتاحة: http://dx.doi.org/10.1017/s1446181100003576
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1446181100003576

المؤلفون: Knuyt, G., Stulens, H., Ceuninck, W. De, Bex, G. J., Stals, L. M.

المصدر: Philosophical Magazine B ; volume 65, issue 5, page 1053-1065 ; ISSN 1364-2812 1463-6417

الاتاحة: http://dx.doi.org/10.1080/13642819208217920
https://www.tandfonline.com/doi/pdf/10.1080/13642819208217920

المؤلفون: Stulens, H., Knuyt, G., de Ceuninck, W., Stals, L. M.

المصدر: Philosophical Magazine B ; volume 66, issue 5, page 601-613 ; ISSN 1364-2812 1463-6417

الاتاحة: http://dx.doi.org/10.1080/13642819208207663
https://www.tandfonline.com/doi/pdf/10.1080/13642819208207663

المؤلفون: D'Olieslaeger, M., Knuyt, G., De Schepper, L., Stals, L. M.

المصدر: Philosophical Magazine B ; volume 63, issue 6, page 1335-1341 ; ISSN 1364-2812 1463-6417

الاتاحة: http://dx.doi.org/10.1080/13642819108205565
https://www.tandfonline.com/doi/pdf/10.1080/13642819108205565

المؤلفون: D'Olieslaeger, M., Knuyt, G., De Scheppery, L., Stals, L. M.

المصدر: Philosophical Magazine B ; volume 63, issue 6, page 1321-1334 ; ISSN 1364-2812 1463-6417

الاتاحة: http://dx.doi.org/10.1080/13642819108205564
https://www.tandfonline.com/doi/pdf/10.1080/13642819108205564

المؤلفون: Knuyt, G., de Schepper, L., Stals, L. M.

المصدر: Philosophical Magazine B ; volume 61, issue 6, page 965-988 ; ISSN 1364-2812 1463-6417

الاتاحة: http://dx.doi.org/10.1080/13642819008207856
https://www.tandfonline.com/doi/pdf/10.1080/13642819008207856

المؤلفون: Haenen, K., Rouleau, J. F., Nesla´dek, M., Goyette, J., Stals, L. M., Bose, T. K.

المصدر: Journal of Applied Physics; 5/15/2002 Part 1, 2 & 3, Vol. 91 Issue 10, p6670, 5p, 2 Charts, 4 Graphs

مصطلحات موضوعية: MICROWAVE plasmas, OXIDATION, HYDROGENATION

المؤلفون: Paulus, M., Stals, L.

المصدر: Journal of Applied Physics. 1/15/1999, Vol. 85 Issue 2, p761. 6p. 8 Graphs.

مصطلحات موضوعية: *PLASMA gases, *ION implantation

المؤلفون: Stulens, H., Knuyt, G., De Ceuninck, W., De Schepper, L., Stals, L.

المصدر: Journal of Applied Physics; 2/15/1994, Vol. 75 Issue 4, p2270, 8p

مصطلحات موضوعية: ATMOSPHERIC temperature, ALUMINUM compounds, SILICON compounds

المؤلفون: Cosemans, P., D'Olieslaeger, M., de Ceuninck, W., de Schepper, L., Stals, L.

المصدر: Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; page 1699-1702

الاتاحة: http://dx.doi.org/10.1109/esref.1996.888195
http://xplorestaging.ieee.org/ielx5/7119/19180/00888195.pdf?arnumber=888195

المؤلفون: Czech, I., Manea, J., Roggen, J., Huyberechts, G., Stals, L., De Schepper, L.

المصدر: Proceedings of International Conference on Microelectronic Test Structures ; page 99-103

الاتاحة: http://dx.doi.org/10.1109/icmts.1996.535628
http://xplorestaging.ieee.org/ielx3/3839/11206/00535628.pdf?arnumber=535628

المؤلفون: Paulus, M., Rauschenbach, B., Stals, L., Rude, U.

المصدر: 1998 International Conference on Ion Implantation Technology. Proceedings (Cat. No.98EX144) ; volume 2, page 1187-1190

الاتاحة: http://dx.doi.org/10.1109/iit.1998.813896
http://xplorestaging.ieee.org/ielx5/6566/17623/00813896.pdf?arnumber=813896

المؤلفون: Stals, L.

المصدر: Proceedings 1st International Conference on Algorithms and Architectures for Parallel Processing ; volume 2, page 792-795

الاتاحة: http://dx.doi.org/10.1109/icapp.1995.472269
http://xplorestaging.ieee.org/ielx2/3315/9948/00472269.pdf?arnumber=472269

المؤلفون: Stals, L., Paulus, M., Rauschenbach, Bernd (Prof.), Rüde, U.

Relation: https://opus.bibliothek.uni-augsburg.de/opus4/frontdoor/index/index/docId/25944; https://doi.org/10.1142/9789814528412

الاتاحة: https://opus.bibliothek.uni-augsburg.de/opus4/frontdoor/index/index/docId/25944
https://doi.org/10.1142/9789814528412

المؤلفون: Gani, J., Stals, L.

المصدر: Environmetrics ; volume 15, issue 6, page 555-560 ; ISSN 1180-4009 1099-095X

الاتاحة: http://dx.doi.org/10.1002/env.646
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fenv.646
https://onlinelibrary.wiley.com/doi/pdf/10.1002/env.646

المؤلفون: Vancoille, E., Celis, J.P., Stals, L., Roos, J.R.

المصدر: Wear Particles: Frorn the Cradle to the Grave, Proceedings of the 18th Leeds-Lyon Symposium on Tribology ; Tribology Series ; page 193-202 ; ISSN 0167-8922 ; ISBN 9780444893369

الاتاحة: http://dx.doi.org/10.1016/s0167-8922(08)70524-8