المؤلفون: Stéphane Lefebvre

المصدر: The Journal of Intelligence, Conflict and Warfare, Vol 7, Iss 2 (2024)

مصطلحات موضوعية: Geoeconomics, National Security, Strategy, International relations, JZ2-6530

وصف الملف: electronic resource

Relation: https://journals.lib.sfu.ca/index.php/jicw/article/view/6699; https://doaj.org/toc/2561-8229

URL الوصول: https://doaj.org/article/6f84b4c5b58847dbb997b52e0fc19cff

المؤلفون: Briac Baudais, Hamid Ben Ahmed, Gurvan Jodin, Nicolas Degrenne, Stéphane Lefebvre

المصدر: Energies, Vol 16, Iss 5, p 2192 (2023)

مصطلحات موضوعية: power electronics, inverter, life cycle assessment, environmental impacts, eco-design, Technology

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1996-1073/16/5/2192; https://doaj.org/toc/1996-1073

URL الوصول: https://doaj.org/article/c2af5f1242a5425e872263fa4f24bdc3

المؤلفون: Stéphane Lefebvre

المصدر: The Windsor Yearbook of Access to Justice, Vol 31, Iss 1 (2013)

مصطلحات موضوعية: Law, Law in general. Comparative and uniform law. Jurisprudence, K1-7720

وصف الملف: electronic resource

Relation: https://wyaj.uwindsor.ca/index.php/wyaj/article/view/4312; https://doaj.org/toc/2561-5017

URL الوصول: https://doaj.org/article/e00f934e65ad4350821a833a35bc8d11

المؤلفون: Stéphane Lefebvre

المصدر: The Windsor Yearbook of Access to Justice, Vol 30, Iss 1 (2012)

مصطلحات موضوعية: Law, Law in general. Comparative and uniform law. Jurisprudence, K1-7720

وصف الملف: electronic resource

Relation: https://wyaj.uwindsor.ca/index.php/wyaj/article/view/4366; https://doaj.org/toc/2561-5017

URL الوصول: https://doaj.org/article/2a5256aec93d4b7ba1716ce01088ef20

المؤلفون: Stéphane Lefebvre

المساهمون: Association française de science politique, Fondation nationale des sciences politiques (France)

المصدر: Revue française de science politique 40(4):607-622

URL الوصول: http://www.persee.fr/doc/rfsp_0035-2950_1990_num_40_4_394500

المؤلفون: Stephane Lefebvre

المصدر: Secrecy and Society, Vol 2, Iss 2 (2021)

مصطلحات موضوعية: disclosure, government secrecy, literature review, secrecy, state secrets, Law, Social Sciences

Relation: https://scholarworks.sjsu.edu/secrecyandsociety/vol2/iss2/9/; https://doaj.org/toc/2377-6188; https://doaj.org/article/cd61eb20eb644f318e05797dd081b43b

الاتاحة: https://doaj.org/article/cd61eb20eb644f318e05797dd081b43b

المؤلفون: Stephane Lefebvre

المصدر: Secrecy and Society, Vol 2, Iss 2 (2021)

مصطلحات موضوعية: analogy, discourse, ignorance, knowledge, rhetoricaldevices, secrecy, state secrets, temporality, Law, Social Sciences

Relation: https://scholarworks.sjsu.edu/secrecyandsociety/vol2/iss2/6/; https://doaj.org/toc/2377-6188; https://doaj.org/article/db43d6a236bb4ff793ae9ef0477abdf5

الاتاحة: https://doaj.org/article/db43d6a236bb4ff793ae9ef0477abdf5

المؤلفون: Stéphane Lefebvre

المصدر: Intelligence and National Security. 38:309-311

مصطلحات موضوعية: History, Political Science and International Relations

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a3022b925dec89055460e5883abb2d80
https://doi.org/10.1080/02684527.2022.2040833

المؤلفون: Stéphane Lefebvre

المصدر: Journal of Policing, Intelligence and Counter Terrorism. 16:92-103

مصطلحات موضوعية: 021110 strategic, defence & security studies, Knowledge management, business.industry, 05 social sciences, Political Science and International Relations, 050501 criminology, 0211 other engineering and technologies, Key (cryptography), 02 engineering and technology, Sociology, business, Law, 0505 law

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::05297b61422b0d8431574efd5787999a
https://doi.org/10.1080/18335330.2021.1880020

المؤلفون: Stéphane Lefebvre, Christophe Marvillet

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6a285e5ead17cd3cfd2d944f266b009d
https://doi.org/10.3917/ems.cappe.2022.01.0094

المؤلفون: Laurent Cappelletti, Pascale Heurtel, Stéphane Lefebvre

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2dd0689c617e8770bdad0228703fe1cb
https://doi.org/10.3917/ems.cappe.2022.01.0262

المؤلفون: Laurent Cappelletti, Pascale Heurtel, Stéphane Lefebvre

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::95f47b0a75f84b10ff6f1c482641e760
https://doi.org/10.3917/ems.cappe.2022.01.0131

المؤلفون: Laurent Cappelletti, Pascale Heurtel, Stéphane Lefebvre

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::def4d7724d93ed8e6e0a28847bc5bc25
https://doi.org/10.3917/ems.cappe.2022.01.0020

المؤلفون: Laurent Cappelletti, Pascale Heurtel, Stéphane Lefebvre

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ee828cec19f849d24ce96e9264a60415
https://doi.org/10.3917/ems.cappe.2022.01.0016

المؤلفون: Laurent Cappelletti, Stéphane Lefebvre, Pascale Heurtel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::960ccaf68666ac4b042497a2377823d2
https://doi.org/10.3917/ems.cappe.2022.01

المؤلفون: Stéphane Lefebvre, Mickael Petit, Mounira Berkani, S. Bensebaa

المساهمون: Systèmes et Applications des Technologies de l'Information et de l'Energie (SATIE), École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)

المصدر: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2021, pp.114313. ⟨10.1016/j.microrel.2021.114313⟩

مصطلحات موضوعية: Test bench, Materials science, business.industry, 020208 electrical & electronic engineering, Electrical engineering, 02 engineering and technology, AC power, Condensed Matter Physics, Temperature measurement, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, [SPI]Engineering Sciences [physics], 0202 electrical engineering, electronic engineering, information engineering, Power cycling, Junction temperature, Power semiconductor device, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, ComputingMilieux_MISCELLANEOUS, Diode, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::79cca8f739d8cc361186123c8bdca528
https://hal.archives-ouvertes.fr/hal-03380506

المؤلفون: Éric Florentin, Laurent Fribourg, Ulrich Kühne, Stéphane Lefebvre, Christian Rey, École Normale, Supérieure Cachan, Eric Florentin, Stephane Lefebvre

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.lsv.ens-cachan.fr/Publis/RAPPORTS_LSV/PDF/rr-lsv-2011-18.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.396.9839; http://www.lsv.ens-cachan.fr/Publis/RAPPORTS_LSV/PDF/rr-lsv-2011-18.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.396.9839
http://www.lsv.ens-cachan.fr/Publis/RAPPORTS_LSV/PDF/rr-lsv-2011-18.pdf

المؤلفون: Tien Anh Nguyen, Stéphane Lefebvre, Stéphane Azzopardi, Gérard Chaplier

المصدر: Microelectronics Reliability. 138:114694

مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ea04bbb9d2859478c9645c53844927c8
https://doi.org/10.1016/j.microrel.2022.114694

المؤلفون: Christelle Saber, Marwan Ali, Rita Mattar, Stéphane Lefebvre, Cyrille Gautier, Mickael Petit, Eric Monmasson

المساهمون: Safran Tech, Conservatoire National des Arts et Métiers [CNAM] (CNAM), Systèmes et Applications des Technologies de l'Information et de l'Energie (SATIE), École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY), CY Cergy Paris Université (CY), Electronique de Puissance et Intégration (SATIE-EPI), Composants et Systèmes pour l'Energie Electrique (CSEE), École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)-École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)-Systèmes et Applications des Technologies de l'Information et de l'Energie (SATIE), École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)-École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY), SAFRAN Group

المصدر: 2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe), Sep 2020, Lyon, France. pp.1-10, ⟨10.23919/EPE20ECCEEurope43536.2020.9215700⟩

مصطلحات موضوعية: Current distribution, Computer science, 020209 energy, 020208 electrical & electronic engineering, Open-loop controller, 02 engineering and technology, Two stages, Inductive coupling, law.invention, [SPI]Engineering Sciences [physics], law, Control theory, Electrical network, 0202 electrical engineering, electronic engineering, information engineering, ICTS, Transformer, ComputingMilieux_MISCELLANEOUS, Parametric statistics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2c006e2eae1b680d8fae4d109e6e90a2
https://hal.archives-ouvertes.fr/hal-03339355

المؤلفون: V. Bolgova, Stéphane Lefebvre, Sami Hlioui, S. Kolesnikov, A. A. Leonov

المصدر: 2020 IEEE 3rd International Conference on Dielectrics (ICD).

مصطلحات موضوعية: Materials science, 020209 energy, 020208 electrical & electronic engineering, Wide-bandgap semiconductor, 02 engineering and technology, Impulse (physics), Temperature measurement, law.invention, Twisted pair, Optical microscope, law, Electric field, 0202 electrical engineering, electronic engineering, information engineering, Light emission, Composite material, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d4034da9518544776c356ed4769e83c6
https://doi.org/10.1109/icd46958.2020.9341983