المؤلفون: Matana Luza, Lucas, Ruospo, Annachiara, Soderstrom, Daniel, Cazzaniga, Carlo, Kastriotou, Maria, Sanchez, Ernesto, Bosio, Alberto, Dilillo, Luigi

المساهمون: Test and dEpendability of microelectronic integrated SysTems (LIRMM, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Politecnico di Torino = Polytechnic of Turin (Polito), University of Jyväskylä (JYU), ISIS Neutron and Muon Source (ISIS), STFC Rutherford Appleton Laboratory (RAL), Science and Technology Facilities Council (STFC)-Science and Technology Facilities Council (STFC), Science and Technology Facilities Council (STFC), INL - Conception de Systèmes Hétérogènes (INL - CSH), Institut des Nanotechnologies de Lyon (INL), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 2168-6750 ; IEEE Transactions on Emerging Topics in Computing ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380 ; IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882. ⟨10.1109/TETC.2021.3116999⟩.

مصطلحات موضوعية: Approximate methods, Fault injection, Radiation effects, Neural nets, Reliability, [SPI.TRON]Engineering Sciences [physics]/Electronics, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

Relation: lirmm-03382380; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380/document; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380/file/2021___TETC___Emulating_the_Effects_of_Radiation_Induced_Soft_Errors_for_the_Reliability_Assessment_of_Neural_Networks___HAL_Version.pdf

الاتاحة: https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380/file/2021___TETC___Emulating_the_Effects_of_Radiation_Induced_Soft_Errors_for_the_Reliability_Assessment_of_Neural_Networks___HAL_Version.pdf
https://doi.org/10.1109/TETC.2021.3116999

المؤلفون: Soderstrom, Daniel, Matana Luza, Lucas, Kettunen, Heikki, Javanainen, Arto, Farabolini, Wilfrid, Gilardi, Antonino, Coronetti, Andrea, Poivey, Christian, Dilillo, Luigi

المساهمون: Department of Physics Jyväskylä Univ (JYU), University of Jyväskylä (JYU), Test and dEpendability of microelectronic integrated SysTems (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), CERN Genève, European Organization for Nuclear Research (CERN), Agence Spatiale Européenne = European Space Agency (ESA)

المصدر: NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03028881 ; NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States ; http://www.nsrec.com/

مصطلحات موضوعية: [SPI.TRON]Engineering Sciences [physics]/Electronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems

جغرافية الموضوع: Santa Fe (virtual), United States

Relation: lirmm-03028881; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03028881; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03028881/document; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03028881/file/2020___NSREC___Electron_induced_upsets_and_stuck_bits_in_SDRAM___HAL_Version.pdf

الاتاحة: https://hal-lirmm.ccsd.cnrs.fr/lirmm-03028881
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03028881/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03028881/file/2020___NSREC___Electron_induced_upsets_and_stuck_bits_in_SDRAM___HAL_Version.pdf

المؤلفون: Matana Luza, Lucas, Soderstrom, Daniel, Tsiligiannis, Georgios, Puchner, Helmut, Cazzaniga, Carlo, Sanchez, Ernesto, Bosio, Alberto, Dilillo, Luigi

المساهمون: Test and dEpendability of microelectronic integrated SysTems (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Department of Physics Jyväskylä Univ (JYU), University of Jyväskylä (JYU), Radiations et composants (RADIAC), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Cypress Semiconductor San Jose, STFC Rutherford Appleton Laboratory (RAL), Science and Technology Facilities Council (STFC), Politecnico di Torino = Polytechnic of Turin (Polito), École Centrale de Lyon (ECL), Université de Lyon, INL - Conception de Systèmes Hétérogènes (INL - CSH), Institut des Nanotechnologies de Lyon (INL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)

المصدر: DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736 ; DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩

مصطلحات موضوعية: Neutrons, Radiation effects, Software, Resilience, Reliability, Approximate computing, Hardware, [SPI.TRON]Engineering Sciences [physics]/Electronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems

جغرافية الموضوع: Frascati, Italy

Relation: lirmm-03025736; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736/document; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736/file/2020_DFTS____HAL_Version__Investigating_the_Impact_of_Radiation_Induced_Soft_Errors_on_the_Reliability_of_Approximate_Computing_Systems.pdf

الاتاحة: https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736/file/2020_DFTS____HAL_Version__Investigating_the_Impact_of_Radiation_Induced_Soft_Errors_on_the_Reliability_of_Approximate_Computing_Systems.pdf
https://doi.org/10.1109/DFT50435.2020.9250865

المؤلفون: Matana Luza, Lucas, Soderstrom, Daniel, Puchner, Helmut, Alia, Ruben Garcia, Letiche, Manon, Bosio, Alberto, Dilillo, Luigi

المساهمون: Test and dEpendability of microelectronic integrated SysTems (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Department of Physics Jyväskylä Univ (JYU), University of Jyväskylä (JYU), Cypress Semiconductor San Jose, CERN Genève, Institut Laue-Langevin (ILL), INL - Conception de Systèmes Hétérogènes (INL - CSH), Institut des Nanotechnologies de Lyon (INL), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), ANR-10-AIRT-0005,NANOELEC,NANOELEC(2010)

المصدر: DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025721 ; DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩

مصطلحات موضوعية: [SPI.TRON]Engineering Sciences [physics]/Electronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems

جغرافية الموضوع: Marrakech, Morocco

الاتاحة: https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025721
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025721v1/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025721v1/file/2020_DTIS____HAL_Version__Effects_of_Thermal_Neutron_Irradiation_on_a_Self_Refresh_DRAM.pdf
https://doi.org/10.1109/DTIS48698.2020.9080918

المؤلفون: Coronetti, Andrea, Alia, Ruben Garcia, Budroweit, Jan, Rajkowski, Tomasz, Costa Lopes, Israel Da, Niskanen, Kimmo, Soderstrom, Daniel, Cazzaniga, Carlo, Ferraro, Rudy, Danzeca, Salvatore, Mekki, Julien, Manni, Florent, Dangla, David, Virmontois, Cedric, Kerboub, Nourdine, Koelpin, Alexander, Saigné, Frédéric, Wang, Pierre, Pouget, Vincent, Touboul, Antoine, Javanainen, Arto, Kettunen, Heikki, Germanicus, Rosine Coq

المساهمون: European Organization for Nuclear Research (CERN), CERN Genève, German Aerospace Center (DLR), 3D Plus, Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), University of Jyväskylä (JYU), Science and Technology Facilities Council (STFC), Centre National d'Études Spatiales Toulouse (CNES), Hamburg University of Technology (TUHH), Vanderbilt University Nashville, Laboratoire de cristallographie et sciences des matériaux (CRISMAT), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: System verification, Space missions, Radiation effects, Performance evaluation, Total ionizing dose, Protons, Neutrons, Radiation hardening (electronics), Commercial off-the-shelf (COTS), Facilities, Radiation hardness assurance, Risk acceptance, Single-event effect (SEE), Small satelllites, System-level testing, Test methodology, Total ionizing dose (TID), [SPI.TRON]Engineering Sciences [physics]/Electronics, [PHYS.PHYS.PHYS-SPACE-PH]Physics [physics]/Physics [physics]/Space Physics [physics.space-ph]

الاتاحة: https://hal.science/hal-03341566
https://hal.science/hal-03341566v1/document
https://hal.science/hal-03341566v1/file/Radiation_Hardness_Assurance_Through_System-Level_Testing_Risk_Acceptance_Facility_Requirements_Test_Methodology_and_Data_Exploitation.pdf
https://doi.org/10.1109/TNS.2021.3061197

المؤلفون: Luza, Lucas Matana, Ruospo, Annachiara, Soderstrom, Daniel, Cazzaniga, Carlo, Kastriotou, Maria, Sanchez, Ernesto, Bosio, Alberto, Dilillo, Luigi

المساهمون: VAN ALLEN Foundation, European Unions Horizon 2020 research innovation programme, Region Occitanie, IDEX Lyon OdeLe

المصدر: IEEE Transactions on Emerging Topics in Computing ; volume 10, issue 4, page 1867-1882 ; ISSN 2168-6750 2376-4562

الاتاحة: https://doi.org/10.1109/tetc.2021.3116999
http://xplorestaging.ieee.org/ielx7/6245516/9970409/09563209.pdf?arnumber=9563209

المؤلفون: Soderstrom, Daniel, Luza, Lucas Matana, de Mattos, Andre Martins Pio, Gil, Thierry, Kettunen, Heikki, Niskanen, Kimmo, Javanainen, Arto, Dilillo, Luigi

المصدر: IEEE Transactions on Nuclear Science; August 2023, Vol. 70 Issue: 8 p1861-1869, 9p

المؤلفون: Luza, Lucas Matana, Soderstrom, Daniel, Puchner, Helmut, Alia, Ruben Garcia, Letiche, Manon, Bosio, Alberto, Dilillo, Luigi

المصدر: 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS)

الاتاحة: http://dx.doi.org/10.1109/dtis48698.2020.9080918
http://xplorestaging.ieee.org/ielx7/9076568/9080912/09080918.pdf?arnumber=9080918

المؤلفون: Slupecki, Maciej, Aguglia, Davide, Aguiar, Ygor, Alemany Fernandez, Reyes, Argyropoulos, Theodoros, Barlow, Roger Andrew, Bartosik, Hannes, Bellodi, Giulia, Bilko, Kacper, Borburgh, Jan, Bruce, Roderik, Brucoli, Matteo, Carlier, Etienne, Cettour Cave, Stephane, Corso, Jean-Pierre, Damerau, Heiko, Danzeca, Salvatore, Delrieux, Marc, Deslande, Freider, Dolenc, Miha, Ferreira Somoza, Jose Antonio, Garcia Alia, Ruben, Grenier-Boley, Edouard, Huschauer, Alexander, John, Isabelle, Kuchler, Detlef, Lerner, Giuseppe, Li, Kevin Shing Bruce, Magnin, Nicolas, Mahner, Edgar, Morand, Boris, Mutin, Christophe, King, Quentin, Pavis, Steven, Prost, Antoine, Ramberger, Suitbert, Ruffieux, Romain Brice, Scrivens, Richard, Soderstrom, Daniel Paul, Van Trappen, Pieter, Valerio Lizarraga, Cristhian Alfonso, Voumard, Nicolas, Widorski, Markus, Zimmaro, Alessandro

مصطلحات موضوعية: Accelerators and Storage Rings

Relation: http://cds.cern.ch/record/2888741; CERN-ACC-NOTE-2024-0001; oai:cds.cern.ch:2888741

الاتاحة: http://cds.cern.ch/record/2888741

المؤلفون: Soderstrom, Daniel¹ daniel.p.soderstrom@jyu.fi, Luza, Lucas Matana², Kettunen, Heikki¹, Javanainen, Arto¹, Farabolini, Wilfrid³, Gilardi, Antonio³, Coronetti, Andrea¹, Poivey, Christian⁴, Dilillo, Luigi⁵

المصدر: IEEE Transactions on Nuclear Science. May2021, Vol. 68 Issue 5, p716-723. 8p.

مصطلحات موضوعية: DYNAMIC random access memory, NUCLEAR research, PLANETARY exploration, ERROR rates

مصطلحات جغرافية: JYVASKYLA (Finland)

الشركة/الكيان: EUROPEAN Organization for Nuclear Research , EUROPEAN Space Agency

المؤلفون: Coronetti, Andrea, Alia, Ruben Garcia, Cerutti, Francesco, Hajdas, Wojtek, Soderstrom, Daniel, Javanainen, Arto, Saigne, Frederic

المصدر: IEEE Transactions on Nuclear Science; Aug2021, Vol. 68 Issue 8, p1613-1622, 10p

مصطلحات موضوعية: LINEAR energy transfer, MONTE Carlo method, PIONS, NUCLEAR reactions, HARDNESS

المؤلفون: Coronetti, Andrea, Alia, Ruben Garcia, Cecchetto, Matteo, Hajdas, Wojtek, Soderstrom, Daniel, Javanainen, Arto, Saigne, Frederic

المصدر: IEEE Transactions on Nuclear Science; Jul2020, Vol. 67 Issue 7, p1606-1613, 8p

مصطلحات موضوعية: CYCLOTRONS, PIONS, RESONANCE effect, NUCLEAR cross sections, SOFT errors

المؤلفون: Florell, Jakob, Lundqvist, Love, Söderström, Daniel

مصطلحات موضوعية: Baltikum, internationalisering, småföretag, expansionsstrategi, Business studies, Företagsekonomi

وصف الملف: application/pdf

الاتاحة: http://urn.kb.se/resolve?urn=urn:nbn:se:hik:diva-1842

المؤلفون: Söderström, Daniel

مصطلحات موضوعية: Engineering physics, hollow cathode, hybrid plasma, vibrational temperature, atmospheric pressure, fluid modelling, radio frequency, pulsed power, Teknisk fysik

وصف الملف: application/pdf

Relation: Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, 1651-6214 ; 433

الاتاحة: http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-8747