المؤلفون: Priya A. Bhakta, Jim Plusquellic, Andrew Suchanek, Tom J. Mannos

المصدر: IEEE Access, Vol 13, Pp 3434-3452 (2025)

مصطلحات موضوعية: DEFCON, duplication-with-comparison, fail-safe, fault injection attacks, single-event-upsets, fault tolerance, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10810411/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/973a640741d84956bfe1422579734a47

المؤلفون: Ferreira, Marcelo Tadeu Motta, Federico, Claudio Antonio

المصدر: Journal of Aerospace Technology and Management. January 2022 14

مصطلحات موضوعية: Ionizing radiation, Single event upsets, Certification, Aeronautics, Management

وصف الملف: text/html

URL الوصول: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462022000100307

المؤلفون: Abe, Shin-ichiro, Hashimoto, Masanori, Liao, Wang, Kato, Takashi, Asai, Hiroaki, Shimbo, Kenichi, Matsuyama, Hideya, Sato, Tatsuhiko, Kobayashi, Kazutoshi, Watanabe, Yukinobu

المساهمون: 安部, 晋一郎, 橋本, 昌宜, 廖, 望, 加藤, 貴志, 浅井, 弘彰, 新保, 健一, 松山, 英也, 佐藤, 達彦, 小林, 和淑, 渡邊, 幸信

مصطلحات موضوعية: Monte Carlo simulation, neutron radiation effects, neutrons, PHITS, single event upsets (SEUs), soft errors

Relation: https://www.kyoto-u.ac.jp/ja/research-news/2023-06-08; http://hdl.handle.net/2433/284680; IEEE Transactions on Nuclear Science; 70; 1652; 1657

الاتاحة: http://hdl.handle.net/2433/284680

المؤلفون: Coronetti, Andrea, Alia, Ruben Garcia, Lucsanyi, David, Wang, Jialei, Saigne, Frederic, Javanainen, Arto, Leroux, Paul, Prinzie, Jeffrey

مصطلحات موضوعية: protons, random access memory, scattering, neutrons, trajectory, single event upsets, proton direct ionization, delta-rays, Monte-Carlo simulations, energiansiirto, ionit, ionisoiva säteily, liike-energia, muistit (tietotekniikka), Monte Carlo -menetelmät, neutronit, protonit

وصف الملف: application/pdf; 314-321; fulltext

Relation: IEEE Transactions on Nuclear Science; 70; 721624; 4000124504/18/NL/KML/zx; 101008126; info:eu-repo/grantAgreement/EC/H2020/721624/EU//RADSAGA; info:eu-repo/grantAgreement/EC/H2020/101008126/EU//RADNEXT; European Commission; European Space Agency; Euroopan komissio; CONVID_156693008

الاتاحة: http://urn.fi/URN:NBN:fi:jyu-202306073572

المؤلفون: Rodríguez Ferrández, Iván, Tali, Maris, Kosmidis, Leonidas, Rovituso, Marta, Steenari, David

المساهمون: Universitat Politècnica de Catalunya. Doctorat en Arquitectura de Computadors, Barcelona Supercomputing Center, Universitat Politècnica de Catalunya. CAP - Grup de Computació d'Altes Prestacions

مصطلحات موضوعية: Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors, Space vehicles, Graphics processing units, Embedded computer systems, Protons, Radiation effects, Satellites, Single event upsets, System-on-chip, Vehicles espacials, Unitats de processament gràfic, Ordinadors immersos, Sistemes d'

وصف الملف: application/pdf

Relation: https://ieeexplore.ieee.org/document/9897236; http://hdl.handle.net/2117/376544

الاتاحة: http://hdl.handle.net/2117/376544
https://doi.org/10.1109/IOLTS56730.2022.9897236

المساهمون: Blackmore, E.

المصدر: IEEE Transactions on Nuclear Science; 64; 1

وصف الملف: Medium: ED; Size: p. 421-426

URL الوصول: http://www.osti.gov/scitech/servlets/purl/1339278

المؤلفون: Marcelo Tadeu Motta Ferreira, Claudio Antonio Federico

المصدر: Journal of Aerospace Technology and Management, Vol 14, Iss 1 (2022)

مصطلحات موضوعية: ionizing radiation, single event upsets, certification, aeronautics, management, Technology, Motor vehicles. Aeronautics. Astronautics, TL1-4050

وصف الملف: electronic resource

Relation: https://www.scielo.br/j/jatm/a/zXV89KgtckhZwYnmG7rnCBm/?format=pdf&lang=en; https://doaj.org/toc/1984-9648; https://doaj.org/toc/2175-9146

URL الوصول: https://doaj.org/article/8befa91873ca487bab69138f62d24419

المؤلفون: Kraemer Sarzi Sartori, Tarso, Fourati, Hassen, Létiche, Manon, Possamai Bastos, Rodrigo

المساهمون: Architectures and Methods for Resilient Systems (TIMA-AMfoRS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA), Dynamics and Control of Networks (DANCE), Inria Grenoble - Rhône-Alpes, Institut National de Recherche en Informatique et en Automatique (Inria)-Institut National de Recherche en Informatique et en Automatique (Inria)-GIPSA Pôle Automatique et Diagnostic (GIPSA-PAD), Grenoble Images Parole Signal Automatique (GIPSA-lab), Université Grenoble Alpes (UGA)-Grenoble Images Parole Signal Automatique (GIPSA-lab), Institut Laue-Langevin (ILL), This work was supported in part by: the MultiRad project of the Région Auvergne-Rhône-Alpes's international ambition pack (PAI), the French national research agency within the France-2030 program (ANR-15-IDEX-0002), the LabEx PERSYVAL-Lab (ANR-11-LABX-0025-01), the IRT Nanoelec (ANR-10-AIRT-0005) of the French national program PIA (“Programme d’Investissements d’Avenir), the LPSC's GENESIS platform, and the ILL's TENIS instrument (TEST-3202 and TEST-3219 experiments)., ANR-15-IDEX-0002,UGA,IDEX UGA(2015), ANR-11-LABX-0025,PERSYVAL-lab,Systemes et Algorithmes Pervasifs au confluent des mondes physique et numérique(2011), ANR-10-AIRT-0005,NANOELEC,NANOELEC(2010)

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: Radiation-induced soft errors, single-event upsets (SEU), single-event functional interrupts (SEFI), attitude estimation, inertial navigation system, reliability, PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

الاتاحة: https://hal.science/hal-03675920
https://doi.org/10.1109/TNS.2022.3176676

المؤلفون: Corneliou, Panayiotis, Nikolaou, Panagiota, Michael, Maria K., Theocharides, Theocharis

المصدر: DFT 2021, 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Athens, Greece, 6 - 8 October, 2021

مصطلحات موضوعية: Artificial Neural Networks, Vulnerability Analysis, Fault Tolerance, Single Event Upsets, Soft Errors, Edge Accelerators, Emulation-Based Fault Injection

Relation: https://zenodo.org/communities/kios-coe; https://zenodo.org/communities/eu; https://doi.org/10.1109/DFT52944.2021.9568281; oai:zenodo.org:5841461

الاتاحة: https://doi.org/10.1109/DFT52944.2021.9568281

المؤلفون: Bagatin M., Gerardin S., Paccagnella A., Benvenuti A., Beltrami S.

المساهمون: Bagatin, M., Gerardin, S., Paccagnella, A., Benvenuti, A., Beltrami, S.

مصطلحات موضوعية: Flash memorie, single event effect, single event upsets

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001306481700064; volume:71; issue:8; firstpage:1731; lastpage:1737; numberofpages:7; journal:IEEE TRANSACTIONS ON NUCLEAR SCIENCE; https://hdl.handle.net/11577/3541535

الاتاحة: https://hdl.handle.net/11577/3541535
https://doi.org/10.1109/TNS.2024.3355939

المؤلفون: Pingyue Yue (11923433), Jianping An (8891252), Jiankang Zhang (11923637), Gaofeng Pan (11923467), Shuai Wang (11923643), Pei Xiao (4999202), Lajos Hanzo (11923646)

مصطلحات موضوعية: Communication, Networking and Broadcast Technologies, active eavesdropping, interference, LEO SCS, passive eavesdropping, security countermeasures, security vulnerabilities, single event upsets, space debris

Relation: https://figshare.com/articles/preprint/On_the_Security_of_LEO_Satellite_Communication_Systems_Vulnerabilities_Countermeasures_and_Future_Trends/18093941

الاتاحة: https://doi.org/10.36227/techrxiv.18093941.v1

المؤلفون: Rodriguez Condia, Josie Esteban, Goncalves, Marcio M., Azambuja, Jose Rodrigo, Sonza Reorda, Matteo, Sterpone, Luca

مصطلحات موضوعية: Fault tolerance, graphics processing units, pipeline registers, single event upsets

Relation: https://zenodo.org/communities/eu; https://doi.org/10.1109/ISVLSI49217.2020.00076; oai:zenodo.org:4545664

الاتاحة: https://doi.org/10.1109/ISVLSI49217.2020.00076

المؤلفون: Söderström, Daniel, Matana Luza, Lucas, Kettunen, Heikki, Javanainen, Arto, Farabolini, Wilfrid, Gilardi, Antonio, Coronetti, Andrea, Poivey, Christian, Dilillo, Luigi

المساهمون: University of Jyväskylä (JYU), Test and dEpendability of microelectronic integrated SysTems (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), European Organization for Nuclear Research (CERN), Dipartimento di Ingegneria Elettrica e delle Tecnologie dell'Informazione Napoli (DIETI), University of Naples Federico II = Università degli studi di Napoli Federico II, Agence Spatiale Européenne = European Space Agency (ESA), European Project: 721624,RADSAGA

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: Electron radiation, radiation effects, single event upsets, stuck bits, total ionizing dose, [SPI.TRON]Engineering Sciences [physics]/Electronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems

Relation: info:eu-repo/grantAgreement//721624/EU/Radiation and reliability challenges for state-of-the-art electronics to be used in space, avionics, on the ground and at accelerators/RADSAGA; lirmm-03358914; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358914; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358914/document; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358914/file/2020_TNS___Electron_Induced_Upsets_and_Stuck_Bits_in_SDRAMs_in_the_Jovian_environment___HAL_Version.pdf

الاتاحة: https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358914
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358914/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358914/file/2020_TNS___Electron_Induced_Upsets_and_Stuck_Bits_in_SDRAMs_in_the_Jovian_environment___HAL_Version.pdf
https://doi.org/10.1109/TNS.2021.3068186

المؤلفون: Gao, Zhen, Zhang, Lingling, Cheng, Yinghao, Guo, Kangkang, Ullah, Anees, Reviriego Vasallo, Pedro

المساهمون: Ministerio de Economía y Competitividad (España)

مصطلحات موضوعية: Fault Detection And Location, Field-Programmable Gate Array (Fpga), Reed-Solomon (Rs) Decoder, Reliability, Single-Event Upsets (Seus), Telecomunicaciones

Relation: Gobierno de España. PID2019-104207RB-I00; Gao, Z., Zhang, L., Cheng, Y., Guo, K., Ullah, A. & Reviriego, P. (2021). Design of FPGA-Implemented Reed–Solomon Erasure Code (RS-EC) Decoders With Fault Detection and Location on User Memory. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 29(6), pp. 1073–1082.; http://hdl.handle.net/10016/33032; https://doi.org/10.1109/TVLSI.2021.3066804; 1073; 1082; IEEE Transactions on Very Large Scale Integration (VLSI) Systems; 29; AR/0000027527

الاتاحة: http://hdl.handle.net/10016/33032
https://doi.org/10.1109/TVLSI.2021.3066804

المؤلفون: Brendler, Leonardo Heitich

المساهمون: Reis, Ricardo Augusto da Luz, Rivet, François

مصطلحات موضوعية: Single-event upsets, Multiple-cell upsets, SRAM, Circuitos integrados digitais, Microeletrônica, Comunicação de dados, Transistores, Microprocessadores, Memória SRAM, Cellule de Détection, Durcissement par rayonnement, Erreurs logicielles

وصف الملف: application/pdf

Relation: http://hdl.handle.net/10183/272054; 001196316

الاتاحة: http://hdl.handle.net/10183/272054

المؤلفون: Gonçalves, Marcio Macedo

المساهمون: Azambuja, José Rodrigo Furlanetto de

مصطلحات موضوعية: Unidades de processamento gráfico, Tolerância a falhas, Processamento paralelo, Confiabilidade : Computadores, Computação aproximativa, Fpga, Arquitetura de hardware, GPU reliability, Single event upsets, Safety-critical applications

وصف الملف: application/pdf

Relation: http://hdl.handle.net/10183/276918; 001207651

الاتاحة: http://hdl.handle.net/10183/276918

المؤلفون: Rajkumar, Trishna, Öberg, Johnny

المصدر: 2022 IEEE 27TH PACIFIC RIM INTERNATIONAL SYMPOSIUM ON DEPENDABLE COMPUTING (PRDC) IEEE Pacific Rim International Symposium on Dependable Computing. :164-171

مصطلحات موضوعية: radiation, scrubber, anomaly, single event upsets, fault tolerance, clustering, autoencoders, dynamic thresholding

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-326863

المؤلفون: Rajkumar, Trishna, Öberg, Johnny

المصدر: 2022 21St International Conference On Field-Programmable Technology (ICFPT 2022). :282-285

مصطلحات موضوعية: Natural Sciences, Physical Sciences, Naturvetenskap, Fysik, single event upsets, SEM core, Markovian chain, reliability, fault-tolerance

وصف الملف: print

URL الوصول: http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-324515

المؤلفون: Rogenmoser, Michael, Benini, Luca

المساهمون: Rogenmoser, Michael, Benini, Luca

مصطلحات موضوعية: Fault tolerance, Costs, Microcontrollers, Fault tolerant systems, Single event upsets, Reliability engineering, Task analysis

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-2649-9; ispartofbook:2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS); 2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS); firstpage:.; lastpage:.; numberofpages:.; https://hdl.handle.net/11585/958749

الاتاحة: https://hdl.handle.net/11585/958749
https://doi.org/10.1109/ICECS58634.2023.10382727

المؤلفون: Cecchetto, Matteo, García Alía, Rubén, Wrobel, Frédéric, Tali, Maris, Stein, Oliver, Lerner, Giuseppe, Bilko, Kacper, Esposito, Luigi, Bahamonde Castro, Cristina, Kadi, Yacine, Danzeca, Salvatore, Brucoli, Matteo, Cazzaniga, Carlo, Bagatin, Marta, Gerardin, Simone, Paccagnella, Alessandro

المساهمون: Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), ANR-10-AIRT-0005,NANOELEC,NANOELEC(2010)

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: Large hadron collider (LHC), Radiation hardness assurance (RHA), SRAM, Thermal neutrons (ThNs), n: thermal, Radiation: damage, FPGA, CERN LHC Coll, Numerical calculations, Electronics, Aerospace electronics, Boron: nuclide, Radiation: shielding, Ground level, Flash memory, Field-programmable gate array (FPGA), High-energy neutrons (HENs), Single event upsets, Avionic, Commercial-off-the-shelf (COTS), Random access memory, Protons, Flash memories, FLUKA, Neutrons, Large Hadron Collider, [PHYS.PHYS.PHYS-ACC-PH]Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph]

Relation: INSPIRE: 1808315; WOS: 000550669800026

الاتاحة: https://hal.science/hal-02911959
https://hal.science/hal-02911959v1/document
https://hal.science/hal-02911959v1/file/Thermal_Neutron-Induced_SEUs_in_the_LHC_Accelerator_Environment.pdf
https://doi.org/10.1109/TNS.2020.2997992