المؤلفون: Gheorghe Brezeanu, Gheorghe Pristavu, Florin Draghici, Razvan Pascu, Francesco Della Corte, Simone Rascuna

المصدر: IEEE Journal of the Electron Devices Society, Vol 8, Pp 1339-1344 (2020)

مصطلحات موضوعية: Schottky diode, parallel conduction, inhomogeneity, non-uniformity parameter, silicon carbide, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9234459/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/3d46e089566f44b4b1af1e100aadd0e2

المؤلفون: Fabrizio Roccaforte, Simone Rascuna, Silvia Scalese, Raffaella Lo Nigro, Marilena Vivona, Salvatore Di Franco, Giuseppe Greco, Mario Saggio, Corrado Bongiorno

المصدر: Materials science forum 924 (2018): 377–380. doi:10.4028/www.scientific.net/MSF.924.377
info:cnr-pdr/source/autori:Vivona M.; Greco G.; Bongiorno C.; Di Franco S.; Lo Nigro R.; Scalese S.; Rascuna S.; Saggio M.; Roccaforte F./titolo:Study of Ti%2FAl%2FNi ohmic contacts to P-type implanted 4H-SiC/doi:10.4028%2Fwww.scientific.net%2FMSF.924.377/rivista:Materials science forum/anno:2018/pagina_da:377/pagina_a:380/intervallo_pagine:377–380/volume:924

مصطلحات موضوعية: 010302 applied physics, Materials science, Mechanical Engineering, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, p-type 4H-SiC, 01 natural sciences, Mechanics of Materials, Ti/Al/Ni, 0103 physical sciences, General Materials Science, Composite material, 0210 nano-technology, Ohmic contact, Ohmic contacts

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::121e6b072eb350f78c0c9c64d1491c87
https://doi.org/10.4028/www.scientific.net/msf.924.377

المؤلفون: Raffaella Lo Nigro, Fabrizio Roccaforte, Marilena Vivona, Simone Rascuna, Gabriele Bellocchi

المصدر: Semicond. Sci. Technol.

مصطلحات موضوعية: Materials science, business.industry, Materials Chemistry, Optoelectronics, Schottky diode, Physics - Applied Physics, Electrical and Electronic Engineering, Condensed Matter Physics, business, Electronic, Optical and Magnetic Materials, Annealing (glass)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e8e7cebc0c2233184b2ce0bb2b8dc65e
https://doi.org/10.1088/1361-6641/ac3375

المؤلفون: C. Bongiorno, Simone Rascuna, Paolo Badalà, Marilena Vivona, Anna Bassi, Fabrizio Roccaforte, Gabriele Bellocchi

المصدر: Solid-State Electronics. 186:108042

مصطلحات موضوعية: 010302 applied physics, Work (thermodynamics), Materials science, business.industry, Annealing (metallurgy), Schottky barrier, Schottky diode, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Power consumption, 0103 physical sciences, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a701e6f340ee3fe6b00ad9cb7c640b6a
https://doi.org/10.1016/j.sse.2021.108042

المؤلفون: Gheorghe Pristavu, Simone Rascuna, Razvan Pascu, Gheorghe Brezeanu, Florin Draghici, Francesco G. Della Corte

المساهمون: Brezeanu, G., Pristavu, G., Draghici, F., Pascu, R., Della Corte, F., Rascuna, S.

المصدر: IEEE Journal of the Electron Devices Society, Vol 8, Pp 1339-1344 (2020)

مصطلحات موضوعية: Materials science, Schottky barrier, 02 engineering and technology, 01 natural sciences, chemistry.chemical_compound, inhomogeneity, silicon carbide, 0103 physical sciences, Silicon carbide, Schottky diode, Electrical and Electronic Engineering, parallel conduction, Diode, 010302 applied physics, Equivalent series resistance, Condensed matter physics, Degree (graph theory), Series (mathematics), 021001 nanoscience & nanotechnology, non-uniformity parameter, Electronic, Optical and Magnetic Materials, chemistry, lcsh:Electrical engineering. Electronics. Nuclear engineering, 0210 nano-technology, Constant (mathematics), lcsh:TK1-9971, Biotechnology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9adce9a13469749f02e415eb7734ce0
http://hdl.handle.net/11588/849620

المؤلفون: C. Bongiorno, Alessandra Alberti, Filippo Giannazzo, Simone Rascuna, Paolo Badalà, Mario Saggio, C. Tringali, Giuseppe Greco, Fabrizio Roccaforte, S. Di Franco, Emanuele Smecca

المصدر: Materials science in semiconductor processing 97 (2019): 62–66. doi:10.1016/j.mssp.2019.02.031
info:cnr-pdr/source/autori:Rascuna, S. 1; Badala, P. 1; Tringali, C. 1; Bongiorno, C. 2; Smecca, E. 2; Alberti, A. 2; Di Franco, S. 2; Giannazzo, F. 2; Greco, G. 2; Roccaforte, F. 2; Saggio, M. 1/titolo:Morphological and electrical properties of Nickel based Ohmic contacts formed by laser annealing process on n-type 4H-SiC/doi:10.1016%2Fj.mssp.2019.02.031/rivista:Materials science in semiconductor processing/anno:2019/pagina_da:62/pagina_a:66/intervallo_pagine:62–66/volume:97
Materials Science in Semiconductor Processing

مصطلحات موضوعية: 4H-SiC, Materials science, Fabrication, medicine.medical_treatment, FOS: Physical sciences, chemistry.chemical_element, Applied Physics (physics.app-ph), 02 engineering and technology, 01 natural sciences, nickel silicide, 0103 physical sciences, medicine, General Materials Science, Ohmic contact, Ohmic contacts, Diode, 010302 applied physics, Condensed Matter - Materials Science, Excimer laser, business.industry, Mechanical Engineering, Doping, Materials Science (cond-mat.mtrl-sci), Schottky diode, Conductive atomic force microscopy, Physics - Applied Physics, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Ni2Si, Nickel, chemistry, Mechanics of Materials, laser annealing, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a8f9b7a761d30236e4b67c7bffcb97ab
http://arxiv.org/abs/1906.03089

المؤلفون: Mario Saggio, Simone Rascuna, Filippo Giannazzo, Fabrizio Roccaforte, Salvatore Di Franco, Patrick Fiorenza

المصدر: Materials Science Forum. 858:701-704

مصطلحات موضوعية: Materials science, Annealing (metallurgy), Analytical chemistry, 02 engineering and technology, Scanning capacitance microscopy, 01 natural sciences, law.invention, Metal, law, 0103 physical sciences, General Materials Science, Nanoscopic scale, 010302 applied physics, Dopant, business.industry, Mechanical Engineering, Doping, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Capacitor, Ion implantation, Mechanics of Materials, visual_art, visual_art.visual_art_medium, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f4b390c47c694359538172384ab787a8
https://doi.org/10.4028/www.scientific.net/msf.858.701

المؤلفون: Mario Saggio, Filippo Giannazzo, Simone Rascuna, Fabrizio Roccaforte, Peter M. Gammon, G. Brezeanu

مصطلحات موضوعية: Physics, chemistry.chemical_compound, chemistry, Silicon carbide, Schottky diode, Engineering physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6475faa8feaf36d32ce0bc5299648351
https://doi.org/10.21741/9781945291852-3

المؤلفون: Fabrizio Roccaforte, Patrick Fiorenza, Mario Saggio, Edoardo Zanetti, Dario Salinas, Alessia Frazzetto, Simone Rascuna, Filippo Giannazzo, Alfio Guarnera

المصدر: Materials Science Forum. :660-666

مصطلحات موضوعية: Very-large-scale integration, Engineering, business.industry, Mechanical Engineering, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, chemistry.chemical_compound, Reliability (semiconductor), chemistry, Hardware_GENERAL, Mechanics of Materials, Power electronics, MOSFET, Hardware_INTEGRATEDCIRCUITS, Silicon carbide, Electronic engineering, General Materials Science, Power semiconductor device, Field-effect transistor, Power MOSFET, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d0c98bb1371f17ba135ef8b4dede1fb8
https://doi.org/10.4028/www.scientific.net/msf.821-823.660

المؤلفون: Raffaella Lo Nigro, Mario Saggio, Simone Rascuna, Marilena Vivona, Filippo Giannazzo, Fabrizio Roccaforte, Salvatore Di Franco, Giuseppe Greco

المصدر: Materials Science Forum. :428-431

مصطلحات موضوعية: Work (thermodynamics), Materials science, Condensed matter physics, Mechanics of Materials, Mechanical Engineering, Melting temperature, Metallurgy, General Materials Science, Condensed Matter Physics, Microstructure, Ohmic contact, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::19c5c3e262f6f5f88fbb0e2aec6f1043
https://doi.org/10.4028/www.scientific.net/msf.821-823.428

المؤلفون: Fabrizio Roccaforte, Edoardo Zanetti, Marilena Vivona, Filippo Giannazzo, Simone Rascuna, Alfio Guarnera, Salvatore Di Franco, Giuseppe Greco, Mario Saggio, Alessia Frazzetto

المصدر: Materials Science Forum. :665-668

مصطلحات موضوعية: Work (thermodynamics), Materials science, Condensed matter physics, Dopant, Mechanical Engineering, Contact resistance, Atmospheric temperature range, Condensed Matter Physics, Mechanics of Materials, Electronic engineering, General Materials Science, Thermal stability, Current (fluid), Ohmic contact, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c7e7d02392409ebe537db5e6863ff7d6
https://doi.org/10.4028/www.scientific.net/msf.778-780.665

المؤلفون: Mario Saggio, Domenico Murabito, Simone Rascunà, Alfio Guarnera, Filippo Di Giovanni, Maurizio Melito, LONGO MINNOLO, ANTONINO

المساهمون: Mario, Saggio, Domenico, Murabito, LONGO MINNOLO, Antonino, Simone, Rascunà, Alfio, Guarnera, Filippo Di, Giovanni, Maurizio, Melito

Relation: info:eu-repo/semantics/altIdentifier/isbn/9783928643375; PCIM EUROPE 2003; firstpage:503; lastpage:507; http://hdl.handle.net/11570/1897407

الاتاحة: http://hdl.handle.net/11570/1897407

المؤلفون: Simone RASCUNÁ, Gabriele BELLOCCHI, Paolo BADALÁ, Isodiana CRUPI

المساهمون: Simone RASCUNÁ, Gabriele BELLOCCHI, Paolo BADALÁ, Isodiana CRUPI

مصطلحات موضوعية: SiC, UV detector, ohmic-contact

Relation: http://hdl.handle.net/10447/540589

الاتاحة: http://hdl.handle.net/10447/540589

المؤلفون: R. Lo Nigro, Mario Saggio, Filippo Giannazzo, Simone Rascuna, Marilena Vivona, Giuseppe Greco, Fabrizio Roccaforte

المصدر: Semiconductor science and technology
29 (2014): 075018-1–075018-7. doi:10.1088/0268-1242/29/7/075018
info:cnr-pdr/source/autori:M. Vivona, G. Greco, F. Giannazzo, R. Lo Nigro, S. Rascunà, M. Saggio, F. Roccaforte/titolo:Thermal stability of the current transport mechanisms in Ni-based Ohmic contacts on n-and p-implanted 4H-SiC/doi:10.1088%2F0268-1242%2F29%2F7%2F075018/rivista:Semiconductor science and technology (Print)/anno:2014/pagina_da:075018-1/pagina_a:075018-7/intervallo_pagine:075018-1–075018-7/volume:29

مصطلحات موضوعية: SiC, Materials science, Condensed matter physics, Annealing (metallurgy), Contact resistance, Atmospheric temperature range, Condensed Matter Physics, Ni2Si, Ohmic contact, Electronic, Optical and Magnetic Materials, Field electron emission, Ion implantation, Materials Chemistry, Thermal stability, Electrical and Electronic Engineering, Electric current

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc13a6d7e1a510668497372f1b61eea2
http://www.cnr.it/prodotto/i/283957

المؤلفون: Alfonso Patti, Filippo Giannazzo, Simone Rascuna, Corrado Bongiorno, Mario Saggio, Giuseppe Greco, Marilena Vivona, Ferdinando Iucolano, S. Di Franco, Fabrizio Roccaforte, Alessia Frazzetto, R. Lo Nigro

المصدر: physica status solidi (a). 214:1600357

مصطلحات موضوعية: Materials science, Annealing (metallurgy), 02 engineering and technology, 01 natural sciences, law.invention, law, 0103 physical sciences, Materials Chemistry, Electrical measurements, Power semiconductor device, Electrical and Electronic Engineering, Ohmic contact, 010302 applied physics, business.industry, Transistor, Wide-bandgap semiconductor, Schottky diode, Surfaces and Interfaces, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Semiconductor, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b9534adb12295938fd621eb4efa74cf7
https://doi.org/10.1002/pssa.201600357

المؤلفون: Roberto Vabres, Gabriele Bellocchi, Simone Rascunà, Fabrizio Roccaforte, Marilena Vivona, Valeria Puglisi, Paola Mancuso, Paolo Badalà, Isodiana Crupi

المساهمون: Roberto Vabres, Gabriele Bellocchi, Simone Rascunà, Fabrizio Roccaforte, Marilena Vivona, Valeria Puglisi, Paola Mancuso, Paolo Badalà, Isodiana Crupi

مصطلحات موضوعية: Silicon Carbide, ohmic contact, laser annealing, Settore ING-INF/01 - Elettronica

Relation: Annual Meeting of the Associazione Società Italiana di Elettronica (SIE); https://hdl.handle.net/10447/639419

الاتاحة: https://hdl.handle.net/10447/639419

المؤلفون: Mario Saggio, Simone Rascuna, Filippo Giannazzo, Marilena Vivona, Fabrizio Roccaforte, Giuseppe Greco, Raffaella Lo Nigro

المصدر: Materials Science Forum
Materials science forum 924 (2018): 339–344. doi:10.4028/www.scientific.net/MSF.924.339
info:cnr-pdr/source/autori:Roccaforte F.; Vivona M.; Greco G.; Lo Nigro R.; Giannazzo F.; Rascuna S.; Saggio M./titolo:Metal%2Fsemiconductor contacts to silicon carbide: Physics and technology/doi:10.4028%2Fwww.scientific.net%2FMSF.924.339/rivista:Materials science forum/anno:2018/pagina_da:339/pagina_a:344/intervallo_pagine:339–344/volume:924

مصطلحات موضوعية: 4H-SiC, Materials science, Schottky barrier, Complex system, Context (language use), 02 engineering and technology, 01 natural sciences, chemistry.chemical_compound, 0103 physical sciences, Silicon carbide, General Materials Science, Electronics, Ohmic contact, 010302 applied physics, business.industry, Mechanical Engineering, ohmic contacts, Schottky diode, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Engineering physics, Semiconductor, chemistry, Mechanics of Materials, 0210 nano-technology, business, schottky contacts

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::896c490fff40ee36ae57ef3733015699

المؤلفون: Emanuele Smecca, Fabrizio Roccaforte, Giovanni Franco, Alessandra Alberti, Angelo Alberto Messina, Francesco La Via, Brunella Cafra, Anna Bassi, Simone Rascuna, Corrado Bongiorno, Cristiano Calabretta, Mario Saggio, Paolo Badalà, Massimo Zimbone, Antonino La Magna

المصدر: Materialia

مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, business.industry, Scanning electron microscope, chemistry.chemical_element, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, 01 natural sciences, Fluence, Nickel, chemistry.chemical_compound, symbols.namesake, chemistry, 0103 physical sciences, Silicide, symbols, Optoelectronics, General Materials Science, 0210 nano-technology, business, Raman spectroscopy, Ohmic contact

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b0615632ad2e5bdc3185f565b0d67fef

المؤلفون: Gabriele Bellocchi, Mario Saggio, Simone Rascuna, Marilena Vivona, S. Di Franco, L Zumbo, Fabrizio Roccaforte, Giuseppe Greco

المصدر: Journal of Physics D: Applied Physics

مصطلحات موضوعية: 010302 applied physics, Condensed Matter - Materials Science, Materials science, Acoustics and Ultrasonics, 020502 materials, Schottky barrier, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, 02 engineering and technology, Applied Physics (physics.app-ph), Physics - Applied Physics, Condensed Matter Physics, 01 natural sciences, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, 0205 materials engineering, chemistry, Tungsten carbide, 0103 physical sciences, Composite material

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b5ae24ce319c439181e400bd79442671