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    Academic Journal

    وصف الملف: application/pdf

    Relation: https://eprints.lancs.ac.uk/id/eprint/80120/1/1.4954054.pdf; Park, J. and Ahn, Y. and Tilka, J. A. and Sampson, K. C. and Savage, D. E. and Prance, Jonathan Robert and Simmons, C. B. and Lagally, M. G. and Coppersmith, S. N. and Eriksson, M. A. and Holt, M. V. and Evans, P. G. (2016) Electrode-stress-induced nanoscale disorder in Si quantum electronic devices. APL Materials, 4 (6): 066102. ISSN 2166-532X