المؤلفون: Senna, L.F., Achete, C.A., Simão, R.A., Hirsch, T.

المصدر: Materials Research. January 2001 4(2)

مصطلحات موضوعية: atomic force microscopy (AFM), electrochemical impedance spectroscopy (EIS), hard coatings

وصف الملف: text/html

URL الوصول: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392001000200017

المؤلفون: Carvalho, T.C., Simão, R.A., Archanjo, B.S., Araújo, J.R., Pereira, K.F. X., Barthem, V.M.T. S.

المساهمون: Finep, CAPES, FAPERJ

المصدر: Journal of Alloys and Compounds ; volume 990, page 174414 ; ISSN 0925-8388

الاتاحة: http://dx.doi.org/10.1016/j.jallcom.2024.174414
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المؤلفون: Bernardo, C.N., Kling, I.C.S., Ferreira, W.H., Andrade, C.T., Simao, R.A.

المساهمون: FAPERJ, Coordenação de Aperfeiçoamento de Pessoal de Nível Superior, CNPq

المصدر: Industrial Crops and Products ; volume 177, page 114481 ; ISSN 0926-6690

الاتاحة: http://dx.doi.org/10.1016/j.indcrop.2021.114481
https://api.elsevier.com/content/article/PII:S0926669021012462?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0926669021012462?httpAccept=text/plain

المؤلفون: Teixeira, R.L.P., Raniero, L., Simao, R.A., Coelho, B., Oliveira, A.C.

مصطلحات موضوعية: Articles

وصف الملف: text/html

Relation: http://ijlct.oxfordjournals.org/cgi/content/short/6/1/86; http://dx.doi.org/10.1093/ijlct/ctq052

الاتاحة: http://ijlct.oxfordjournals.org/cgi/content/short/6/1/86
https://doi.org/10.1093/ijlct/ctq052

المؤلفون: Paiva, P.R.P., Monte, M.B.M., Simão, R.A., Gaspar, J.C.

المصدر: Minerals Engineering ; volume 24, issue 5, page 387-395 ; ISSN 0892-6875

الاتاحة: http://dx.doi.org/10.1016/j.mineng.2010.11.009
https://api.elsevier.com/content/article/PII:S0892687510003262?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0892687510003262?httpAccept=text/plain

المؤلفون: Belo, J.S., Marques, S.C., Castilho, A.V., de Oliveira, L.M., Simão, R.A., dos Santos, D.S.

المساهمون: FAPERJ, CNPq, CAPES

المصدر: Journal of Alloys and Compounds ; volume 815, page 152314 ; ISSN 0925-8388

الاتاحة: http://dx.doi.org/10.1016/j.jallcom.2019.152314
https://api.elsevier.com/content/article/PII:S0925838819335601?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0925838819335601?httpAccept=text/plain

المؤلفون: Lins, F.F., Prado, M., Roizenblit, R.N., Pacheco, L.V., Barbosa, C.A.M., Simão, R.A.

المصدر: Dental Materials ; volume 31, page e14 ; ISSN 0109-5641

الاتاحة: http://dx.doi.org/10.1016/j.dental.2015.08.033
https://api.elsevier.com/content/article/PII:S010956411500247X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S010956411500247X?httpAccept=text/plain

المؤلفون: Albuquerque, M.D.F., Santos, E., Perdone, R.R.T., Simao, R.A.

المساهمون: FAPERJ, CNPq

المصدر: Thin Solid Films ; volume 564, page 73-78 ; ISSN 0040-6090

الاتاحة: http://dx.doi.org/10.1016/j.tsf.2014.05.012
https://api.elsevier.com/content/article/PII:S0040609014005471?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0040609014005471?httpAccept=text/plain

المؤلفون: Prado, M.C., Leal, F., Simão, R.A., Gusman, H., Prado, M.

المصدر: Dental Materials ; volume 30, page e118-e119 ; ISSN 0109-5641

الاتاحة: http://dx.doi.org/10.1016/j.dental.2014.08.246
https://api.elsevier.com/content/article/PII:S0109564114004540?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0109564114004540?httpAccept=text/plain

المؤلفون: Menezes, M.S.O., Prado, M., Simão, R.A.

المصدر: Dental Materials ; volume 30, page e113 ; ISSN 0109-5641

الاتاحة: http://dx.doi.org/10.1016/j.dental.2014.08.234
https://api.elsevier.com/content/article/PII:S0109564114004424?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0109564114004424?httpAccept=text/plain

المؤلفون: Dantas, M.C.C., Prado, M., Corrêa, A.C.P., Simão, R.A.

المصدر: Dental Materials ; volume 28, page e44-e45 ; ISSN 0109-5641

الاتاحة: http://dx.doi.org/10.1016/j.dental.2012.07.106
https://api.elsevier.com/content/article/PII:S0109564112003156?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0109564112003156?httpAccept=text/plain

المؤلفون: Prado, M., Assis, D.F., Simão, R.A., Gomes, B.P.F.A.

المصدر: Dental Materials ; volume 28, page e61-e62 ; ISSN 0109-5641

الاتاحة: http://dx.doi.org/10.1016/j.dental.2012.07.141
https://api.elsevier.com/content/article/PII:S0109564112003508?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0109564112003508?httpAccept=text/plain

المؤلفون: DOURADO, E.R., SIMAO, R.A., LEITE, L.F.M.

المصدر: Journal of Microscopy ; volume 245, issue 2, page 119-128 ; ISSN 0022-2720 1365-2818

الاتاحة: http://dx.doi.org/10.1111/j.1365-2818.2011.03552.x
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1111%2Fj.1365-2818.2011.03552.x
https://onlinelibrary.wiley.com/doi/pdf/10.1111/j.1365-2818.2011.03552.x

المؤلفون: DE MORAES, M.B., PEREIRA, R.B., SIMÃO, R.A., LEITE, L.F.M.

المصدر: Journal of Microscopy ; volume 239, issue 1, page 46-53 ; ISSN 0022-2720 1365-2818

الاتاحة: http://dx.doi.org/10.1111/j.1365-2818.2009.03354.x
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1111%2Fj.1365-2818.2009.03354.x
https://onlinelibrary.wiley.com/doi/pdf/10.1111/j.1365-2818.2009.03354.x

المؤلفون: Gomes, J.R., Camargo, S.S., Simão, R.A., Carrapichano, J.M., Achete, C.A., Silva, R.F.

المصدر: Vacuum ; volume 81, issue 11-12, page 1448-1452 ; ISSN 0042-207X

الاتاحة: http://dx.doi.org/10.1016/j.vacuum.2007.04.023
https://api.elsevier.com/content/article/PII:S0042207X07001406?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0042207X07001406?httpAccept=text/plain

المؤلفون: Simão, R.A., Thiré, R.M.S.M., Coutinho, P.R., de Araújo, P.J.G., Achete, C.A., Andrade, C.T.

المصدر: Thin Solid Films ; volume 515, issue 4, page 1714-1720 ; ISSN 0040-6090

الاتاحة: http://dx.doi.org/10.1016/j.tsf.2006.06.013
https://api.elsevier.com/content/article/PII:S0040609006007383?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0040609006007383?httpAccept=text/plain

المؤلفون: Gameiro, C.G., Alves, S., da Silva, E.F., Achete, C.A., Simão, R.A., Santa-Cruz, P.A.

المصدر: Materials Characterization ; volume 50, issue 2-3, page 109-116 ; ISSN 1044-5803

الاتاحة: http://dx.doi.org/10.1016/s1044-5803(03)00076-7
https://api.elsevier.com/content/article/PII:S1044580303000767?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1044580303000767?httpAccept=text/plain

المؤلفون: Laranjeira, J.M.G., da Silva, E.F., de Azevedo, W.M., de Vasconcelos, E.A., Khoury, H.J., Simão, R.A., Achete, C.A.

المصدر: Microelectronics Journal ; volume 34, issue 5-8, page 511-513 ; ISSN 0026-2692

الاتاحة: http://dx.doi.org/10.1016/s0026-2692(03)00099-5
https://api.elsevier.com/content/article/PII:S0026269203000995?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0026269203000995?httpAccept=text/plain

المؤلفون: Andrade, C.T, Silva, K.M, Simão, R.A, Achete, C

المصدر: Carbohydrate Polymers ; volume 47, issue 1, page 59-71 ; ISSN 0144-8617

الاتاحة: http://dx.doi.org/10.1016/s0144-8617(01)00163-1
https://api.elsevier.com/content/article/PII:S0144861701001631?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0144861701001631?httpAccept=text/plain

المؤلفون: Santos, H.J., Pinheiro, F.A., Sampaio, L.C., Takeuchi, A.Y., Ramos, D.C., Simão, R.A., Achete, Carlos Alberto, Cremona, M.

المصدر: Materials Science Forum; January 1999, Vol. 302 Issue: 1 p91-95, 5p