المؤلفون: Lee, U.Y., Shin, T.S., Park, Y.G., Lim, K.J., Kang, S.H., Ryu, B.H.

المصدر: ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) ; page 241-244

الاتاحة: http://dx.doi.org/10.1109/icsd.1998.709270
http://xplorestaging.ieee.org/ielx4/5708/15288/00709270.pdf?arnumber=709270

المؤلفون: Kang, S.H., Park, Y.G., Shin, T.S., Lim, K.J., Zahn, M.

المصدر: Conference Record of the 1998 IEEE International Symposium on Electrical Insulation (Cat. No.98CH36239) ; volume 1, page 126-129

الاتاحة: http://dx.doi.org/10.1109/elinsl.1998.704679
http://xplorestaging.ieee.org/ielx4/5629/15096/00704679.pdf?arnumber=704679

المؤلفون: Voogt, Joke, Thompson, A., Mishra, P., Fisser, Petra, Alayyar, G., Agyei, D.D., Koehler, M., Shin, T.S., Wolf, L.G., DeSchryver, M., Schmidt, D., Baran, e., Gibson, D., Dodge, B.

المصدر: Proceedings of Society for Information Technology & Teacher education International Conference 2010, 3940-3943
STARTPAGE=3940;ENDPAGE=3943;TITLE=Proceedings of Society for Information Technology & Teacher education International Conference 2010

مصطلحات موضوعية: METIS-270476

URL الوصول: https://explore.openaire.eu/search/publication?articleId=narcis______::81e0330648f641539d238a155e6aa7dc
https://research.utwente.nl/en/publications/strategies-for-teacher-professional-development-on-tpack(c18abfc0-7a1f-43f0-a0c5-ab412cd7cfa7).html

المؤلفون: Baker, O.K, Beaufait, J, Carlini, R, Cha, J, Danagoulian, S, Johnson, A, Kross, B, Majewski, S, McCauley, A, Naing, W, Niculescu, G, Niculescu, I, Shin, T.S, Vulcan, W

المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ; volume 367, issue 1-3, page 92-95 ; ISSN 0168-9002

الاتاحة: http://dx.doi.org/10.1016/0168-9002(95)00737-7
https://api.elsevier.com/content/article/PII:0168900295007377?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:0168900295007377?httpAccept=text/plain

المؤلفون: Kodama, K., Ushida, N., Mokhtarani, A., Paolone, V.S., Volk, J.T., Wilcox, J.O., Yager, P.M., Edelstein, R.M., Freyberger, A.P., Gibaut, D.B., Lipton, R.J., Nichols, W.R., Potter, D.M., Russ, J.S., Zhang, C., Zhang, Y., Jang, H.I., Kim, J.Y., Kim, T.I., Lim, I.T., Pac, M.Y., Baller, B.R., Stefanski, R.J., Nakazawa, K., Chung, K.S., Chung, S.H., Kim, D.C., Park, I.G., Park, M.S., Song, J.S., Yoon, C.S., Kuramata, S., Chikawa, M., Aoki, S., Hara, T., Takahashi, Y., Taruma, K., Chang, S.D., Cheon, D.G., Cho, J.H., Kang, J.S., Kim, C.O., Kim, K.Y., Kim, T.Y., Lee, J.C., Lee, S.B., Lim, G.Y., Nam, S.W., Shin, T.S., Sim, K.S.

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms ; volume 93, issue 3, page 340-354 ; ISSN 0168-583X

الاتاحة: http://dx.doi.org/10.1016/0168-583x(94)95486-0
https://api.elsevier.com/content/article/PII:0168583X94954860?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:0168583X94954860?httpAccept=text/plain

المؤلفون: Shin, T.S., Baker, O.K., Beedoe, S., Holder, D., Kross, B., Majewski, S., McCauley, A., Naing, W., Vulcan, W.

المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ; volume 332, issue 3, page 469-475 ; ISSN 0168-9002

الاتاحة: http://dx.doi.org/10.1016/0168-9002(93)90302-x
https://api.elsevier.com/content/article/PII:016890029390302X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:016890029390302X?httpAccept=text/plain

المؤلفون: Shin, T.S., Jones, O.C.

المصدر: International Journal of Multiphase Flow ; volume 19, issue 6, page 943-964 ; ISSN 0301-9322

الاتاحة: http://dx.doi.org/10.1016/0301-9322(93)90071-2
https://api.elsevier.com/content/article/PII:0301932293900712?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:0301932293900712?httpAccept=text/plain

المؤلفون: Lee, U.Y., Shin, T.S., Park, Y.G., Lim, K.J., Kang, S.H., Ryu, B.H.

المصدر: ICSD'98 Proceedings of the 1998 IEEE 6th International Conference on Conduction & Breakdown in Solid Dielectrics (Cat No98CH36132); 1998, p241-244, 4p

المؤلفون: Kodama, K., Ushida, N., Mokhtarani, A., Paolone, V.S., Volk, J.T., Wilcox, J.O., Yager, P.M., Edelstein, R.M., Freyberger, A.P., Gibaut, D.B., Lipton, R.J., Nichols, W.R., Potter, D.M., Russ, J.C., Zhang, C., Zhang, Y., Jang, H.I., Kim, J.Y., Kim, T.I., Lim, I.T., Pac, M.Y., Baller, B.R., Stefanski, R.J., Nakazawa, K., Chung, K.S., Chung, S.H., Kim, D.C., Park, I.G., Park, M.S., Song, J.S., Yoon, C.S., Chikawa, M., Abe, T., Aoki, S., Fujii, T., Fujioka, G., Fujiwara, K., Fukushima, H., Hara, T., Takahashi, Y., Taruma, K., Tsuzuki, Y., Yokoyama, C., Chang, S.D., Cheon, B.G., Cho, J.H., Kang, J.S., Kim, C.O., Kim, K.Y., Kim, T.Y., Lee, J.C., Lee, S.B., Lim, G.Y., Nam, S.W., Shin, T.S., Sim, K.S., Woo, J.K., Isokane, Y., Tsuneoka, Y., Gauthier, A., Hoshino, K., Kitamura, H., Kobayashi, M., Komatsu, M., Miyanishi, M., Nakamura, K., Nakamura, M., Nakamura, Y., Nakanishi, S., Niu, K., Niwa, K., Nomura, M., Okada, K., Tajima, H., Toshitou, T., Yoshida, S., Aryal, M., Dunlea, J.M., Frederiksen, S.G., Kuramata, S., Lundberg, B.G., Oleynik, G.A., Reay, N.W., Reibel, K., Sidwell, R.A., Stanton, N.R., Moriyama, K., Shibata, H., Kalbfleisch, G.R., Skubic, P., Smow, J.M., Willis, S.E., Kusumoto, O., Nakamura, K., Ohashi, S., Okusawa, T., Teranaka, M., Tominaga, T., Yoshida, T., Yuuki, H., Okabe, H., Yokota, J., Ikegami, S., Kazuno, M., Koya, T., Niu, E., Ogawa, S., Shibuya, H., Watanabe, S., Yasuda, N., Sato, Y., Seshimo, M., Tezuka, I., Bahk, S.Y., Kim, S.K.

المصدر: Physics Letters B; October 1993, Vol. 316 Issue: 2-3 p455-462, 8p

المؤلفون: Yang, J., Jones, O.C., Shin, T.S.

المصدر: Nuclear Engineering and Design ; volume 95, page 197-206 ; ISSN 0029-5493

الاتاحة: http://dx.doi.org/10.1016/0029-5493(86)90047-6
https://api.elsevier.com/content/article/PII:0029549386900476?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:0029549386900476?httpAccept=text/plain

المؤلفون: Kang, S.H., Park, Y.G., Shin, T.S., Lim, K.J., Zahn, M.

المصدر: Conference Record of the 1998 IEEE International Symposium on Electrical Insulation (Cat No98CH36239); 1998, Issue 1, p126-126, 1p

المؤلفون: Choi, N.G., Kim, H.J., Shin, T.S.

المصدر: European Urology Supplements. Feb2006, Vol. 5 Issue 2, p316-316. 1p.