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1
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2Conference
المؤلفون: Shimozato, Kyohei, Sato, Takashi
المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
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3Academic Journal
المؤلفون: Shimozato, Kyohei, Nakamura, Yohei, Bian, Song, Sato, Takashi
المصدر: Japanese Journal of Applied Physics ; volume 60, issue SB, page SBBD11 ; ISSN 0021-4922 1347-4065