المؤلفون: Aureli, Matteo, Ahsan, Syed N., Shihab, Rafiul H., Tung, Ryan C.

المصدر: Journal of Applied Physics; 2018, Vol. 124 Issue 1, pN.PAG-N.PAG, 10p, 1 Diagram, 1 Chart, 5 Graphs

مصطلحات موضوعية: ATOMIC force microscopy, ELECTRIC circuit analysis, EIGENVALUES, EXPONENTIAL stability, BANDWIDTHS