المؤلفون: Scherer, M., Schwegler, V., Seyboth, M., Kirchner, C., Kamp, M., Pelzmann, A., Drechsler, M.

المصدر: Journal of Applied Physics; 6/15/2001, Vol. 89 Issue 12, p8339, 3p, 3 Graphs

مصطلحات موضوعية: GALLIUM nitride, THERMAL analysis

المؤلفون: Habel, F., Seyboth, M.

المصدر: physica status solidi (c) ; issue 7, page 2448-2451 ; ISSN 1610-1634

الاتاحة: http://dx.doi.org/10.1002/pssc.200303295
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fpssc.200303295
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.200303295

المؤلفون: Neuburger, M., Daumiller, I., Kunze, M., Seyboth, M., Jenkins, T., Van Nostrand, J., Kohn, E.

المصدر: physica status solidi (c) ; issue 6, page 1919-1939 ; ISSN 1610-1634

الاتاحة: http://dx.doi.org/10.1002/pssc.200303134
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fpssc.200303134
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.200303134

المؤلفون: Kohn, E., Daumiller, I., Kunze, M., Neuburger, M., Seyboth, M., Jenkins, T.J., Sewell, J.S., Van Norstand, J., Smorchkova, Y., Mishra, U.K.

المصدر: IEEE Transactions on Microwave Theory and Techniques ; volume 51, issue 2, page 634-642 ; ISSN 0018-9480

الاتاحة: http://dx.doi.org/10.1109/tmtt.2002.807687
http://xplorestaging.ieee.org/ielx5/22/26487/01179390.pdf?arnumber=1179390

المؤلفون: Haboeck, U., Kaschner, A., Hoffmann, A., Thomsen, C., Riemann, T., Krtschil, A., Christen, J., Krost, A., Seyboth, M., Habel, F.

المصدر: physica status solidi (b) ; volume 234, issue 3, page 911-914 ; ISSN 0370-1972 1521-3951

الاتاحة: http://dx.doi.org/10.1002/1521-3951(200212)234:3%3C911::aid-pssb911%3E3.0.co%3B2-o
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F1521-3951(200212)234:3%3C911::AID-PSSB911%3E3.0.CO%3B2-O
https://onlinelibrary.wiley.com/doi/full/10.1002/1521-3951(200212)234:3%3C911::AID-PSSB911%3E3.0.CO%3B2-O

المؤلفون: Mistele, D., Bougrioua, Zahia, Rotter, T., Moerman, I., Röver, K.S., Seyboth, M., Schwegler, V., Stemmer, J., Fedler, F., Klausing, H., Semchinova, O.K., Aderhold, J., Graul, J.

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), IMEC (IMEC), Catholic University of Leuven = Katholieke Universiteit Leuven (KU Leuven)

المصدر: ISSN: 1946-4274 ; MRS Online Proceedings Library ; https://hal.science/hal-02906500 ; MRS Online Proceedings Library, 2001, 693, ⟨10.1557/PROC-693-I6.51.1⟩.

مصطلحات موضوعية: [PHYS]Physics [physics]

Relation: hal-02906500; https://hal.science/hal-02906500

الاتاحة: https://hal.science/hal-02906500
https://doi.org/10.1557/PROC-693-I6.51.1

المؤلفون: Schad, S.S., Scherer, M., Seyboth, M., Schwegler, V.

المصدر: physica status solidi (a) ; volume 188, issue 1, page 127-130 ; ISSN 0031-8965 1521-396X

الاتاحة: http://dx.doi.org/10.1002/1521-396x(200111)188:1%3C127::aid-pssa127%3E3.0.co%3B2-t
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F1521-396X(200111)188:1%3C127::AID-PSSA127%3E3.0.CO%3B2-T
https://onlinelibrary.wiley.com/doi/full/10.1002/1521-396X(200111)188:1%3C127::AID-PSSA127%3E3.0.CO%3B2-T

المؤلفون: Riemann, T., Christen, J., Kaschner, A., Hoffmann, A., Thomsen, C., Seyboth, M., Habel, F., Beccard, R., Heuken, M.

المصدر: physica status solidi (a) ; volume 188, issue 2, page 751-755 ; ISSN 0031-8965 1521-396X

الاتاحة: http://dx.doi.org/10.1002/1521-396x(200112)188:2%3C751::aid-pssa751%3E3.0.co%3B2-f
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F1521-396X(200112)188:2%3C751::AID-PSSA751%3E3.0.CO%3B2-F
https://onlinelibrary.wiley.com/doi/full/10.1002/1521-396X(200112)188:2%3C751::AID-PSSA751%3E3.0.CO%3B2-F

المؤلفون: Kohn, E., Daumiller, I., Neuburger, M., Seyboth, M., Kirchner, C., Kamp, M.

المصدر: MRS Proceedings ; volume 680 ; ISSN 0272-9172 1946-4274

الاتاحة: http://dx.doi.org/10.1557/proc-680-e3.1
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1946427400629287

المؤلفون: Scherer, M., Schwegler, V., Seyboth, M., Eberhard, F., Kirchner, C., Kamp, M., Ulu, G., Ünlü, M.S., Gruhler, R., Hollricher, O.

المصدر: Journal of Crystal Growth ; volume 230, issue 3-4, page 554-557 ; ISSN 0022-0248

الاتاحة: http://dx.doi.org/10.1016/s0022-0248(01)01296-9
https://api.elsevier.com/content/article/PII:S0022024801012969?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0022024801012969?httpAccept=text/plain

المؤلفون: Chung, H.Y.A., Wang, C., Kirchner, Ch., Seyboth, M., Schwegler, V., Scherer, M., Kamp, M., Ebeling, K.J.E., Beccard, R., Heuken, M.

المصدر: physica status solidi (a) ; volume 180, issue 1, page 257-260 ; ISSN 0031-8965 1521-396X

الاتاحة: http://dx.doi.org/10.1002/1521-396x(200007)180:1%3C257::aid-pssa257%3E3.0.co%3B2-j
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F1521-396X(200007)180:1%3C257::AID-PSSA257%3E3.0.CO%3B2-J
https://onlinelibrary.wiley.com/doi/full/10.1002/1521-396X(200007)180:1%3C257::AID-PSSA257%3E3.0.CO%3B2-J

المؤلفون: Brown, S A, Reeves, R J, Rong, B, Cheung, R, Seyboth, M, Kirchner, C, Kamp, M

المصدر: Nanotechnology ; volume 11, issue 4, page 263-269 ; ISSN 0957-4484 1361-6528

الاتاحة: http://dx.doi.org/10.1088/0957-4484/11/4/314
http://stacks.iop.org/0957-4484/11/i=4/a=314/pdf

المؤلفون: Schwegler, V., Schad, S. S., Kirchner, C., Seyboth, M., Kamp, M., Ebeling, K. J., Kudryashov, V. E., Turkin, A. N., Yunovich, A. E., Stempfle, U., Link, A., Limmer, W., Sauer, R.

المصدر: physica status solidi (a) ; volume 176, issue 1, page 783-786 ; ISSN 0031-8965 1521-396X

الاتاحة: http://dx.doi.org/10.1002/(sici)1521-396x(199911)176:1%3C783::aid-pssa783%3E3.0.co%3B2-z
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F(SICI)1521-396X(199911)176:1%3C783::AID-PSSA783%3E3.0.CO%3B2-Z
https://onlinelibrary.wiley.com/doi/full/10.1002/(SICI)1521-396X(199911)176:1%3C783::AID-PSSA783%3E3.0.CO%3B2-Z

المؤلفون: Schwegler, V., Kirchner, C., Seyboth, M., Kamp, M., Ebeling, K. J., Melnik, Yu. V., Nikolaev, A. E., Tsvetkov, D., Dmitriev, V. A.

المصدر: physica status solidi (a) ; volume 176, issue 1, page 99-102 ; ISSN 0031-8965 1521-396X

الاتاحة: http://dx.doi.org/10.1002/(sici)1521-396x(199911)176:1%3C99::aid-pssa99%3E3.0.co%3B2-3
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F(SICI)1521-396X(199911)176:1%3C99::AID-PSSA99%3E3.0.CO%3B2-3
https://onlinelibrary.wiley.com/doi/full/10.1002/(SICI)1521-396X(199911)176:1%3C99::AID-PSSA99%3E3.0.CO%3B2-3

المؤلفون: Sven-Silvius Schad, Neubert, B., Eichler, C., Scherer, M., Habel, F., Seyboth, M., Scholz, F., Hofstetter, D., Unger, P., Schmid, W., Karnutsch, C., Streubel, K.

المصدر: Journal of Lightwave Technology; Oct2004, Vol. 22 Issue 10, p2323-2332, 10p

المؤلفون: Seyboth, M., Schad, S.-S., Scherer, M., Habel, F., Eichler, C., Kamp, M., Schwegler, V.

المصدر: Journal of Materials Science: Materials in Electronics; Nov2002, Vol. 13 Issue 11, p659-664, 6p

المؤلفون: Chung, H. Y., Pelzmann, A., Drechsler, M., Scherer, M., Schwegler, V., Seyboth, M., Kirchner, C., Kamp, M.

المصدر: Journal of Crystal Growth; 2001, Vol. 230 Issue: 3 p549-553, 5p

المؤلفون: Wang, C., Chung, H. Anthony, Seyboth, M., Kamp, M., Ebeling, K. Joachim, Beccard, R., Heuken, M.

المصدر: Journal of Crystal Growth; 2001, Vol. 230 Issue: 3 p377-380, 4p

المؤلفون: Schad, Sven-Silvius, Neubert, B., Eichler, Christoph, Scherer, M., Habel, F., Seyboth, M., Scholz, F., Hofstetter, Daniel, Unger, P., Schmid, W., Karnutsch, C., Streubel, K.

URL: http://doc.rero.ch/record/9292/files/Schad_Sven-Silvius_-_Absorption_and_Light_Scattering_in_InGaN_20080519.pdf

المؤلفون: Rotter, T., Mistele, D., Stemmer, J., Seyboth, M., Schwegler, V., Paprotta, S., Fedler, F., Klausing, H., Semchinova, O.K., Aderhold, J., Graul, J.

المصدر: Electronics Letters (Institution of Engineering & Technology); 05/24/2001, Vol. 37 Issue 11, p715-716, 2p