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1Academic Journal
المؤلفون: Yeom, H J, Kim, J H, Choi, D H, Choi, E S, Yoon, M Y, Seong, D J, You, Shin Jae, Lee, Hyo-Chang
المساهمون: Korea Research Institute of Standard and Science, R&D Convergence Program
المصدر: Plasma Sources Science and Technology ; volume 29, issue 3, page 035016 ; ISSN 0963-0252 1361-6595
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2Academic Journal
المؤلفون: Lee, Hyo-Chang, Seo, B. H., Kwon, Deuk-Chul, Kim, J. H., Seong, D. J., Oh, S. J., Chung, C.-W., You, K. H., Shin, ChaeHo
المصدر: Applied Physics Letters, 110(1), Art. No. 014106, (2017-01-02)
Relation: https://doi.org/10.1063/1.4971980; eprintid:73327
الاتاحة: https://doi.org/10.1063/1.4971980
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3Academic Journal
المؤلفون: Kim, D.-W., You, S.-J., Kim, J.-H., Seong, D.-J., Chang, H.-Y., Oh, W.-Y.
المصدر: Journal of Instrumentation ; volume 10, issue 11, page T11001-T11001 ; ISSN 1748-0221
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4Academic Journal
المؤلفون: You, K. H., Schulze, Julian, Derzsi, Aranka, Donkó, Zoltán, Yeom, H. J., Kim, J. H., Seong, D. J., Lee, Hyo-Chang
مصطلحات موضوعية: QC Physics / fizika
وصف الملف: text
Relation: http://real.mtak.hu/99200/1/POP_2019_Oxygen_gap_variation.pdf; You, K. H. and Schulze, Julian and Derzsi, Aranka and Donkó, Zoltán and Yeom, H. J. and Kim, J. H. and Seong, D. J. and Lee, Hyo-Chang (2019) Experimental and computational investigations of the effect of the electrode gap on capacitively coupled radio frequency oxygen discharges. Physics of Plasmas, 26. 013503. ISSN 1070-664X
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5Academic Journal
المساهمون: R&D Convergence Program of National Research Council of Science and Technology (NST) of Republic of Korea
المصدر: Plasma Science and Technology ; volume 21, issue 6, page 064007 ; ISSN 1009-0630
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6Academic Journal
المؤلفون: Lee, Hyo-Chang, Chung, Chin-Wook, Kim, J. H., Seong, D. J.
المساهمون: R&D Convergence Program of Korea
المصدر: Applied Physics Letters ; volume 115, issue 6 ; ISSN 0003-6951 1077-3118
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7Academic Journal
المؤلفون: Choi, Daehan, Kim, Tae-Wan, Shahzad, Rauf, Park, Hyeji, Yeom, H J, Kim, J H, Seong, D J, Kang, Sang-Woo, Yoon, Euijoon, Lee, Hyo-Chang
المساهمون: the National Research Foundation of Korea, R&D Convergence Program
المصدر: Plasma Sources Science and Technology ; volume 27, issue 11, page 114002 ; ISSN 1361-6595
الاتاحة: http://dx.doi.org/10.1088/1361-6595/aae8f6
http://stacks.iop.org/0963-0252/27/i=11/a=114002?key=crossref.542e7cae4ece2a3b6654db6eedab1ed8
http://iopscience.iop.org/article/10.1088/1361-6595/aae8f6/pdf
http://stacks.iop.org/0963-0252/27/i=11/a=114002/pdf
http://iopscience.iop.org/article/10.1088/1361-6595/aae8f6 -
8Academic Journal
المؤلفون: You, K. H., You, S. J., Na, B. K., Kim, D. W., Kim, J. H., Seong, D. J., Chang, H. Y.
المساهمون: Korea Research Institute of Standards and Science
المصدر: Physics of Plasmas ; volume 25, issue 1 ; ISSN 1070-664X 1089-7674
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9Academic Journal
المؤلفون: You, K. H., You, S. J., Kim, D. W., Na, B. K., Seo, B. H., Kim, J. H., Seong, D. J., Chang, H. Y.
المساهمون: Chungnam National University, Korea Research Institute of Standards and Science, National Research Foundation of Korea
المصدر: Physics of Plasmas ; volume 23, issue 5 ; ISSN 1070-664X 1089-7674
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10Academic Journal
المؤلفون: Lee, Hyo-Chang, Chung, Chin-Wook, Kim, J. H., Seong, D. J.
المصدر: Applied Physics Letters; 8/5/2019, Vol. 115 Issue 6, pN.PAG-N.PAG, 5p, 1 Diagram, 3 Graphs
مصطلحات موضوعية: ELECTRON distribution, ELECTRON plasma, RADIO frequency, ELECTRIC fields, ENERGY function
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11Conference
المؤلفون: Baek, I. G., Park, C. J., Ju, H., Seong, D. J., Ahn, H. S., Kim, J. H., Yang, M. K., Song, S. H., Kim, E. M., Park, S. O., Park, C. H., Song, C. W., Jeong, G. T., Choi, S., Kang, H. K., Chung, C.
المصدر: 2011 International Electron Devices Meeting ; page 31.8.1-31.8.4
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12Academic Journal
المؤلفون: Seo, B. H., Kim, J. H., You, S. J., Seong, D. J.
المساهمون: Chungnam National University, Korea Research Council of Fundamental Science and Technology, Korea Research Institute of Standards and Science, Ministry of Science, ICT and Future Planning, Ministry of Trade, Industry and Energy
المصدر: Physics of Plasmas ; volume 22, issue 12 ; ISSN 1070-664X 1089-7674
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13Conference
المؤلفون: Lee, J., Lee, W., Jo, M., Park, J., Seong, D.-J., Jung, S., Kim, S., Shin, J., Park, S., Hwang, H.
المصدر: 2009 International Semiconductor Device Research Symposium ; page 1-2
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14Conference
المؤلفون: Dong, R., Hasan, M., Choi, H. J., Lee, D. S., Pyun, M. B., Seong, D. J., Hwang, Hyunsang
المصدر: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology ; page 901-904
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15Academic Journal
المؤلفون: Seo, BH Seo, Byong-Hoon, You, SJ You, S. J., Kim, JH Kim, J. H., Seong, DJ Seong, D. J., Shin, YH Shin, Y. H., Chang, HY Chang, Hong-Young
الاتاحة: http://hdl.handle.net/10203/188480
https://doi.org/10.1016/j.tsf.2013.05.011 -
16Academic Journal
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17Academic Journal
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18Academic Journal
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19Academic Journal
المؤلفون: You, SJ You, S. J., Park, GY Park, G. Y., Kwon, JH Kwon, J. H., Kim, JH Kim, J. H., Chang, HY Chang, Hong-Young, Lee, JK Lee, J. K., Seong, DJ Seong, D. J., Shin, YH Shin, Y. H.
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20Academic Journal
المؤلفون: Dong, R., Lee, D. S., Pyun, M. B., Hasan, M., Choi, H. J., Jo, M. S., Seong, D. J., Chang, M., Heo, S. H., Lee, J. M., Park, H. K., Hwang, Hyunsang
المصدر: Applied Physics A ; volume 93, issue 2, page 409-414 ; ISSN 0947-8396 1432-0630