المؤلفون: Seidel, Sheila W.

Thesis Advisors: Goyal, Vivek K.

مصطلحات موضوعية: Electrical engineering, Computational imaging, Computer vision, Corner camera, Non-line-of-sight imaging, Remote sensing

الاتاحة: https://hdl.handle.net/2144/45475

المؤلفون: Peng, Minxu, Kitichotkul, Ruangrawee, Seidel, Sheila W., Yu, Christopher, Goyal, Vivek K

المصدر: IEEE Transactions on Computational Imaging, vol. 9, pp. 581--593, 13 June 2023

مصطلحات موضوعية: Physics - Medical Physics

URL الوصول: http://arxiv.org/abs/2208.14256

المؤلفون: Seidel, Sheila, Rueda-Chacon, Hoover, Cusini, Iris, Villa, Federica, Zappa, Franco, Yu, Christopher, Goyal, Vivek K

مصطلحات موضوعية: Electrical Engineering and Systems Science - Image and Video Processing, Computer Science - Computer Vision and Pattern Recognition, Physics - Optics

URL الوصول: http://arxiv.org/abs/2208.01702

المؤلفون: Seidel, Sheila W., Watkins, Luisa, Peng, Minxu, Agarwal, Akshay, Yu, Christopher, Goyal, Vivek K

مصطلحات موضوعية: Physics - Medical Physics, Electrical Engineering and Systems Science - Image and Video Processing

URL الوصول: http://arxiv.org/abs/2111.10611

المؤلفون: Seidel, Sheila W., Murray-Bruce, John, Ma, Yanting, Yu, Christopher, Freeman, William T., Goyal, Vivek K

مصطلحات موضوعية: Electrical Engineering and Systems Science - Image and Video Processing, Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2006.09241

المؤلفون: Seidel, Sheila W., Watkins, Luisa, Peng, Minxu, Agarwal, Akshay, Yu, Christopher, Goyal, Vivek K.

مصطلحات موضوعية: Condensed matter physics, Biochemistry and cell biology, Materials engineering, Microscopy

وصف الملف: p. 36-39

Relation: Microscopy and Microanalysis; S.W. Seidel, L. Watkins, M. Peng, A. Agarwal, C. Yu, V.K. Goyal. 2022. "Addressing Neon Gas Field Ion Source Instability Through Online Beam Current Estimation" Microscopy and Microanalysis, Volume 28, Issue S1, pp.36-39. https://doi.org/10.1017/s1431927622001064; https://hdl.handle.net/2144/45769; 0000-0001-8471-7049 (Goyal, Vivek K); 778760

الاتاحة: https://hdl.handle.net/2144/45769
https://doi.org/10.1017/s1431927622001064

المؤلفون: Peng, Minxu, Kitichotkul, Ruangrawee, Seidel, Sheila W., Yu, Christopher, Goyal, Vivek K.

مصطلحات موضوعية: Communications engineering, Computer vision and multimedia computation, Numerical and computational mathematics

وصف الملف: p. 581-593

Relation: IEEE transactions on computational imaging; http://dx.doi.org/10.1109/tci.2023.3282042; M. Peng, R. Kitichotkul, S.W. Seidel, C. Yu, V.K. Goyal. 2023. "Denoising Particle Beam Micrographs With Plug-and-Play Methods" IEEE transactions on computational imaging, Volume 9, pp.581-593. https://doi.org/10.1109/tci.2023.3282042; https://hdl.handle.net/2144/48715; 0000-0003-1041-8278 (Peng, Minxu); 0009-0001-8084-0071 (Kitichotkul, Ruangrawee); 0000-0002-1239-3003 (Seidel, Sheila W); 0000-0001-8471-7049 (Goyal, Vivek K); 902700

الاتاحة: https://hdl.handle.net/2144/48715
https://doi.org/10.1109/tci.2023.3282042

المؤلفون: Watkins, Luisa, Seidel, Sheila, Peng, Minxu, Agarwal, Akshay, Yu, Christopher, Goyal, Vivek

المصدر: Microscopy and Microanalysis ; volume 27, issue S1, page 422-425 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927621002026
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927621002026

المؤلفون: Watkins, Luisa, Seidel, Sheila, Peng, Minxu, Agarwal, Akshay, Yu, Christopher C., Goyal, Vivek

مصطلحات موضوعية: Computational imaging, Focused ion beam microscopy, Helium ion microscopy, Poisson processes, Scanning electron microscopy

وصف الملف: p. 3487-3491

Relation: Proc. IEEE Int. Conf. Image Process. 2021; L. Watkins, S. Seidel, M. Peng, A. Agarwal, C.C. Yu, V. Goyal. 2021. "Robustness of Time- Resolved Measurement to Unknown and Variable Beam Current in Particle Beam Microscopy" Proc. IEEE Int. Conf. Image Process. 2021, pp.3487-3491. https://doi.org/10.1109/ICIP42928.2021.9506340; https://hdl.handle.net/2144/45774; 0000-0001-8471-7049 (Goyal, Vivek); 778815

الاتاحة: https://hdl.handle.net/2144/45774
https://doi.org/10.1109/ICIP42928.2021.9506340

المؤلفون: Seidel, Sheila W., Watkins, Luisa, Peng, Minxu, Agarwal, Akshay, Yu, Christopher C., Goyal, Vivek

Relation: Proc. 65th Int. Conf. Electron, Ion, Photon Beam Technologies and Nanofabrication; S.W. Seidel, L. Watkins, M. Peng, A. Agarwal, C.C. Yu, V. Goyal. 2022. "Online Beam Current Estimation in Particle Beam Microscopy Through Time-Resolved Measurement" Proc. 65th Int. Conf. Electron, Ion, Photon Beam Technologies and Nanofabrication. https://arxiv.org/abs/2111.10611; https://hdl.handle.net/2144/45773; 0000-0001-8471-7049 (Goyal, Vivek); 778802

الاتاحة: https://hdl.handle.net/2144/45773
https://doi.org/10.48550/arXiv.2111.10611

المؤلفون: Seidel, Sheila W., Watkins, Luisa, Peng, Minxu, Agarwal, Akshay, Yu, Christopher, Goyal, Vivek K.

مصطلحات موضوعية: Electron microscopy, Estimation theory, Fisher information, Gallium ion beam, Helium ion beam, Neon ion beam, Neyman type A distribution, Poisson processes, Touchard polynomials

وصف الملف: p. 521-535

Relation: IEEE transactions on computational imaging; https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000838399800001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=6e74115fe3da270499c3d65c9b17d654; S.W. Seidel, L. Watkins, M. Peng, A. Agarwal, C. Yu, V.K. Goyal. 2022. "Online Beam Current Estimation in Particle Beam Microscopy" IEEE transactions on computational imaging, Volume 8, pp.521-535. https://doi.org/10.1109/tci.2022.3182212; https://hdl.handle.net/2144/45766; 0000-0002-1239-3003 (Seidel, Sheila W); 0000-0002-3452-7455 (Watkins, Luisa); 0000-0003-1041-8278 (Peng, Minxu); 0000-0002-5944-3346 (Agarwal, Akshay); 0000-0001-8471-7049 (Goyal, Vivek K); 761275

الاتاحة: https://hdl.handle.net/2144/45766
https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000838399800001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=6e74115fe3da270499c3d65c9b17d654
https://doi.org/10.1109/tci.2022.3182212

المؤلفون: Krska, William, Seidel, Sheila W., Saunders, Charles, Czajkowski, Robinson, Yu, Christopher, Murray-Bruce, John, Goyal, Vivek

Relation: 2022 IEEE International Conference on Computational Photography (ICCP); W. Krska, S.W. Seidel, C. Saunders, R. Czajkowski, C. Yu, J. Murray-Bruce, V. Goyal. 2022. "Double Your Corners, Double Your Fun: The Doorway Camera." 2022 IEEE International Conference on Computational Photography (ICCP). 2022 IEEE International Conference on Computational Photography (ICCP). 2022-08-01 - 2022-08-05. https://doi.org/10.1109/iccp54855.2022.9887738; https://hdl.handle.net/2144/45274; 766033

الاتاحة: https://hdl.handle.net/2144/45274
https://doi.org/10.1109/iccp54855.2022.9887738

المؤلفون: Seidel, Sheila, Rueda-Chacón, Hoover, Cusini, Iris, Villa, Federica, Zappa, Franco, Yu, Christopher, Goyal, Vivek K

المصدر: Nature Communications; 6/21/2023, Vol. 14 Issue 1, p1-7, 7p

مصطلحات موضوعية: SENSOR arrays, SITUATIONAL awareness, CAMERAS, RESCUE work, PULSED lasers, AUTONOMOUS vehicles

المؤلفون: Peng, Minxu, Seidel, Sheila W., Yu, Christopher, Goyal, Vivek K

مصطلحات موضوعية: Physics - Medical Physics

Relation: http://arxiv.org/abs/2208.14256

الاتاحة: http://arxiv.org/abs/2208.14256

المؤلفون: Saunders, Charles, Krska, William, Tachella, Julián, Seidel, Sheila, Rapp, Joshua, Murray-Bruce, John, Altmann, Yoann, Mclaughlin, Stephen, Goyal, Vivek

المساهمون: Boston University Boston (BU), Laboratoire de physique de l'École Normale Supérieure de Lyon (LPENSL), École normale supérieure de Lyon (ENS de Lyon), Centre National de la Recherche Scientifique (CNRS), The Charles Stark Draper Laboratory, Inc. Cambridge, University of South Florida Tampa (USF), Heriot-Watt University Edinburgh (HWU), School of Computing, Engineering and Physical Sciences, University of Central Lancashire, Preston (UCLAN), School of Computing, Engineering and Physical Sciences, University of Cantral Lancashire, Preston

المصدر: 2021 IEEE International Conference on Image Processing (ICIP)
https://hal.science/hal-04297551
2021 IEEE International Conference on Image Processing (ICIP), Sep 2021, Anchorage, United States. pp.2858-2862, ⟨10.1109/ICIP42928.2021.9506590⟩

مصطلحات موضوعية: [SPI]Engineering Sciences [physics], [INFO]Computer Science [cs]

جغرافية الموضوع: Anchorage, United States

Relation: hal-04297551; https://hal.science/hal-04297551

الاتاحة: https://hal.science/hal-04297551
https://doi.org/10.1109/ICIP42928.2021.9506590

المؤلفون: Watkins, Luisa, Seidel, Sheila W., Peng, Minxu, Agarwal, Akshay, Yu, Christopher C., Goyal, Vivek K.

Relation: 2021 IEEE International Conference on Image Processing (ICIP); L. Watkins, S.W. Seidel, M. Peng, A. Agarwal, C.C. Yu, V.K. Goyal. 2021. "Robustness of Time-Resolved Measurement to Unknown and Variable Beam Current in Particle Beam Microscopy." 2021 IEEE International Conference on Image Processing (ICIP). 2021 IEEE International Conference on Image Processing (ICIP). 2021-09-19 - 2021-09-22. https://doi.org/10.1109/icip42928.2021.9506340; https://hdl.handle.net/2144/44069; 638616

الاتاحة: https://hdl.handle.net/2144/44069
https://doi.org/10.1109/icip42928.2021.9506340

المؤلفون: Seidel, Sheila W., Murray-Bruce, John, Ma, Yanting, Yu, Christopher, Freeman, William T., Goyal, Vivek K.

مصطلحات موضوعية: Imaging, Cameras, Image reconstruction, Two dimensional displays, Image edge detection, Estimation, Three-dimensional displays, Computational photography, Computer vision, Corner camera, Non-line-of-sight imaging, Remote sensing

وصف الملف: p. 58 - 72

Relation: IEEE Transactions on Computational Imaging; Sheila W Seidel, John Murray-Bruce, Yanting Ma, Christopher Yu, William T Freeman, Vivek K Goyal. 2021. "Two-Dimensional Non-Line-of-Sight Scene Estimation From a Single Edge Occluder." IEEE Transactions on Computational Imaging, Volume 7, pp. 58 - 72. https://doi.org/10.1109/tci.2020.3037405; https://hdl.handle.net/2144/42473; 0000-0001-8471-7049 (Goyal, Vivek K); 598006

الاتاحة: https://hdl.handle.net/2144/42473
https://doi.org/10.1109/tci.2020.3037405

المؤلفون: Seidel, Sheila W., Ma, Yanting, Murray-Bruce, John, Saunders, Charles, Freeman, William T., Yu, Christopher C., Goyal, Vivek K

المصدر: 2019 IEEE International Conference on Computational Photography (ICCP)

الاتاحة: http://dx.doi.org/10.1109/iccphot.2019.8747342
http://xplorestaging.ieee.org/ielx7/8743501/8747322/08747342.pdf?arnumber=8747342

المؤلفون: Dass, Sasha, Barber, Christopher, Fischl, Kate, Garber, Leah, Harrington, Brian, iPEK, Sarven, Marathe, Radhika, Montalvo, Tony, O'Byrne, Nicola, Yellepeddi, Atulya, Seidel, Sheila, Zheng, Sue

المصدر: ECS Meeting Abstracts; 2023, Vol. MA2023-01 Issue 1, p1975-1975, 1p, 1 Color Photograph