المؤلفون: Hae-Yong Jeong, Sebin Bahn, Soo Bong Choi, Woongkyu Park, Kyung Ho Park

المصدر: Journal of the Korean Physical Society. 74:94-97

مصطلحات موضوعية: Horizontal scan rate, Cantilever, Fabrication, Materials science, business.industry, General Physics and Astronomy, Feedback loop, law.invention, law, Q factor, Microscopy, Optoelectronics, Sensitivity (control systems), Scanning tunneling microscope, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::aa7063ac41ba8f56907f14ea4b1d8b7d
https://doi.org/10.3938/jkps.74.94